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Interferometers

The heart of an FT-IR spectrometer is the interferometer. Most FT-IR spectrometers use the Michelson interferometer, invented by Albert A. Michelson (1852-1931) in 1891, and for which he received the 1907 Nobel Prize in physics. [Pg.165]

In this section we discuss some basic properties of interferometers illustrated by some examples [4.12]. The characteristics of the different types of interferometer that are essential for spectroscopic applications are discussed in more detail. Since laser technology is inconceivable without dielectric coatings for mirrors, interferometers, and filters, an extra section deals with such dielectric multilayers. [Pg.138]

Bisecting the fixed mirror and the movable mirror is a beamsplitter, where a collimated beam of radiation from an external source can be partially reflected to the fixed mirror (at point F for the median ray) and partially transmitted to the movable mirror (at point M). When the beams remm to the beamsplitter, they interfere and are again partially reflected and partially transmitted. Because of the effect of interference, the intensity of each beam passing to the detector and returning to the source depends on the difference in path of the beams in the two arms of the interferometer. The variation in the intensity of the beams passing to the detector and returning to the source as a function of the path difference ultimately yields the spectral information in a Fourier transform spectrometer. [Pg.19]

Fourier Transform Infrared Spectrometry, Second Edition, by Peter R. Griffiths and James A. de Haseth Copyright 2007 John Wiley Sons, Inc. [Pg.19]

The beam that returns to the source is rarely of interest for spectrometry, and usually only the output beam traveling in the direction perpendicular to that of the input beam is measured. Nevertheless, it is important to remember that both of the output beams contain equivalent information. The main reason for measuring only one of the output beams is the difficulty of separating the output beam that returns to the source from the input beam. On rare occasions, both output beams are measured with the use of two detectors or by focusing both beams onto the same detector. In other measurements, separate beams can be passed into each arm of the interferometer and the resulting signal measured using one or two detectors. [Pg.20]

The movable mirror can either be moved at a constant velocity (a continuous-scan interferometer) or be held at equally spaced points for fixed short periods and stepped rapidly between these points (a step-scan interferometer). When the mirror of a continuous-scan interferometer is moved at a velocity greater than 0.1 cm s (the usual case for most commercial instmments), the interferometer is often called a rapid-scan interferometer. [Pg.20]


This is an analysis frequently conducted on oil lubricants. Generally, the additive is known and its concentration can be followed by direct comparison of the oil with additive and the base stock. For example, concentrations of a few ppm of dithiophosphates or phenols are obtained with an interferometer. However, additive oils today contain a large number of products their identification or their analysis by IR spectrometry most often requires preliminary separation, either by dialysis or by liquid phase chromatography. [Pg.62]

A much better way would be to use phase contrast, rather than attenuation contrast, since the phase change, due to changes in index of refraction, can be up to 1000 times larger than the change in amplitude. However, phase contrast techniques require the disposal of monochromatic X-ray sources, such as synchrotrons, combined with special optics, such as double crystal monochromatics and interferometers [2]. Recently [3] it has been shown that one can also obtain phase contrast by using a polychromatic X-ray source provided the source size and detector resolution are small enough to maintain sufficient spatial coherence. [Pg.573]

In this work, a millimeter wave interferometer operating in the frequency band of 26 to 40 GHz and overcoming these difficulties is presented. [Pg.654]

Figure 1. shows the measured phase differenee derived using equation (6). A close match between the three sets of data points can be seen. Small jumps in the phase delay at 5tt, 3tt and most noticeably at tt are the result of the mathematical analysis used. As the cell is rotated such that tlie optical axis of the crystal structure runs parallel to the angle of polarisation, the cell acts as a phase-only modulator, and the voltage induced refractive index change no longer provides rotation of polarisation. This is desirable as ultimately the device is to be introduced to an interferometer, and any differing polarisations induced in the beams of such a device results in lower intensity modulation. [Pg.682]

