Field emission scanning electron microscope FE-SEM

Field-Emission-Scanning Electron Microscope (FE-SEM) Investigation... 

The film surfaces were examined using a field emission scanning electron microscope (FE-SEM, S-45(X) Hitachi Ltd., Japan). Contact angles were measured at room temperature using a contact angle meter (CA-X Kyowa Interface Science Co. Ltd., Japan). Droplets were placed at five positions for each sample and the averaged value was adopted as the contact angle. 

The morphology of samples was observed with a field emission scanning electron microscope (FE-SEM JSM-6700F, JEOL). Fig. 3 shows the SEM image of samples. The samples were spherical nanoparticles with a size of about 10-20 nm. 

After 5 minutes of reaction time in each case, the solution was centrifuged and washed with DI water three times. A few drops of washed solutions were placed on sample holders in each case and left to dry under ambient conditions. The dried sanq>les were either coated by evaporation of gold-palladium alloy or sputter coated with gold and they were further characterised by Field Emission-Scanning Electron Microscope (FE-SEM) for product morphology, which was also equipped with an Energy Dispersive Spectroscopy (EDS) facility for elemental analysis. In the control experiments without using the protein, no silica precipitation was observed even over a 24 hour period, as was described previously [13]. 

Figure 10-7. Field emission scanning electron microscope (FE-SEM) image of a CaF film prepared by a trifiuoroacetate-based sol-gel method using cyclohexanol as an additive to obtain porous microstructure.

A Field Emission Scanning Electron Microscope (FE-SEM) operated at 15 keV produces images with a spatial resolution of 1 nm (electrons have a mass of 9.109 X 10 g). 

The microstructure information of surface and cross-section morphologies of the UNCD thin films was observed using a Hitachi S-4700 field emission scanning electron microscope (FE-SEM). Transmission electron microscopy (TEM) observation was carried out using a Philips CM30 microscope operated at 300 kV and a high-resolution JEOL 4000EXII system. 

The thin film of ZnS Mn nanoparticles having Mn concentration of 1.5 percent was fabricated by Xu et al. on various substrates by physical vapour deposition of ion plating or a sputtering method [167]. The source material of ZnS Mn was pretreated at 1050 for 3h in a vacuum sealed quartz tube before deposition. A highly oriented film was achieved by selecting a deposition rate of 2nm/s and a substrate temperature of 160°C. The field emission scanning electron microscope (FE-SEM) and XRD techniques indicate that the ZnS Mn film was composed of nano-sized crystallites with a mean size of 20 nm. 

Field Emission Scanning Elecfron Microscopy (FE-SEM) was performed in order to study the product morphologies of the samples. The aforementioned silica samples, which were suspended in water, were centrifuged (r. p. m. = 13400) and washed with ethanol. They were then placed on SEM sample holders and dried. The dried silica samples were sputter coated with gold and were then analyzed under the electron microscope. 

Samples were characterized by XRD (Siemens D5000 XRD spectrometer), FE-SEM (Field Emission Scanning Electron Microscope, Hitachi S-4800), textural properties were determined by N2 adsorption/desorption experiments) and NH3-TPD (temperature-programmed desorption of ammonia). Catalytic properties of samples were tested in the cracking of a Bach Ho petroleum residue from Vietnam (370-500°C fraction) as heavy feedstock using a MAT 5000 micro activity testing system. The reaction conditions were 482°C, WVH=27, catalyst to feedstock ratio 3/1, reaction time 45 sec. 

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