Atomic force microscopy instrumentation

OTHER INSTRUMENTAL METHODS 3.7.1 Atomic Force Microscopy... 

Owen, R. J., Heyes, C. D., Knebel, D., Rocker, C., and Nienhaus, G. U. (2006). An integrated instrumental setup for the combination of atomic force microscopy with optical spectroscopy. Biopolymers 82, 410-414. 

I) Faradaic electrochemical methods. From a general analytical point of view, electrochemical techniques are very sensitive methods for identifying and determining the electroactive species present in the sample and, in addition, they also are able to carry out speciation studies, providing a complete description of the states of oxidation in which the ionic species are present in the object. Other applications and improvements obtained by their hyphenation with other instrumental techniques, such as atomic force microscopy (AFM), will be described in the following chapters. 

Only recent developments in instrumentation of scanning probe microscopy, such as scanning tunneling microscopy (8) and atomic force microscopy (9), have made it possible to study friction on the nanometer and higher scales. These experiments show that the behavior on the single asperity level is different from that on the macroscopic scale. 

Infrared spectra of the unfilled and filled copolymers were measured using a Perkin-Elmer model 1700 FTIR spectrometer. The 13C CP/MAS NMR measurements were conducted on a Bruker 300 instrument operating at 75.51 MHz. The samples were rotated with a spectra width of 40.0 Hz, the CP time was 5 ms. l3C lI distortionless enhancement by polarization transfer (DEPT) technique was applied for analysis of monomers. The process was performed at 75.51 MHz, rotated with a spectral width of 0.75 Hz and a CP time of 15 ms. Atomic force microscopy measurements were carried out using a Nanoscope Ilia controlled Dimension 3000 AFM (Digital Instrument, Santa Barbara, CA). 

An instrumentation approach was explored by Abiade et al. [32] who investigated ceria-silica interactions using atomic force microscopy (AFM) and SEM. Based on these studies, a model for silica polishing with ceria particles is illustrated in Fig. 13.23. 

Newly born, the scanning thermal microscopy derived from atomic force microscopy brings a revolution in the instrumentation for measuring thermophysical and thermomechanical properties of the matter, and the TA instrument was awarded at Pittsburg 1998. The instrument has been applied for the characterization of Ibuprofen compacts as model substance. ... 

In the longer term, picoindentation instruments are likely to be widely used to extend the technique to a still smaller scale, with the help of techniques developed for atomic force microscopy. Already, plastic deformation at depths of a few atomic layers, as well as the effect of surface forces, have been quantified by means of depth-load measurements, using a point force microscope, i.e. an AFM operated in static (non-scanning) mode (Burnham Colton, 1989). 

The WITec alpha300 R confocal Raman microscope can be upgraded to perform atomic force microscopy (AFM), tip-enhanced Raman spectrometry and near-field scanning optical microscopy, and is arguably the most versatile instrument for Raman microspectroscopy available today. 

The force between particles is the sum of a pH-independent van der Waals component, which is always attractive, and a pH-dependent electrostatic component, which can be attractive or repulsive. In Derjaguin-Landau-Verwey-Overbeek (DLVO) theory, the potential is used to calculate the interaction force or energy as a function of the distance between the particles. Atomic force microscopy (AFM) makes it possible to directly measure the force between the particles as a function of the distance, and commercial instruments are available to perform such measurements. Different approaches have been proposed to utilize the results obtained by AFM to determine the pHq. The quantity obtained by AFM corresponds to the lEP rather than the PZC. AFM was used to measure the force between SiO2 (negative potential over the entire studied pH range) and Si,N4 (lEP to be determined) in [681]. The pH at which the force at a distance of 17 nm was equal to zero was identified with the lEP. The van der Waals forces are negligible at such a distance, and the force is governed by an electrostatic interaction. The experimental results were consistent with DLVO theory. 

On the other hand, optical microscopy, confocal microscopy, ellipsometry, scanning electron microscopy (SEM), scanning tunneling microscopy (STM), atomic force microscopy (AFM) and total internal reflection fluorescence (TIRF) are the main microscopic methods for imaging the surface structure. There are many good books and reviews on spectroscopic and chemical surface analysis methods and microscopy of surfaces description of the principles and application details of these advanced instrumental methods is beyond the scope of this book. 

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