Atomic force microscopy measurements

Infrared spectra of the unfilled and filled copolymers were measured using a Perkin-Elmer model 1700 FTIR spectrometer. The 13C CP/MAS NMR measurements were conducted on a Bruker 300 instrument operating at 75.51 MHz. The samples were rotated with a spectra width of 40.0 Hz, the CP time was 5 ms. l3C lI distortionless enhancement by polarization transfer (DEPT) technique was applied for analysis of monomers. The process was performed at 75.51 MHz, rotated with a spectral width of 0.75 Hz and a CP time of 15 ms. Atomic force microscopy measurements were carried out using a Nanoscope Ilia controlled Dimension 3000 AFM (Digital Instrument, Santa Barbara, CA). 

Characterization tools must also be developed if a fundamental understanding of corrosion is to be achieved. For example, observation of a titanium surface with an oxide film at the nanometer scale shows oxide grains on the surface. Conductivity atomic force microscopy measurements can be used to indicate defect-free Ti02 by showing no current flow. This is visually indicated by a dark image. 

We find that a finite roughness of the calcite surface must be included to achieve quantitative agreement between the calculated and experimental reflectivities. We use the model described in Equation (20) (Robinson 1986) that assumes that the roughness is the result of individual monatomic steps within the (approximately micrometer-sized) lateral coherence length of these measurements. We found a surface roughness of 1.1 A. Independent atomic force microscopy measurements have shown that the step density of these calcite cleavage surfaces is very small (Sturchio et al. 1997). 

X.D. Dang, M. Dante, and T.Q. Nguyen, Morphology and conductivity modification of poly(3,4-ethylenedioxythiophene) poly(styrene sulfonate) films induced by conductive atomic force microscopy measurements. AppZ. Phys. Lett., 93, 241911 (2008). 

Atomic force microscopy measurements suggest the formation of a phase separated structure in that the hydrophilic domains are well dispersed and connected to each other [100]. 

Macht, R, K. Eusterhues, G. J. Pronk, and K. U. Totsche. 2011. Specific surface area of clay minerals Comparison between atomic force microscopy measurements and buUc-gas (N2) and -liquid (EGME) adsorption methods. Applied Clay Science 53, no. 1 20-26. doi 10.1016/j.clay.2011.04.006. 

Atomic Force Microscopy measurements were carried out on a Topometrix 2010 TMX Microscope under ambient conditions. High Resolution Scanning Electron Microscopy was done with a Jeol JSM-6000F scanning microscope. Transmission Electron Microscopy was performed on a Philips CM-30 FEG microscope to prove the presence of metal oxide after crystallization of the silicalite-1 layer. 

Atomic Force Microscopy (ATM). A Nanoscope IIIA Multimode (Digital Instruments, Santa Barbara, CA) was used for atomic force microscopy measurements. The AFM was operated in force mode, with a scan rate of 1 Hz, and a 2 -piezo total displacement of 500 nm, without calibrating the scanner before each measurement (routine calibration only). Both ap-proach/extension and retraction force curves of the cantilever were recorded. 

Designing Peptide-Based Supramolecular Biomaterials Atomic Force Microscopy Measurements of Supramolecular Interactions... 

Y. Wang, B. Bhushan, and A. Maali, Atomic force microscopy measurement of boundary slip on hydrophilic, hydrophobic, and superhydrophobic surfaces, J. Vac. Sci. Technol. A, 27, 754-760 [2009). 

D. Johannsmann, I. Reviakine, E. Rojas, and M. Gallego, Effect of sample heterogeneity on the interpretation of QCM(-D) data comparison of combined quartz crystal microbalance/atomic force microscopy measurements with finite element method modeling. Anal. Chem., 80, 8891-8899 (2008). 

Atomic force microscopy measures surface morphology and surface interaction forces at the nanoscale level. It belongs to a broad range of probe microscopy family which exploits a... 

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