Scanning electron microscope of the

Measurement by scanning electron microscope of the Zr02 catalysts was performed the micrographs are shown in Fig. 8 (56). It is seen that the samples with the sulfate treatment were cracked into fine particles in comparison with those of the substances without the sulfate treatment. 

Figure 1. Cross Section View by Scanning Electron Microscope of the Micron Thick Zeolite Membrane on Gamma-Alumina Substrate...

Fig. 2. Scanning electron microscope of the Pteris vittata L (A) abaxial surface of a pinna showing hairs, stomata, costa, secondary veins, and free venation pattern (500X) (B) detail of abaxial surface of a pinna showing stomata and epidermal cells (2000X) (C) general view of the trilete spores (1500X) (D) detail of a trilete spore and its surface (4500X) having large areoles on the distal face and a well-developed equatorial flange.

Fig. 3. Scanning electron microscope of the Phlebodium aureum (L.) J. Sm. (A) free venation pattern (250X) (B) detail of abaxial surface of apinna and epidermal cells (500X) (C) fertile pinnule with sorus (75X) (D) sporangia with monolete spores. Monolete spores predominate in large genera snch as Polypodiaceae (250X).

If new paper is torn the fibers slide apart without breaking. This can be sho wn with pictures from a scanning electron microscope of the angles of cracks of aged and non-aged paper after a strain-to-stress measurement (Fig. 13.5). The fibers of the new paper only slid apart whereas in the aged paper they broke. This means that the fiber-fiber bonds in new paper and the individual fibers in aged paper are the mechanically weaker points. 

In electron-optical instruments, e.g. the scanning electron microscope (SEM), the electron-probe microanalyzer (EPMA), and the transmission electron microscope there is always a wealth of signals, caused by the interaction between the primary electrons and the target, which can be used for materials characterization via imaging, diffraction, and chemical analysis. The different interaction processes for an electron-transparent crystalline specimen inside a TEM are sketched in Eig. 2.31. 

Boggs, J.L. Prentice, K.J. Kraeutle J.E. Crump, The Role of the Scanning Electron Microscope in the Study of Solid Propellant Combustion , inavwepsceiiu ir h/zo yiyoy) do) u,u, Graber, F.C. Rauch A.J. Fanelli, Observation of Solid-Solid Polymorphic Transformation in 2,4,6-Trinitro Toluene , JPhChem 73, (10), 3514—15 (1969) 39) J.E. Crump, J.L. Prentice K.J. Kraeutle Role of Scanning Electron Microscopy in the Study of Solid Propellant Combustion. Part 11—Behavior of Metal Additives , NavWepsCentr TP-5142-PT-2 (1969) 40) J.A. Markham A.R. Cox, Applications... 

Robinson [230] has developed a specimen chamber for use in the scanning electron microscope whereby the surface charging of insulators is reduced by a relatively high water vapour pressure (1 kPa). 

The surface analysis for morphology and average particle size was carried out with JEOL JSM 6301 F scanning electron microscope (SEM). The micrographs of the samples were observed at different magnifications under different detection modes (secondary or back-scattered electrons). 

Duval, A. R., Ch. Eluere, and L. P. Hurtel (1989), The use of the scanning electron microscope in the study of gold granulation, Proc. Archaeometry Symp. (in Athens), Amsterdam. 

Werner, A. E., M. Bimson, and N. D. Meeks (1975), The use of replica techniques and the scanning electron microscope in the study of ancient glass, /. Glass Stud. 17, 158-160. 

Figure 21.6 Time-lapse observation of synaptic acid crystal formation. The spray-droplet method forms very fine crystals inside and outside of the matrix drop (a-d), so that finer and more homogeneous crystals are generated (d) than those obtained by the droplet method (e-h). Observation with a scanning electron microscope of matrix crystals with the spray-droplet (i) and droplet methods (j). Reprinted with permission from Sugiura et al.7... 

The ordinary microscope uses a beam of light to illuminate the object the electron microscope uses a beam of electrons which pass through the object (in the form of a very thin film of the material). Differential scattering of the beam produces an image of the object which is seen on a fluorescent screen and recorded, if required, by a camera. When the beam passes through the object this is known as a Transmission Electron Microscope (TEM). Alternatively the electrons can be used to illuminate the surface of the object and in this case it is termed a Scanning Electron Microscope (SEM). The TEM is used on thin sections, the SEM can be used with 3 dimensional objects. 

Energy-dispersive X-ray analysis (EDAX) using a scanning electron microscope confirmed the presence of sulfur and phosphorus in solid samples of the [l,2,3]triazolo[4,5-rf [l,3,2]thiazaphospholes 57 in the expected atomic ratio of 2 1 <1997CC2149>. 

Finally, X-ray microanalysis. allows the mapping of all the elements present in a heterogeneous sample, as observed with a scanning electron microscope, provided the sample is capable of conducting (Fig. 13.11). 

It can be seen that most of the electrons are localized in the 3.5 pm thick layer and only a few of them penetrate to a depth of 3.8 pm. In our experiments a 0.5 mm thick LiNbC>3 crystal was spin-coated with 3.5 pm thick photoresist layer (Shipley 1818). The prepared sandwiched structure was exposed using a commercial eb lithography system (elphy Plus) adapted to a jeol jsm 6400 scanning electron microscope on the C -face of the LiNb03 sample under various accelerating voltages and surface charge densities, as shown in Table 10.1. 

Figure 1. Cumulative mass distributions of the element A1 plotted using impactor D50 values and mmads derived from scanning electron microscope analyses. The impactor was run down-stream from an electrostatic precipitator with uncoated impaction stages. Reproduced with permission from Ref. 15. Copyright 1978, Pergamon Press Ltd.

Of course, sharper tips produce sharper images. Commercially available supertips have a diameter in the 0.1 pm range, and a characteristic radius at the tip of about 20 nm. Such tips can be made by focusing an intense electron beam of a scanning electron microscope in the presence of a low pressure of hydrocarbons... 

Scanning-electron micrographs of the samples were taken with a Jeol JSM-940 scanning-electron microscope. 

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