Multimode scanning probe microscop

MultiMode" Scanning Probe Microscope Instruction Manual (1996-97) Digital Instruments Inc., Santa Barbara... 

Multimode Scanning Probe Microscopes Many commercial SPMs are capable of multimode operation, They can be used as AFMs in contact, tapping, and noncontact modes and as STMs. Other operational modes, such as lateral force mode, torsional mode, and magnetic force mode may also be possible, depending on the manufacturer and model. 

AFM surface studies were conducted on a MultiMode scanning probe microscope from Veeco Instruments, Inc. (Santa Barbara, CA). A... 

Atomic force microscopy (AFM) images were obtained using a Digital Instruments MultiMode scanning probe microscope with a NanoScope IVa controller (Veeco Instruments, Santa Barbara, CA) in tapping mode. A silicon probe (Veeco) with an end radius of <10 run and a force constant of 5 N/m was used to image sanples. Samples were dried under vacuum at 60 °C for 3 h and... 

It is worth to note that the authors experience has been accumulated working with scanning probe microscopes MultiMode and DimensionSOOO (both products of Digital Instruments/Veeco Instruments) but most of the results and conclusions are also relevant for practical work with scanning probe microscopes of other manufacturers. 

Experimental details have been described at length in references (P), (10), and (11). Force-distance measurements and lateral-force imaging were performed with a scanning probe microscope (Nanoscope III Multimode, Digital Instruments, USA) equipped with a liquid cell and enclosed in a thermally equilibrated environment. Silica-coated tips were prepared by oxygen-plasma treating SiaN4 Microlevers (Park Scientific Instruments, USA). 

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