Auger method

Vickerman and Ertl (1983) have studied H2 and CO chemisorption on model Cu-on-Ru systems, where the Cu is deposited on single-crystal (0001) Ru, monitoring the process using LEED/Auger methods. However, the applicability of these studies carried out on idealized systems to real catalyst systems has not been established. Significant variations in the electronic structure near the Eermi level of Cu are thought to occur when the Cu monolayer is deposited on Ru. This implies electron transfer from Ru to Cu. Chemical thermodynamics can be used to predict the nature of surface segregation in real bimetallic catalyst systems. 

TAMURA, H., et al.. Experiment on Slush Hydrogen Production with Auger Method, Hydrogen and Clean Energy (Int. Symp., Tokyo, 1995), NEDO (1995) 219-222. 

The third type of pump used in dispensers, linear piston, is a true positive-displacement pump. This pump uses a piston to change the volume of a reservoir that is fed from the main syringe. The displacement of the piston produces an equivalent positive displacement of fluid through the pump. Changes in viscosity have litfle or no effect on the repeatability of dispensed mass. Of the three methods, the repeatability of the linear-piston type is the best ( 1%, except for very small dispense volumes of less than 20 pl). " Repeatability of the time-pressure method is 10% and for the auger method is 4% (short term less than 30 min). 

As the table shows, a host of other teclmiques have contributed a dozen or fewer results each. It is seen that diffraction teclmiques have been very prominent in the field the major diffraction methods have been LEED, PD, SEXAFS, XSW, XRD, while others have contributed less, such as NEXAFS, RHEED, low-energy position diffraction (LEPD), high-resolution electron energy loss spectroscopy (HREELS), medium-energy electron diffraction (MEED), Auger electron diffraction (AED), SEELFS, TED and atom diffraction (AD). 

X-ray Photoelectron Spectroscopy. X-ray photoelectron spectroscopy (xps) and Auger electron spectroscopy (aes) are related techniques (19) that are initiated with the same fundamental event, the stimulated ejection of an electron from a surface. The fundamental aspects of these techniques will be discussed separately, but since the instmmental needs required to perform such methods are similar, xps and aes instmmentation will be discussed together. 

X-rays provide an important suite of methods for nondestmctive quantitative spectrochemical analysis for elements of atomic number Z > 12. Spectroscopy iavolving x-ray absorption and emission (269—273) is discussed hereia. X-ray diffraction and electron spectroscopies such as Auger and electron spectroscopy for chemical analysis (esca) or x-ray photoelectron spectroscopy are discussed elsewhere (see X-raytechnology). 

The commercial value of a clay deposit depends on market trends, competitive materials, transportation faciflties, new machinery and processes, and labor and fuel costs. Naturally exposed outcrops, geological area and stmcture maps, aerial photographs, hand and power auger drills, core drills, earth resistivity, and shallow seismic methods are used ia exploration for clays (32). Clays are mined primarily by open-pit operation, including hydraulic extraction however, underground mining is also practiced. 

Each type of mass spectrometer has its associated advantages and disadvantages. Quadrupole-based systems offer a fairly simple ion optics design that provides a certain degree of flexibility with respect to instrument configuration. For example, quadrupole mass filters are often found in hybrid systems, that is, coupled with another surface analytical method, such as electron spectroscopy for chemical analysis or scanning Auger spectroscopy. 

In other articles in this section, a method of analysis is described called Secondary Ion Mass Spectrometry (SIMS), in which material is sputtered from a surface using an ion beam and the minor components that are ejected as positive or negative ions are analyzed by a mass spectrometer. Over the past few years, methods that post-ion-ize the major neutral components ejected from surfaces under ion-beam or laser bombardment have been introduced because of the improved quantitative aspects obtainable by analyzing the major ejected channel. These techniques include SALI, Sputter-Initiated Resonance Ionization Spectroscopy (SIRIS), and Sputtered Neutral Mass Spectrometry (SNMS) or electron-gas post-ionization. Post-ionization techniques for surface analysis have received widespread interest because of their increased sensitivity, compared to more traditional surface analysis techniques, such as X-Ray Photoelectron Spectroscopy (XPS) and Auger Electron Spectroscopy (AES), and their more reliable quantitation, compared to SIMS. 

This kind of estimation of the relative concentration is the most widely used method for quantitative EELS analysis. It is advantageous because the dependence on the primary electron current, Iq, is cancelled out this is not easily determined in a transmission electron microscope under suitable analytical conditions. Eurthermore, in comparison with other methods, e. g. Auger electron spectroscopy and energy-disper-... 

Appearance potential methods all depend on detecting the threshold of ionization of a shallow core level and the fine structure near the threshold they differ only in the way in which detection is performed. In all of these methods the primary electron energy is ramped upward from near zero to whatever is appropriate for the sample material, while the primary current to the sample is kept constant. As the incident energy is increased, it passes through successive thresholds for ionization of core levels of atoms in the surface. An ionized core level, as discussed earlier, can recombine by emission either of a characteristic X-ray photon or of an Auger electron. 

The availability of high-intensity, tunable X-rays produced by synchrotron radiation has resulted in the development of new techniques to study both bulk and surface materials properties. XAS methods have been applied both in situ and ex situ to determine electronic and structural characteristics of electrodes and electrode materials [58, 59], XAS combined with electron-yield techniques can be used to distinguish between surface and bulk properties, In the latter procedure X-rays are used to produce high energy Auger electrons [60] which, because of their limited escape depth ( 150-200 A), can provide information regarding near surface composition. 

Further structural information is available from physical methods of surface analysis such as scanning electron microscopy (SEM), X-ray photoelectron or Auger electron spectroscopy (XPS), or secondary-ion mass spectrometry (SIMS), and transmission or reflectance IR and UV/VIS spectroscopy. The application of both electroanalytical and surface spectroscopic methods has been thoroughly reviewed and appropriate methods are given in most of the references of this chapter. 

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