McBain reports the following microtome data for a phenol solution. A solution of 5 g of phenol in 1000 g of water was skimmed the area skimmed was 310 cm and a 3.2-g sample was obtained. An interferometer measurement showed a difference of 1.2 divisions between the bulk and the scooped-up solution, where one division corresponded to 2.1 X 10 g phenol per gram of water concentration difference. Also, for 0.05, 0.127, and 0.268M solutions of phenol at 20°C, the respective surface tensions were 67.7, 60.1, and 51.6 dyn/cm. Calculate the surface excess Fj from (a) the microtome data, (b) for the same concentration but using the surface tension data, and (c) for a horizontally oriented monolayer of phenol (making a reasonable assumption as to its cross-sectional area). [Pg.94]

Figure Bl.2.6. Schematic representation of a Michelson interferometer. From Griffiths P R and de Flaseth J A 1986 Fourier transfonn infrared spectroscopy Chemical Analysis ed P J Hiving and J D Winefordner (New York Wiley). Reprinted by pemiission of Jolm Wiley and Sons Inc. Figure Bl.2.6. Schematic representation of a Michelson interferometer. From Griffiths P R and de Flaseth J A 1986 Fourier transfonn infrared spectroscopy Chemical Analysis ed P J Hiving and J D Winefordner (New York Wiley). Reprinted by pemiission of Jolm Wiley and Sons Inc.
A typical noisy light based CRS experiment involves the splitting of a noisy beam (short autocorrelation time, broadband) into identical twin beams, B and B, tlnough the use of a Michelson interferometer. One ami of the interferometer is computer controlled to introduce a relative delay, x, between B and B. The twin beams exit the interferometer and are joined by a narrowband field, M, to produce the CRS-type third order polarization in the sample ([Pg.1209]

Sarid D, Pax P, Yi L, Howells S, Gallagher M, Chen T, Elings V and Booek D 1992 Improved atomio foroe miorosoope using a laser diode interferometer Rev. Sc/. Instrum. 63 3905... [Pg.1724]

Nonetheless, the syimnetric interferometer remains very useful, because there, the wavelengdis of fringes with even cliromatic order, N, strongly depend on the refractive index, n, of the central layer, whereas fringes with odd cliromatic order are almost insensitive to This lucky combhiation allows one to measure the thickness as well as the refractive index of a layer between the mica surfaces independently and siniultaneously [49]. [Pg.1734]

To simplify FECO evaluation, it is conmion practice to experimentally filter out one of the components by the use of a linear polarizer after the interferometer. Mica bireftingence can, however, be useftil to study thin films of birefringent molecules [49] between the surfaces. Rabinowitz [53] has presented an eigenvalue analysis of birefringence in the multiple beam interferometer. [Pg.1735]

Partial reflections at the iimer optical interfaces of the interferometer lead to so-called secondary and tertiary fringe patterns as can be seen from figure B 1.20.4. These additional FECO patterns become clearly visible if the reflectivity of the silver mirrors is reduced. Methods for analysis of such secondary and tertiary FECO patterns were developed to extract infonnation about the topography of non-unifonn substrates [54]. [Pg.1735]

Figure Bl.20.4. Cross-sectional sideview of a syimnetric, tliree-layer interferometer illustrating the origin of primary, secondary, tertiary and gap FECOs. (Reproduced with pennission from [54].)... Figure Bl.20.4. Cross-sectional sideview of a syimnetric, tliree-layer interferometer illustrating the origin of primary, secondary, tertiary and gap FECOs. (Reproduced with pennission from [54].)...
In the symmetric, three-layer interferometer, only even-order fringes are sensitive to refractive index and it is possible to obtain spectral infonnation of the confined film by comparison of the difierent intensities of odd-and even-order fringes. The absorption spectmm of tliin dye layers between mica was investigated by Muller and Machtle [M, M] using this method. [Pg.1735]

Another interesting extension of the FECO teclmique, using a capillary droplet of mercury as the second mirror, was developed by Flom etal [6f]. The light from this special interferometer is analysed in reflection. [Pg.1735]

Horn R G and Smith D T 1991 Anaiyticai soiution for the three-iayer muitipie beam interferometer App/. Opt. 30 59-65... [Pg.1748]

