Scanning thermal microscopy

Another mode of operation derived from contact AFM that is relevant to polymer studies is the scanning thermal microscope (SThM) [128-130]. Here the AFM probe is fabricated to make the tip temperature sensitive. If it is a resistive element, it can be either passive (temperature sensing) or active (heat applying). In SThM, heat injected by the probe affects a three dimensional volume around the contact point. It can therefore detect buried or 

Other studies have been conducted to try to understand the lateral resolution and the depth sensitivity of the probe for IR detection. A polystyrene film was coated with layers of polyisobutylene ranging from 2 /tm to 

and the attenuation of signal from the PS was measured and modeled [159], The sensitivity of the technique was further explored by comparing the spectral intensity of PET films ranging in thickness from 0.9 Um to 250 )im. The thinner film gave more intense spectra (higher surface temperature) as the 

The combination of AFM with other techniques enhances obviously the capabilities of the isolated techniques for the study of polymers and polymer morphologies. Particularly interesting is the combination of AFM with spectroscopic techniques, such as (confocal) Raman or fluorescence microscopy and/or spectroscopy. These diffraction-limited techniques cannot rival the AFM in terms of spatial resolution. However, the added information (vibrational fingerprint information or emission of embedded fluorescent molecules) goes well beyond the capabilities of conventional AFM. 

Binnig G, Quate CF. Atomic force microscope. Phys Rev Lett 1986 56 930. 

Hemsley DA. Applied Polymer Light Microscopy. London Elsevier Applied Science 1989. 

IMAGING POLYMER MORPHOLOGY USING ATOMIC FORCE MICROSCOPY 

Schbnherr H. Scanning force microscopy. In Mark HP, Bikales N, Overberger CG, Menges G, Kroschwitz JI, editors. Encyclopedia of Polymer Science and Technology. New York John WUey Sons 2004. 

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Flammiche A, Flourston D J, Pollock FI M, Reading M and Song M 1996 Scanning thermal microscopy sub-surface imaging, thermal mapping of polymer blends, localised calorimetry J. Vac. Sol. Technol. B 14 1486... 

Scanning thermal microscopy uses the world s smallest thermometer, actually a tiny thermocouple tip, to measure temperature variations as small as 10 microdegrees on a scale of <100 nm. 

Luo K, Shi Z, Varesi J, Majumdar A (1997) Sensor nanofabrication, performance, and conduction mechanisms in scanning thermal microscopy. J Vac Sci Technol B 15 349-360 Majumdar A (1999) Scanning thermal microscopy. Annu Rev Mater Sci 29 505-585 Manghk RM, Wasekar VM, Zhang J (2001) Dynamic and equilibrium surface tension of aqueous surfactant and polymeric solutions. Exp Thermal Fluid Sd 25 55-64... 

Scanning thermal microscopy, 3 332-333 Scanning transmission electron microscopy (STEM), 24 74... 

Scanning thermal microscopy (SThM) measures two-dimensional temperature distributions across a sample surface. This is a special thermal technique. 

Scanning thermal microscopy (SThM) or Scanning near-field thermal microscopy (SNThM) - Constant current - Constant temperature Scanning thermal profiler (SThP) Tunneling thermometer (TT)... 

Newly born, the scanning thermal microscopy derived from atomic force microscopy brings a revolution in the instrumentation for measuring thermophysical and thermomechanical properties of the matter, and the TA instrument was awarded at Pittsburg 1998. The instrument has been applied for the characterization of Ibuprofen compacts as model substance. ... 

Energy-dispersive X-ray microanalysis Surface analytical techniques Scanning near-field optical microscopy Scanning thermal microscopy Atomic force microscopy X-ray photoelectron spectroscopy... 

Price DM, Reading M, Hammiche A, et al. Micro-thermal analysis scanning thermal microscopy and localised thermal analysis. Int J Pharm 1999 192(l) 85-96. 

Scanning Thermal Microscopy (SThM) Scanning Ion Conductance Microscopy (SICM) ... 

Microthcrmal analysis combines thermal analysis with atomic force microscopy. It is actually a family of scanning thermal microscopy techniques in which ihcrmal properties of a surface arc measured as a function of temperature and used to produce a thermal image. In microthcrmal analysis the tip of an atomic force microscope is replaced by a thermally sensitive probe such as a thermistor or thermocouple. The surface temperature can be changed externally or by the probe acting both as a heater and as a temperature-measuring device. 

The introduction and development of Micro-Thermal Analysis are described and discussed by Duncan Price in Chapter 3. The atomic force microscope (AFM) forms the basis of both scanning thermal microscopy (SThM) and instruments for performing localised thermal analysis. The principles and operation of these techniques, which exploit the abilities of a thermal probe to act both as a very small heater and as a thermometer, in the surface characterisation of materials are described in detail. The... 

The diermal conductivity contrast image obtained by scanning thermal microscopy represents a convolution of the true thermal transport properties of the specimen with artefacts arising from changing tip-sample thermal contact area caused by any surface roughness of the specimen [48]. When the probe encounters a depression on the surface, the area of contact between the tip and sample increases, resulting in increased heat flux from the tip to the sample. More power is required to maintain the tip temperature at the set-point value and... 

Figure 9.10 Thermal images of a PVC/PB immiscible blend. (Reprinted with permission from Journal Of Vacuum Science and Technology B., Scanning thermal microscopy Subsurface imaging, thermal mapping of polymer blends, and localized calorimetry by A. Hammiche, D.J. Hourston, H. M. Pollock et al., 14, 2, 1486-1491. Copyright (1996) American Institute of Physics)...

N.K. Dutta, N.D. Tran, and N.R. Choudhury, Perfluoro(methylcyclohexane) plasma pol3fmer thin film Growth, surface morphology, and properties investigated hy scanning thermal microscopy, J. Polym. Sci. B., 43, 1392-1400 (2005). 

V.V. Gorhunov, N. Fuchigami, J.L. Hazel, and V.V. Tsukruk, Probing surface microthermal properties hy scanning thermal microscopy, Langmuir, 15, 8340-8343 (1999). 

Scanning Thermal Microscopy The scanning probe-based thermal microscope (SThM) gives information about the temperature distributions and allows for quantitative determination of the local thermal conductivity in a sample. A resistive probe is employed which both captures the topographic information as well as the temperature/thermal conductivity profile with a resolution of a few milliKelvin. Table 2 provides a list of the more established members of the scanning probe microscope family. 

Scanning thermal microscopy is discussed in the article on Scanning probe microscopy... 

Fang J, Pilon L (2011) Scaling laws for thermal conductivity of crystalline nanoporous silicon based on molecular dynamics simulations. J Appl Phys 110 064305 Gesele G, Linsmeier J, Drach V, Fricke J, Arens-Fischer R (1997) Temperature-dependent thermal conductivity of porous silicon. J Phys D Appl Phys 30(21) 2911 Gomes S, David L, Lysenko V, Descamps A, Nychyporuk T, Raynaud M (2007) Application of scanning thermal microscopy for thermal conductivity measurements on meso-porous sihcon thin films. J Phys D Appl Phys 40 6677... 

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