Big Chemical Encyclopedia

Chemical substances, components, reactions, process design ...

Articles Figures Tables About

Process trace analysis

Making quantitative measurements is always accompanied by errors and necessitates an understanding of detectors (see Chapter 7) and data systems (see Chapter 2). Sampling, sample preparation, instrument and method validation, and quality assurance are all important parts of the process. Trace analysis, which is becoming increasingly popular, requires that all... [Pg.176]

Typically, PIXE measurements are perfonned in a vacuum of around 10 Pa, although they can be perfonned in air with some limitations. Ion currents needed are typically a few nanoamperes and current is nonnally not a limiting factor in applying the teclmique with a particle accelerator. This beam current also nonnally leads to no significant damage to samples in the process of analysis, offering a non-destmctive analytical method sensitive to trace element concentration levels. [Pg.1843]

For capillary columns fused siHca is the material of choice for the column container. It has virtually no impurities (<1 ppm metal oxides) and tends to be quite inert. In addition, fused siHca is relatively easily processed and manufacture of columns from this material is reproducible. In trace analysis, inertness of tubing is an important consideration to prevent all of the tiny amounts of sample from becoming lost through interaction with the wall during an analysis. [Pg.107]

The alkah flame-ionisation detector (AFID), sometimes called a thermionic (TID) or nitrogen—phosphoms detector (NPD), has as its basis the fact that a phosphoms- or nitrogen-containing organic material, when placed ia contact with an alkaU salt above a flame, forms ions ia excess of thermal ionic formation, which can then be detected as a current. Such a detector at the end of a column then reports on the elution of these compounds. The mechanism of the process is not clearly understood, but the enhanced current makes this type of detector popular for trace analysis of materials such as phosphoms-containing pesticides. [Pg.108]

Solid-surface room-temperature phosphorescence (RTF) is a relatively new technique which has been used for organic trace analysis in several fields. However, the fundamental interactions needed for RTF are only partly understood. To clarify some of the interactions required for strong RTF, organic compounds adsorbed on several surfaces are being studied. Fluorescence quantum yield values, phosphorescence quantum yield values, and phosphorescence lifetime values were obtained for model compounds adsorbed on sodiiun acetate-sodium chloride mixtures and on a-cyclodextrin-sodium chloride mixtures. With the data obtained, the triplet formation efficiency and some of the rate constants related to the luminescence processes were calculated. This information clarified several of the interactions responsible for RTF from organic compounds adsorbed on sodium acetate-sodium chloride and a-cyclodextrin-sodium chloride mixtures. Work with silica gel chromatoplates has involved studying the effects of moisture, gases, and various solvents on the fluorescence and phosphorescence intensities. The net result of the study has been to improve the experimental conditions for enhanced sensitivity and selectivity in solid-surface luminescence analysis. [Pg.155]

Modem trace analysis is interested in detailed information about the distribution of elements in microareas and their chemical binding forms (specia-tion). The limited sample mass implies methods with absolute detection limits as high as possible. Use of the sputtering process as a sampling technique localises the analytical zone at the outer layers of a solid, and allows analysis to progress into the interior. [Pg.627]

The following examples illustrate the range of apphcations of LC/MS for trace analysis of explosives ESI-LC/MS/MS-CID fragmentation processes of a series of nitroaromatic, nitramine and nitrate ester explosives were studied in the negative-ion mode using daughter-ion, parent-ion and neutral loss scans [14]. Table 1 shows the CID daughter ions in ESI-MS/MS of TNT. [Pg.155]

One can view samples from an explosion scene as belonging to one of two work streams (i) clean and (ii) dirty. Separation between these work streams needs to be established at the earliest possible moment in the process with appropriate laboratory facilities to handle each. The clean work stream contains items which are to be examined for invisible chemical traces of explosives. Such items need protection from any external contamination to a degree commensurate with the sensitivity of the chemical analysis techniques to be employed. The dirty work stream contains items that do not require trace analysis precautions, e.g., scene debris for physical searching. Nonetheless, such items still need to be handled in a way which protects their evidential integrity. Some items can start in the clean stream and then be transferred to the dirty stream, e.g., damaged motor vehicles may first be examined for explosive traces, and then transferred out of the trace examination area to be searched for physical evidence. [Pg.231]

Semiconductors Process gases, plasma gases, substrate analysis for contaminants Gas composition analysis Raw materials screening Trace analysis Quality control... [Pg.190]

