Electron microscopy EPMA

Co—MoSj, by impregnating MoSj with Co, text p. 191). Abbreviations XRD, X-ray diffraction EM, electron microscopy EPMA, electron probe microanalysis XPS, X-ray photoelectron spectroscopy (ESCA) R, Raman DRS, UV-visible diffuse reflectance spectroscopy MOS,... 

Les] Stationary-drop method tests of wettabiUty, optical microscopy, electron microscopy, EPMA Adhesive characteristics and formation of phase boundaries in Cu rich composite materials manufactured by powder metallurgical process at 1100-1300°C... 

This investigation relied on petrographic analysis of polished sections using reflected light and the scanning electron microscopy (SEM) and electron microprobe (EPMA) analyses to identify minerals and to document the distribution of gold. The mineralized zone is coincident with a distinct bleached alteration zone that contains fine- to coarse-grained, subhedral arsenopyrite and pyrite in quartz-carbonate veins. 

This chapter summarizes results obtained during the past 5 years, on the design, preparation and study of titanium and vanadium compounds as candidate precursors to TiC, TiN, VC, and VN. The study of the precursor molecules was conducted through several steps. After their synthesis, thermoanalytical studies (TG-DTA), coupled to simultaneous mass spectroscopic (MS) analysis of the decomposition gases, were carried out to determine their suitability as precursors. CVD experiments were then conducted and were followed by characterization of the deposits by scanning electron microscopy (SEM) energy dispersive spectroscopy (EDS), X-ray diffraction (XRD), X-ray photoelectron spectroscopy (XPS), and electron microprobe analysis with wavelength dispersion spectroscopy (EPMA-WDS). 

Electron microprobes permit chemical microanalysis as well as SEM and BSE detection, often referred to as analytical electron microscopy (AEM), or electron probe microanalysis (EPMA)56 57. This is because another product of the surface interaction with an incident electron beam is X-ray photons which have wavelengths and energies dependent on element identity and on the electron shell causing the emission. Analysis of these photons can give a local chemical analysis of the surface. Resolution of 1 pm is attainable. Two types of X-ray spectrometer can be employed ... 

XRD, X-ray diffraction XRF, X-ray fluorescence AAS, atomic absorption spectrometry ICP-AES, inductively coupled plasma-atomic emission spectrometry ICP-MS, Inductively coupled plasma/mass spectroscopy IC, ion chromatography EPMA, electron probe microanalysis SEM, scanning electron microscope ESEM, environmental scanning electron microscope HRTEM, high-resolution transmission electron microscopy LAMMA, laser microprobe mass analysis XPS, X-ray photo-electron spectroscopy RLMP, Raman laser microprobe analysis SHRIMP, sensitive high resolution ion microprobe. PIXE, proton-induced X-ray emission FTIR, Fourier transform infrared. 

The phase composition of the resulted specimens was identified by X-ray diffraction (XRD). Rod-like pieces (3x3xl5mm) and disk-shaped pieces (2mm thickness and 10mm diameter) were cut out for the electrical conductivity measurement and the thermal conductivity measurement, respectively. Microstmcture and phase distribution were observed by a scanning electron microscopy equipped with EPMA (JEOL JXA-8621MX). Electrical conductivity was measured using a D.C. four-probe method. Thermal conductivity was measured using a laser-flash technique. All the measurements were performed in the temperature range of 300 to 1200 K. 

EPMA Electron probe microanalysis SEM Scanning electron microscopy... 

Field emission scanning electron microscopy (FESEM), glancing incidence x-ray diffraction (GIXRD), transmission electron microscopy (TEM), micro Raman scattering, Fourier transform inftaied (FTIR) spectrometry, Rutherford back scattering (RBS) studies and electron probe micro analysis (EPMA) have been carried out to obtain micro-structural and compositional properties of the diamond/p-SiC nanocomposite films. Atomic force microscopy (AFM) and indentation studies have been carried out to obtain film properties on the tribological and mechanical front. 

Typical examples of materials with a nanostructured surface are shown as scanning electron microscopy (SEM) and electron microprobe analysis (EPMA) micrographs in Figure 4.29 for fluorinated Mg2Ni (a), (c) and (e) and LaNi4.7Alo.3 (b) and... 

Goldstein JI, Newbury DE, Joy DC, Lyman C, Echlin P, Lifshin E, Sawyer L, Michael J (2003) Scanning electron microscopy and X-ray microanalysis, 3rd edn. Kluwer-Plenum, New York Hwang HJ, Ro C-U (2006) Direct observation of nitrate and sulfate formations from mineral dust and sea-salts using low-Z particle EPMA. Atmos Environ 40 3869-3880 Johansson C, Johansson P-A (2003) Particulate matter in the underground of Stockholm. Atmos Environ 37 3-9... 

Acronyms SEM scanning electron microscopy, SEMPA scanning electron microscopy with polarisation analysis, EDX energy dispersive X-ray analysis, EPMA electron probe microanalysis, STkM scanning Auger microscopy. 

The octahedral pressure cells containing the samples were recovered from the multi-anvil experiment and either broken or cut in half, using a diamond wiresaw. In the latter case, the j -sialon samples were also halved in the axial direction. The specimens were then characterized with optical and scanning electron microscopy (SEM), transmission electron microscopy (TEM), electron probe microanalysis (EPMA), powder X-ray diffractometry (XRD), and microhardness testing using the Vickers method. 

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