Glancing incidence XRD

Structural investigations in laser-assisted chemical vapor-deposited boron carbide thin films by Raman microspectroscopy and glancing incidence XRD, have provided... 

Fig. 1.14 29/q) (dashed curve) and glancing incidence (full curve) scans from a polycrystalline Si thin film deposited on 5/(001) substrate. The inset shows the GI-XRD configuration. The strong peaks from the Si substrate (marked in the 20/co scan) are not seen in the glancing angle measurement, which is more efficient to show the various grain orientations (hkl) from the film... 

XRD X-Ray Diffraction X-ray diffraction has been carried out at extreme glancing angles of incidence where total reflection assures surface sensitivity. This provides structural information that can be interpreted by well-known methods. An extremely high x-ray flux is required to get useful data from single crystal surfaces. Bulk x-ray diffraction is used to determine the structure of organo-metallic clusters, which provide comparisons to molecules adsorbed on surfaces. X-ray diffraction has also given structural information on large surface-area samples. 

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