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Michelson interferometer, diagram

Figure 4.5 Schematic diagram of a Fourier transform infrared (FTIR) spectrometer. Infrared radiation enters from the left and strikes a beam-splitting mirror (BS) angled such that half of the beam is directed towards a fixed mirror (Mi) and half towards a moveable mirror (M2). On reflection the beam is recombined and directed through the sample towards the detector. M2 is moved in and out by fractions of a wavelength creating a phase difference between the two beam paths. This type of device is called a Michelson interferometer. Figure 4.5 Schematic diagram of a Fourier transform infrared (FTIR) spectrometer. Infrared radiation enters from the left and strikes a beam-splitting mirror (BS) angled such that half of the beam is directed towards a fixed mirror (Mi) and half towards a moveable mirror (M2). On reflection the beam is recombined and directed through the sample towards the detector. M2 is moved in and out by fractions of a wavelength creating a phase difference between the two beam paths. This type of device is called a Michelson interferometer.
Figure 10.11—Optical arrangement of a Fourier transform IR spectrometer, a) A 90c Michelson interferometer including the details of the beam splitter (expanded view) b) optical diagram of a single beam spectrometer (based on a Nicolet model). A weak intensity HeNe laser (632.8 nm) is used as an internal standard to measure precisely the position of the moving mirror using an interference method (a simple sinusoidal interferogram caused by the laser is produced within the device). According to the Nyquist theorem, at least two points per period are needed to calculate the wavelength within the given spectrum. Figure 10.11—Optical arrangement of a Fourier transform IR spectrometer, a) A 90c Michelson interferometer including the details of the beam splitter (expanded view) b) optical diagram of a single beam spectrometer (based on a Nicolet model). A weak intensity HeNe laser (632.8 nm) is used as an internal standard to measure precisely the position of the moving mirror using an interference method (a simple sinusoidal interferogram caused by the laser is produced within the device). According to the Nyquist theorem, at least two points per period are needed to calculate the wavelength within the given spectrum.
Figure 20-26 Schematic diagram of Michelson interferometer. Detector response as a function of retardation (= 2[OM - OS]) is shown for monochromatic incident radiation of wavelength X. Figure 20-26 Schematic diagram of Michelson interferometer. Detector response as a function of retardation (= 2[OM - OS]) is shown for monochromatic incident radiation of wavelength X.
A schematic diagram of a Michelson interferometer, the heart of the FTIR system, is shown in Figure 1 (2). The Michelson interferometer modulates each wavelength in the infrared region at a different frequency in the audio range. [Pg.299]

Schematic diagram of a Michelson interferometer. The detector signal variation as a result of mirror motion is displayed for the cases of monochromatic and polychromatic sources. Schematic diagram of a Michelson interferometer. The detector signal variation as a result of mirror motion is displayed for the cases of monochromatic and polychromatic sources.
Figure 1. Diagram of a Michelson interferometer. Key l, unmodulated incident beam A, moving mirror B, stationary mirror E, modulated exit beam D, detector MD, mirror drive. Figure 1. Diagram of a Michelson interferometer. Key l, unmodulated incident beam A, moving mirror B, stationary mirror E, modulated exit beam D, detector MD, mirror drive.
Figure 3.4-1 Optical diagram of a commercial Michelson interferometer for infrared and Raman spectroscopy (Bruker IFS 66 with Raman module FRA 106). CE control electronics, D1/D2 IR detectors, BS beamsplitter, MS mirror scanner, IP input port, S IR source, AC aperture changer, XI — X3 external beams, A aperture for Raman spectroscopy, D detector for Raman spectroscopy, FM Rayleigh filter module, SC sample compartment with illumination optics, L Nd.YAG laser, SP sample position. Figure 3.4-1 Optical diagram of a commercial Michelson interferometer for infrared and Raman spectroscopy (Bruker IFS 66 with Raman module FRA 106). CE control electronics, D1/D2 IR detectors, BS beamsplitter, MS mirror scanner, IP input port, S IR source, AC aperture changer, XI — X3 external beams, A aperture for Raman spectroscopy, D detector for Raman spectroscopy, FM Rayleigh filter module, SC sample compartment with illumination optics, L Nd.YAG laser, SP sample position.
A schematic diagram of a Fourier transform instrument is given in Fig. 1. The simplest form of the Michelson interferometer consists of two mutually perpendicular mirrors, one of which can move in the direction of the beam. Between both mirrors there is a beam-splitter where the radiation is partially reflected (to the moving mirror) and partially transmitted (to the fixed mirror). Both parts of the beam return to the beam-splitter where, because of the difference in path ([Pg.127]

For transmission measurements where the Stimple is placed in one arm of the Michelson interferometer, a special optical arrangement is useful where the waves transmitted or reflected from the beam splitter to the mirrors and reflected by the mirrors travel at different heights. Fig. 32 is a schematic diagram of the arrangement developed by E. E. Bell one of the pioneers in this field. The major... [Pg.127]

