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Scanning atomic microscopy

A number of methods that provide information about the structure of a solid surface, its composition, and the oxidation states present have come into use. The recent explosion of activity in scanning probe microscopy has resulted in investigation of a wide variety of surface structures under a range of conditions. In addition, spectroscopic interrogation of the solid-high-vacuum interface elucidates structure and other atomic processes. [Pg.293]

The ability to control the position of a fine tip in order to scan surfaces with subatomic resolution has brought scanning probe microscopies to the forefront in surface imaging techniques. We discuss the two primary techniques, scanning tunneling microscopy (STM) and atomic force microscopy (AFM) the interested reader is referred to comprehensive reviews [9, 17, 18]. [Pg.294]

We have considered briefly the important macroscopic description of a solid adsorbent, namely, its speciflc surface area, its possible fractal nature, and if porous, its pore size distribution. In addition, it is important to know as much as possible about the microscopic structure of the surface, and contemporary surface spectroscopic and diffraction techniques, discussed in Chapter VIII, provide a good deal of such information (see also Refs. 55 and 56 for short general reviews, and the monograph by Somoijai [57]). Scanning tunneling microscopy (STM) and atomic force microscopy (AFT) are now widely used to obtain the structure of surfaces and of adsorbed layers on a molecular scale (see Chapter VIII, Section XVIII-2B, and Ref. 58). On a less informative and more statistical basis are site energy distributions (Section XVII-14) there is also the somewhat laige-scale type of structure due to surface imperfections and dislocations (Section VII-4D and Fig. XVIII-14). [Pg.581]

We confine ourselves here to scanning probe microscopies (see Section VIII-2B) scanning tunneling microscopy (STM) and atomic force microscopy (AFM), in which successive profiles of a surface (see Fig. VIII-1) are combined to provide a contour map of a surface. It is conventional to display a map in terms of dark to light areas, in order of increasing height above the surface ordinary contour maps would be confusing to the eye. [Pg.688]

Avouris P and Woikow R 1989 Atom-resoived chemistry studied by scanning tunneiing microscopy and spectroscopy Phys. Rev. B 39 5091... [Pg.317]

Tromp R M, Hamers R J and Demuth J E 1986 Atomic and electronic contributions to Si(111)-(7 7) scanning-tunnelling-microscopy images Rhys. Rev. B 34 1388... [Pg.1721]

Flansma P K, Elings V B, Marti O and Bracker C E 1988 Scanning tunnelling microscopy and atomic force microscopy application to biology and technology Science 242 209... [Pg.1723]

Lillehei P T and Bottomley L A 2000 Scanning probe microscopy Ana/. Chem. 72 189R Sonnenfield R and Hansma P K 1986 Atomic-resolution microscopy in water Sc/ence 232 211... [Pg.1954]

A wide variety of measurements can now be made on single molecules, including electrical (e.g. scanning tunnelling microscopy), magnetic (e.g. spin resonance), force (e.g. atomic force microscopy), optical (e.g. near-field and far-field fluorescence microscopies) and hybrid teclmiques. This contribution addresses only Arose teclmiques tliat are at least partially optical. Single-particle electrical and force measurements are discussed in tire sections on scanning probe microscopies (B1.19) and surface forces apparatus (B1.20). [Pg.2483]

Magnussen O M, Hotios J, Nichois R J, Koib D M and Behm R J 1990 Atomic structure of Cu adiayers on Au(IOO) and Au(111) eiectrodes observed by in situ scanning tunneiing microscopy Phys. Rev. Lett. 64 2929-32... [Pg.2757]

The dangling bonds of a Si surface abstract one F atom from an incident F2 molecule while the complementary F atom is scattered back into the gas phase [20]. This abstractive mechanism leads to F adsorjDtion at single sites rather than at adjacent pairs of sites, as observed directly by scanning tunnelling microscopy [21]. Br atoms adsorb only to Ga atoms in the second layer of GaAs(001)-(2 x 4) where empty dangling bonds on the Ga atoms can be filled by electrons from the Br atoms [22]. [Pg.2930]

Nobel-laureate Richard Feynman once said that the principles of physics do not preclude the possibility of maneuvering things atom by atom (260). Recent developments in the fields of physics, chemistry, and biology (briefly described in the previous sections) bear those words out. The invention and development of scanning probe microscopy has enabled the isolation and manipulation of individual atoms and molecules. Research in protein and nucleic acid stmcture have given rise to powerful tools in the estabUshment of rational synthetic protocols for the production of new medicinal dmgs, sensing elements, catalysts, and electronic materials. [Pg.211]

New types of scanning probe microscopies are continually being developed. These tools will continue to be important for imaging of surfaces at atomic-scale resolution. [Pg.274]

Atomic Force Microscopy Scanning Probe Microscopy... [Pg.768]


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