Machtie P, Muiier C and Heim C A 1994 A thin absorbing iayer at the center of a Fabry-Perot interferometer J. Physique ii 4 481-500... [Pg.1748]

Farreii B, Baiiey A i and Chapman D 1995 Experimentai phase changes at the mica-siiver interface iiiustrate the experimentai accuracy of the centrai fiim thickness in a symmetricai three-iayer interferometer App/. Opt. 34 2914-20... [Pg.1748]

On metals in particular, the dependence of the radiation absorption by surface species on the orientation of the electrical vector can be fiilly exploited by using one of the several polarization techniques developed over the past few decades [27, 28, 29 and 30], The idea behind all those approaches is to acquire the p-to-s polarized light intensity ratio during each single IR interferometer scan since the adsorbate only absorbs the p-polarized component, that spectral ratio provides absorbance infonnation for the surface species exclusively. Polarization-modulation mediods provide the added advantage of being able to discriminate between the signals due to adsorbates and those from gas or liquid molecules. Thanks to this, RAIRS data on species chemisorbed on metals have been successfidly acquired in situ under catalytic conditions [31], and even in electrochemical cells [32]. [Pg.1782]

Ishida FI, Ishino Y, Bui]s FI, Tripp C and Dignam M J 1987 Polarization-modulation FT-IR refleotion speotrosoopy using a polarizing Miohelson interferometer App/. Spectrosc. 1288-94... [Pg.1796]

Figure B2.1.2 Modified Michelson interferometer for non-collinear intensity autocorrelation. Symbols used rl, r2, retroreflecting mirror pair mounted on a translation stage bs, beamsplitter x, nonlinear crystal pint, photomultiplier Pibe. Figure B2.1.2 Modified Michelson interferometer for non-collinear intensity autocorrelation. Symbols used rl, r2, retroreflecting mirror pair mounted on a translation stage bs, beamsplitter x, nonlinear crystal pint, photomultiplier Pibe.
Kuhl J and Heppner J 1986 Compression of femtosecond optical pulses with dielectric multilayer interferometers IEEE J. Quantum. Electron. 22 182-5... [Pg.1993]

Diffey W M and Beck W F 1997 Rapid-scanning interferometer for ultrafast pump-probe spectroscopy with phase-sensitive detection Rev. Sci. Instrum. 3296-300... [Pg.1998]

Stamm Ch and Lukosz W 1994 Integrated optical difference Interferometer as biochemical sensor Sensors Aotuators B 18-19 183-7... [Pg.2851]


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Acoustic interferometer

Aharonov-Bohm interferometer

Andreev interferometer

Auxiliary interferometer

Baseline Interferometers under Construction

Birefringent interferometer

Bomem interferometer

Commercial interferometers

Comparison Between Spectrometers and Interferometers

Confocal Fabry-Perot Interferometer

Continuous-scanning interferometer

Core cladding mode interferometer

Corner Interferometers

Cube corner interferometers

Difference interferometer

Dispersion interferometers

Double slit interferometer

Double-pendulum interferometer

Droplet sizing interferometer

Dynamically aligned interferometer

Entangled states interferometer

Experimental methods interferometers

FT-IR interferometers

FTIR interferometer

FTIR rapid-scan interferometer

FTIR step-scan interferometer

Fabry Perot interferometer

Fabry interferometer

Fabry-Perot interferometer in the PolyMUMPS process

Fabry-Perot velocity interferometer

Far-infrared Interferometer Instrument Simulator (FllnS)

Field-widened interferometer

Fourier Transform -interferometer

Fourier Transform Infrared Spectrometer (Interferometer)