Figure 3.11. A schematic diagram of the operating principle of an FT-IR spectrometer, showing the Michelson interferometer. Figure 3.11. A schematic diagram of the operating principle of an FT-IR spectrometer, showing the Michelson interferometer.
Figure 10.8 The optical assembly of a Fourier transform apparatus, (a) 90° Michelson interferometer with below, some details of the beam-splitter (b) the optical diagram of a single beam spectrophotometer (picture of Shimadzu model 8300). A low power He/Ne laser is used as an internal standard (632.8 nm) in order to locate with precision the position of the mobile mirror by an interference method (this second sinusoidal interferogram which follows the same optical pathway, is used by the software to determine the optical path difference). Figure 10.8 The optical assembly of a Fourier transform apparatus, (a) 90° Michelson interferometer with below, some details of the beam-splitter (b) the optical diagram of a single beam spectrophotometer (picture of Shimadzu model 8300). A low power He/Ne laser is used as an internal standard (632.8 nm) in order to locate with precision the position of the mobile mirror by an interference method (this second sinusoidal interferogram which follows the same optical pathway, is used by the software to determine the optical path difference).
Figure 2.13 Schematic diagram of the inside of an FTIR spectrometer showing the position of the Michelson interferometer (Reproduced by kind permission of Thermo Electron Corp.). Figure 2.13 Schematic diagram of the inside of an FTIR spectrometer showing the position of the Michelson interferometer (Reproduced by kind permission of Thermo Electron Corp.).
Figure 4.10 (Top) Schematic diagram of a Michelson interferometer. ZPD stands for zero path-length difference (i.e., the fixed mirror and moving mirror are equidistant from the heamsplitter). (From Coates, used with permission). (Bottom) A simple commercial FTIR spectrometer layout showing the He-Ne laser, optics, the source, as well as the source, interferometer, sample, and detector. [Courtesy of ThermoNicolet, Madison, WI (www.thermonicolet.com).]... Figure 4.10 (Top) Schematic diagram of a Michelson interferometer. ZPD stands for zero path-length difference (i.e., the fixed mirror and moving mirror are equidistant from the heamsplitter). (From Coates, used with permission). (Bottom) A simple commercial FTIR spectrometer layout showing the He-Ne laser, optics, the source, as well as the source, interferometer, sample, and detector. [Courtesy of ThermoNicolet, Madison, WI (www.thermonicolet.com).]...
Figure 1 Schematic diagram of a Michelson interferometer in a typical FTIR spectrometer. BS = beamsplitter D = IR detector IR = IR source Mf = fixed mirror Mm = moving mirror. Figure 1 Schematic diagram of a Michelson interferometer in a typical FTIR spectrometer. BS = beamsplitter D = IR detector IR = IR source Mf = fixed mirror Mm = moving mirror.
Figure 1. A) Schematic diagram of a Michelson interferometer B) Signal registered by the detector D, the interfero-gram C) Spectrum obtained by Fourier transform (FT) of the interferogram... Figure 1. A) Schematic diagram of a Michelson interferometer B) Signal registered by the detector D, the interfero-gram C) Spectrum obtained by Fourier transform (FT) of the interferogram...
Figure 2.10 A diagram of a Fourier transform infrared (FTIR) spectrometer. FTIR spectrometers employ a Michelson interferometer, which splits the radiation beam from the IR source so that it reflects simultaneously from a moving mirror and a fixed mirror, leading to interference. After the beams recombine, they pass through the sample to the detector and are recorded as a plot of time versus signal intensity, called an interferogram. The overlapping wavelengths and the intensities of their respective absorptions are then converted to a spectrum by applying a mathematical operation called a Fourier transform. Figure 2.10 A diagram of a Fourier transform infrared (FTIR) spectrometer. FTIR spectrometers employ a Michelson interferometer, which splits the radiation beam from the IR source so that it reflects simultaneously from a moving mirror and a fixed mirror, leading to interference. After the beams recombine, they pass through the sample to the detector and are recorded as a plot of time versus signal intensity, called an interferogram. The overlapping wavelengths and the intensities of their respective absorptions are then converted to a spectrum by applying a mathematical operation called a Fourier transform.
Figure 5.31. Modified ray diagram of a Michelson interferometer in which the beams traveling in opposite directions have been separated for clarity. If radiation of intensity I enters the interferometer, the dc intensity of the beam transmitted to the detector is 2RTI and the dc intensity of the beam returning to the source is T )I. Figure 5.31. Modified ray diagram of a Michelson interferometer in which the beams traveling in opposite directions have been separated for clarity. If radiation of intensity I enters the interferometer, the dc intensity of the beam transmitted to the detector is 2RTI and the dc intensity of the beam returning to the source is T )I.
Figure 4.12 Optical path difference (OPD) for an oblique beam, (a) Oblique beam in the Michelson interferometer and (b) diagram for deriving the OPD for the oblique beam. Figure 4.12 Optical path difference (OPD) for an oblique beam, (a) Oblique beam in the Michelson interferometer and (b) diagram for deriving the OPD for the oblique beam.
FIGURE 2.2 The optical diagram of a Michelson interferometer. 2011 hy Taylor Francis Group, LLC... [Pg.20]

A diagram of a typical interferometer (Michelson type) is shown in Figure 7.8. It consists of fixed and moving front-surface plane mirrors (A and B) and a beamsplitter. Collimated infrared radiation from the source incident on the beamsplitter is divided into two beams of equal intensity that pass to the fixed and moving mirrors respectively. Each is reflected back on itself, recombining at the beamsplitter from where they are directed through the sample compartment and onto the detector. Small... [Pg.280]

Figure 1. Schematic diagram of the Michelson stop-scan interferometer used for time-resolved FTIR emission studies. Reproduced with permission from Ref. 38. Figure 1. Schematic diagram of the Michelson stop-scan interferometer used for time-resolved FTIR emission studies. Reproduced with permission from Ref. 38.

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See also in sourсe #XX -- [ Pg.352 ]




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