To determine ions at mid pg/1 to mg/1 (ppb to ppm) levels with IC, a sample size of 10 to 50/pi is sufficient. To determine ions at lower levels, then a preconcentration or trace enrichment technique has t3rpically to be utilized [20]. With this method, the analytes of interest are preconcentrated on another column in order to "strip" ions from a measured sample volume. This process concentrates the desired species resulting in lower detection limits. However, preconcentration has several disadvantages, compared with a direct method, additional hardware is required. A concentrator column is used to preconcentrate the ions of interest, a sample pump is needed for loading sample, an additional valve is often required for switching the concentrator column in and out-of line with the analytical column and extra time is required for the preconcentration step. It was of interest to explore the development of a high-volume direct-injection IC method that would facilitate trace ion determinations without a separate preconcentration step. This would represent a significantly simpler and more reliable means of trace analysis. [Pg.18]

Unstable radionuclei result on subjecting the nuclei of some elements to neutron bombardment. During the decay process, in which the radionuclei return to more stable forms, characteristic radiation is emitted. The energy of the radiation is characteristic of the element, and its intensity forms the basis for quantitative elemental analysis. The advantages of NAA for trace analysis include low detection limits, good sensitivity, multi-element capability and relative freedom from matrix effects. However, for successful application of this technique skilled personel are required and because of the low sample throughput the amount of work involved in the analysis of column fractions, for example, is prohibitively high. In addition, it may take up to several weeks before the results are available. Further, only few laboratories have easy access to a neutron source. [Pg.166]

As a result of that reductive process, a deposit of copper metal (denoted in Eq. 2.2 by s for solid ) is formed on the carbon electrode surface. The prominent anodic peak recorded in the reverse scan corresponds to the oxidative dissolution of the deposit of copper metal previously formed. The reason for the very intense anodic peak current is that the copper deposit is dissolved in a very small time range (i.e., potential range) because, in the dissolution of the thin copper layer, practically no diffusion limitations are involved, whereas in the deposition process (i.e., the cathodic peak), the copper ions have to diffuse through the expanding diffusion layer from the solution to the electrode surface. These processes, labeled as stripping processes, are typical of electrochemically deposited metals such as cadmium, copper, lead, mercury, zinc, etc., and are used for trace analysis in solution [84]. Remarkably, the peak profile is rather symmetrical because no solution-like diffusive behavior is observed. [Pg.37]

The compound to be analysed, the analyte, is generally contained in a liquid or solid matrix it is rarely found in a form that allows direct measurement. Interfering species that may lead to unwanted interactions, particularly during trace analysis in the presence of abundant matrix components, have to be eliminated. As a result, analysts have long acknowledged the need for efficient and reproducible sample preparation methods. The pre-treatment process has to take into account the analyte, matrix and measurement technique chosen. This situation has led to a number of specific sample pre-treatment protocols that describe sample treatment from sampling all the way to recording of the results (Fig. 20.1). [Pg.377]

SUBTRACTIVE PRECOLUMNS. For many applications the mixture to be analyzed is so complex that the only reasonable method of analysis requires the removal of certain classes of compounds. This process can be easily implemented by the use of a reactive precolumn. For example, a precolumn of potassium hydroxide can be used to remove acid vapors. The mixture could then be chromatographed with and without the precolumn to identify which peaks had acid character. A discussion of precolumn reagents is given by Littlewood (7). Potential packing materials for precolumns may also be found in the trace analysis literature, (see Chapter... [Pg.161]


See other pages where Process trace analysis is mentioned: [Pg.1143]    [Pg.473]    [Pg.1143]    [Pg.473]    [Pg.37]    [Pg.421]    [Pg.225]    [Pg.109]    [Pg.230]    [Pg.279]    [Pg.81]    [Pg.382]    [Pg.400]    [Pg.406]    [Pg.188]    [Pg.306]    [Pg.437]    [Pg.240]    [Pg.437]    [Pg.19]    [Pg.436]    [Pg.223]    [Pg.25]    [Pg.195]    [Pg.320]    [Pg.408]    [Pg.25]    [Pg.153]    [Pg.189]    [Pg.211]    [Pg.272]    [Pg.378]    [Pg.27]    [Pg.208]    [Pg.365]    [Pg.369]    [Pg.371]   
See also in sourсe #XX -- [ Pg.2 , Pg.351 ]




SEARCH



Process analysis

Process analysis processes

Processing analysis

Trace analysis

© 2024 chempedia.info