SEM field emission

Figure Bl.17.8. Iron oxide particles coated with 4 nm of Pt in an m-planar magnetron sputter coater (Hennann and Mtiller 1991). Micrographs were taken in a Hitachi S-900 in-lens field emission SEM at 30,000 primary magnification and an acceleration voltage of 30 kV. Image width is 2163 nm.

Figure 3 Photograph of a modern field emission SEM. (Courtesy of AMRAY Inc., Bedford, MA)...

Figure4.2 Field emission SEM image of a monolayer ofTi02 NPs adsorbed onto a highly polished boron-doped diamond electrode. From reference [38] with permission.

Marken and coworkers examined Ti02 NPs in various types of interfadal assemblies [38, 40, 57, 58]. In their first study, commerdally available 6-nm diameter Ti02 NPs were directly adsorbed onto polished boron-doped diamond electrodes from acidic aqueous solutions containing the Ti02 sol [38]. Using field emission SEM and STM, they observed relatively uniform adsorption of the Ti02 NPs and small... 

Figure 4.9 SEM image ofY zeolite taken with field emission SEM, operated atO.SkV. Sample prep was by dispersing powder in isopropyl alcohol and placing a droplet of the...

Figure 33. High-resolution field emission SEM of a porous LSM/YSZ interface following polarization for 3 h at —0.8 V at 950 °C in air. The porosity evident at the TPB is not seen in images taken prior to polarization. (Reprinted with permission from ref 214. Copyright 2003 Elsevier.)...

Figure 21. Yogurt prepared by the TA-F-O method and observed using a field emission SEM. In addition to clearly imaging casein micelles (CM) and submicelles (SM) the micrograph documents a resolution of 3 nm. (x 100,000). [From 86].

Tensile stress-strain curves were generated using an electro-mechanical universal testing machine with specially designed flat-ended fixtures that were machined in order the grip the specimens carefully. All the samples were tested for failure under displacement control with a prescribed displacement rate of 1.5 mm min-1. Fractography of the tested samples was carried out using a SIRION field emission SEM. 

Figure 8. Field emission SEM images obtained from the fractured PVA-AbOj NW (0.4 vol%) composite showing pulled-out nanowires. The inset in (b) shows the formation of a hole around the nanowire, indicating retraction of the stretched and debonded matrix material.

Fig. 9 (a) Hydrodynamic radii (R ) of microgel particles prepared at different Vim contents (T = 20°C, pH 6). SEM images of (b) VCL/AAEM and (c) VCL/AAEM/VIm(2.9%) microgels. Insets show high-magnification field-emission SEM images. Reprinted from [90] with permission. Copyright 2006 American Chemical Society... 

FIGURE 11.9 Electron micrograph images of mobile colloids collected in a series of column studies, deposited on polycarbonate filters, and then (a) metal (AuPd) or (b) carbon coated prior to imaging and EDS analysis with (c) a field-emission SEM. 

PEO/sol-gel film, (b) Field emissive SEM image of Ti02 dot arrays prepared from PS- -PEO films with 35% sol-gel precursor after exposure to UV light at room temperature for 6 hours in air. (c) Field-emissive SEM image of Ti02 prepared from 15% sol-gel precursor. (From Kim et al.94)... 

This chapter includes a review of the recent literature on polymer microscopy. The basic principles and current challenges of the techniques, as well as the experimental aspects of sample preparation and observation are reviewed elsewhere [1-8]. Specific techniques are surveyed in other reviews for instance TEM [9], SEM [10], Field emission SEM [11], and high angle annular dark field (HAADF)-STEM [12]. 

Figure 11.13 Scheme for construction of Si02 nanoposts from a block copolymer template and field emission SEM of the nanoposts. (Reproduced with permission ftom H.-C. Kim et al., Adv. Mater. 2001,13, 795.)... 

Fig. 28 Microscopic observation of prepared surface-imprinted magnetic PMMA nanopeirticles. Field emission SEM images of (a) support particles, (b) imprinted particles, and (c) non-imprinted particles, (d) TEM images illustrating the successful encapsulation of Fc304 magnetite. Reprinted with permission from [177]. Copyright 2008 American Chemical Society...

Figure 5.46 Field emission SEM image of a fabricated device. Reprinted with permission from Ref. [64] 2005, American Institute of Physics.

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