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Ion beam analysis methods

Grime, G.W. (1999) High energy ion beam analysis methods (and background) , in Encyclopaedia of Spectroscopy and Sprectrometry Ed. J.C. Lindon, G.E. Tranter J.L. Holmes, Academic Press, Chichester, pp. 750-760. [Pg.126]

Positive Aspects of Low Energy Ion Beam Analysis Methods... [Pg.128]

RESOLNRA A new program for optimizing the achievable depth resolution of ion beam analysis methods Mayer, M. (2008) Nud. Instrum. Methods Phys. Res., Sect. B, 266 (8), 1852. [Pg.788]

Although following similar nuclear reaction schemes, nuclear analytical methods (NAMs) comprise bulk analysing capability (neutron and photon activation analysis, NAA and PAA, respectively), as well as detection power in near-surface regions of solids (ion-beam analysis, IB A). NAMs aiming at the determination of elements are based on the interaction of nuclear particles with atomic nuclei. They are nuclide specific in most cases. As the electronic shell of the atom does not participate in the principal physical process, the chemical bonding status of the element is of no relevance. The general scheme of a nuclear interaction is ... [Pg.662]

The characteristics of radiochemical methods are well known [435]. An overview of the determination of elements by nuclear analytical methods has appeared [436]. Some selected reviews of nuclear methods of analysis are available charged particle activation analysis [437,438], instrumental neutron activation analysis [439-441] and ion-beam analysis [442]. [Pg.662]

Maenhaut W. Applications of ion beam analysis in biology and medicine, a review. Nucl Instr Methods B 1988 35 388-403. [Pg.288]

Salamanca, M.A. O., Ruvalcaba-Sil, J. L., Bucio, L., Manzanilla, L., and Miranda, J. (2000). Ion beam analysis of pottery from Teotihuacan, Mexico. Nuclear Instruments and Methods in Physics Research B 161 762-768. [Pg.382]

See the proceedings of the following International Conferences appeared in special issues of Nuclear Instruments and Methods in Physics Research Section B Nucl. Instrum. Methods Phys. Res. B 2002, 193, Proc. of the 19th Intern. Conf. on Atomic Collisions in Solids Nucl. Instrum. Methods Phys. Res. B 2002,190, Proc. of the I5th Intern. Conf. on Ion Beam Analysis Nucl. Instrum. Methods Phys. Res. B 2001, 175-177, Proc. of the 12th Intern. Conf. on Ion Beam Modification of Materials Nucl. Instrum. Methods Phys. Res. B 2001,18I, Proc. of the 7th Intern. Conf. on Nuclear Microprobe Technology and Applications. [Pg.855]

The field of materials analysis by energetic ion beams has begun to mature in the last decade after arising within the nuclear physics community. The basic method, Rutherford back-scattering, has been the subject of a text (1 ), and the field has also engendered a useful handbook (2). Publications are scattered throughout the literature with much of the output in articles relating to the properties of materials. In these the ion beam analysis may form only a part of the work. New developments in technique and applications continue and have been the subject of a series of international conferences (see for example (3) for the latest of these). [Pg.49]

First, because of the large energy difference, this method is completely insensitive to chemical binding effects. While other conventional surface analysis techniques which are sensitive to the chemical state are unquestionably frequently required, it is also true that methods thus dependent on the chemical state may suffer from difficulties in calibration, particularly in transition regions where an element is found in more than one chemical state. Energetic ion beam analysis, on the other hand, offers an absolute technique independent of these effects. As such, this technique and other conventional techniques (e.g. Auger, ESCA etc.) may often prove to be complementary, each supplying information not available by the other techniques. [Pg.50]

The use of elastic backscattering, which is the primary technique for energetic ion beam analysis, is the normal method of choice when it will produce satisfactory results. Some other ion beam techniques which may be useful in supplementing backscattering in specific cases will be discussed later in this paper. [Pg.51]

Conference on Ion Beam Analysis" (Sydney, Australia, 16-20 February 1981) to be published in Nucl. Instrum. Methods. [Pg.68]

G.E. Coote, Ion beam analysis of fluorine its principles and applications, Nuclear Instrum. Methods Phys. Res. B 66 (1992) 191-204. [Pg.280]

In addition to laser beam- or ion beam-based methods, other matrix-free-based methods using a gas/liquid jetstream can also be used for desorption and ionization of compounds from the sample surface. This is the case of the DESI method under ambient conditions. DESI has very recently started to be explored for the analysis of small compounds imaging on intact surfaces (88). In contrast to MALDI and SIMS in which the sample must be confined (in most cases) in a high-vacuum region of the instrument, in DESI-IMS the... [Pg.248]

Since ERDA is complementary to RBS analysis, this method should be a part of every MeV ion-beam analysis system. When it is employed on small Van de Graaf accelerators, ERDA can be used for determining concentration depth profiles or areal densities of hydrogen and of deuterium. Using larger Van de Graaf accelerators with the ability to accelerate heavy ions, this technique can be used for concentration depth profiling of heavier elements up to fluorine. [Pg.522]

Calligaro T, Dran J-C, Moignard B, et at. (2002) Ion beam analysis with external beams Recent set-up improvements. Nuclear Instruments and Methods in Physics Research B 188 135-140. [Pg.4658]

Afiblter, S. 1999. Long-term behaviour of thermoplastic materials. Internet https //institute.ntb.ch/ fileadmin/Institute/MNT/NTB MNT Polymerics Ageing SA.pdf Andrade, E., Flores, M., Muhl, S. et al. 2004. Ion beam analysis of TiN/Ti multilayers deposited by magnetron sputtering. Nuclear Instruments and Methods in Physics Research B 219-220 763-767. [Pg.182]

Simulations for ion scattering techniques such as RBS are typically compared with actual spectra in order to characterize the surface features. There are many such algorithms for example (a) Kido, Y. Koshikawa, T. J. Appl. Phys. 1990, 67, 187. (b) Doolittle, L. R. Nucl. Instrum. Methods 1986, R15, 227 (RUMP program), (c) http //www.surrey.ac.uk/ati/ibc/research/ion beam analysis/ (d) http // www.ee.surrey.ac.uk/SCRlBA/ndf/publist.html (publications re RBS simulations), (e) http //www-iba. bo.imm.cnr.it/(a nice compilation of software for ion-beam analyses). [Pg.663]

Forward recoil spectrometry (FRES, FReS or FRS), which is also referred to as elastic recoil detection analysis (ERDA or ERD), is a member of a family of techniques collectively termed ion beam analysis (IBA). FRES is a powerful, standard-free absolute method for the measurement of atomic composition and impurity concentrations in the near-surface region of solids, and is considered a fully non-invasive technique. However, in the case of polymeric materials this assumption is not entirely true, since the projectile ions cause a breaking of covalent bonds (vide infra). The method is based on scattering of an incident accelerated-ion beam by the sample, due to nuclear and electrostatic interactions. The collision of the ions with the specimen results - in addition to scattered incident ions - in the ejection of photons, ions, or nuclear decay products, as shown schematically in Figure 23.28 [110]. [Pg.766]

See also High Energy Ion Beam Analysis NMR Microscopy X-Ray Emission Spectroscopy, Applications X-Ray Emission Spectroscopy, Methods. [Pg.742]


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