Fourier transform Michelson interferometer

Fourier transform infrared interferometer component

Fourier transform spectroscopy Michelson interferometer

Fourier-transform infrared spectroscopy interferometer

Free of interferometer

Ground-Based Interferometers

Hanbury Brown-Twiss interferometer

High-resolution interferometers

High-resolution step-scan interferometers

Hyperspectral Imaging with a Step-Scanning Interferometer

IR interferometer

Infrared interferometer

Infrared spectrometer interferometer

Infrared spectroscopy Michelson interferometer

Infrared spectroscopy interferometers

Interferogram Interferometer

Interferometer Bragg

Interferometer Fizeau

Interferometer Fourier

Interferometer Michelson experiment

Interferometer Ramsey-Borde

Interferometer System

Interferometer Talbot

Interferometer assemblies

Interferometer atomic

Interferometer block

Interferometer characteristics

Interferometer components

Interferometer confocal

Interferometer construction

Interferometer continuous

Interferometer continuous scan

Interferometer designs

Interferometer detector

Interferometer drift

Interferometer electron

Interferometer finesse

Interferometer free spectral range

Interferometer instrumentation

Interferometer matter-wave

Interferometer maximum transmission

Interferometer mirror

Interferometer multipass

Interferometer operation

Interferometer rapid-scan

Interferometer resolving power

Interferometer technique

Interferometer technique visibility

Interferometer transmittance

Interferometer tunable

Interferometer, Fourier transform instruments

Interferometer, diagram

Interferometer, noise-equivalent

Interferometer, scanning

Interferometer-based instruments

Interferometer-based spectrometers

Interferometer-based spectrometry

Interferometers Fellgett advantage

Interferometers Sagnac

Interferometers fringe

Interferometers holographic

Interferometers step-scan type

Interferometers, ARROW

Interferometers, laser light fringing

Interferometic CLEAN Algorithm

Interferometry, Fourier transform Michelson interferometer

Jamin interferometer

Lamellar grating interferometer

Laser interferometer

Laser interferometer, schematic

Laser-referenced interferometers

Long-period gratings interferometers

Mach Zehnder type interferometer

Mach-Zehnder atom interferometer

Mach-Zehnder interferometer

Mach-Zehnder interferometer (MZI

Mach-Zehnder waveguide modulator interferometer

Mach-Zender interferometer

Martin-Puplett interferometer

Michaelson interferometer

Michel son-interferometer

Michelson interferometer

Michelson interferometer INDEX

Michelson interferometer advantages

Michelson interferometer and Fourier transforms

Michelson interferometer moving mirror

Michelson interferometer optical diagram

Michelson interferometer with rotating

Michelson interferometer, Fourier

Michelson interferometer, diagram

Michelson interferometer, throughput

Michelson interferometer, use

Michelson-type interferometers

Micro-interferometer

Midac interferometer

Mirau interferometer

Monochromators and Interferometers

Monolithic common-path interferometer

Multiple beam interferometer

Optical path difference of the interferometer

Other Sample Modulation Measurements with Step-Scan Interferometers

Path length interferometer

Phase-modulated step-scan interferometer

Plane Fabry-Perot Interferometer

Plane-mirror Michelson interferometer

Plateau de Bure Interferometer

Polarization interferometer

Polarization properties interferometer

Polarizing interferometer

Porous silicon interferometer

Puplett interferometer

Rapid-scanning Michelson interferometers

Rapid-scanning interferometer

Rayleigh interferometer

Reference interferometer

Refractive index interferometer type

Refractively scanned interferometers

Response Theory uality in two-ways interferometers the symmetric quanton-detecton

Retardation zero, interferometer

Rocketborne field-widened interferometer-spectrometer

Rotating interferometer

Rotational-motion interferometer

SAMPLE MODULATION SPECTROMETRY WITH A STEP-SCAN INTERFEROMETER

Scully et al. atom interferometer

Sensors interferometers

Slow-scanning interferometers

Space-Based Interferometers

Spectroscopy interferometers

Stationary interferometer

Step-scan interferometer

Step-scanning interferometer

Talbot-Rayleigh interferometer

The Fabry-Perot Interferometer

The Interferometer Detector

The Michelson Interferometer

The TSI Liquitrak interferometer

Three-layer interferometer

Tilt-compensated interferometers

Two port interferometer

Two-beam interferometer

Type Interferometers

Ultrasonic interferometer

Very Large Telescope Interferometer

White light interferometer

Young interferometer

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