Atomic fluorescence emission spectroscopy

Chavacteristic Neutron Activation Analysis X-Ray Fluorescence Emission Spectroscopy Flame Emission Atomic Absorption Spark Source Mass Spectrometry... 

Characteristic Neutron activation analysis X-Ray fluorescence Emission spectroscopy Flame emission Atomic absorption Spark source mass spectrometry... 

The section on Spectroscopy has been retained but with some revisions and expansion. The section includes ultraviolet-visible spectroscopy, fluorescence, infrared and Raman spectroscopy, and X-ray spectrometry. Detection limits are listed for the elements when using flame emission, flame atomic absorption, electrothermal atomic absorption, argon induction coupled plasma, and flame atomic fluorescence. Nuclear magnetic resonance embraces tables for the nuclear properties of the elements, proton chemical shifts and coupling constants, and similar material for carbon-13, boron-11, nitrogen-15, fluorine-19, silicon-19, and phosphoms-31. 

Electron Microprobe A.na.Iysis, Electron microprobe analysis (ema) is a technique based on x-ray fluorescence from atoms in the near-surface region of a material stimulated by a focused beam of high energy electrons (7—9,30). Essentially, this method is based on electron-induced x-ray emission as opposed to x-ray-induced x-ray emission, which forms the basis of conventional x-ray fluorescence (xrf) spectroscopy (31). The microprobe form of this x-ray fluorescence spectroscopy was first developed by Castaing in 1951 (32), and today is a mature technique. Primary beam electrons with energies of 10—30 keV are used and sample the material to a depth on the order of 1 pm. X-rays from all elements with the exception of H, He, and Li can be detected. 

Elemental chemical analysis provides information regarding the formulation and coloring oxides of glazes and glasses. Energy-dispersive x-ray fluorescence spectrometry is very convenient. However, using this technique the analysis for elements of low atomic numbers is quite difficult, even when vacuum or helium paths are used. The electron-beam microprobe has proven to be an extremely useful tool for this purpose (106). Emission spectroscopy and activation analysis have also been appHed successfully in these studies (101). 

X-ray fluorescence, mass spectroscopy, emission spectrography, and ion-conductive plasma—atomic emission spectroscopy (icp—aes) are used in specialized laboratories equipped for handling radioisotopes with these instmments. 

The sodium hydroxide is titrated with HCl. In a thermometric titration (92), the sibcate solution is treated first with hydrochloric acid to measure Na20 and then with hydrofluoric acid to determine precipitated Si02. Lower sibca concentrations are measured with the sibcomolybdate colorimetric method or instmmental techniques. X-ray fluorescence, atomic absorption and plasma emission spectroscopies, ion-selective electrodes, and ion chromatography are utilized to detect principal components as weU as trace cationic and anionic impurities. Eourier transform infrared, ft-nmr, laser Raman, and x-ray... 

Spectroscopy, aimual reviews of new analytical instmmentation from the Pittsburgh Conference on Analytical Chemistry and AppHed Spectroscopy. Analytical Chemisty, "Fundamental Reviews" (June 1994, June 1996), analytical appHcations of infrared, ultraviolet, atomic absorption, emission, Raman, fluorescence, phosphorescence, chemiluminescence, and x-ray spectroscopy. 

Numerous methods have been pubUshed for the determination of trace amounts of tellurium (33—42). Instmmental analytical methods (qv) used to determine trace amounts of tellurium include atomic absorption spectrometry, flame, graphite furnace, and hydride generation inductively coupled argon plasma optical emission spectrometry inductively coupled plasma mass spectrometry neutron activation analysis and spectrophotometry (see Mass spectrometry Spectroscopy, optical). Other instmmental methods include polarography, potentiometry, emission spectroscopy, x-ray diffraction, and x-ray fluorescence. 

Barium can also be deterruined by x-ray fluorescence (XRF) spectroscopy, atomic absorption spectroscopy, and flame emission spectroscopy. Prior separation is not necessary. XRF can be appHed directly to samples of ore or products to yield analysis for barium and contaminants. AH crystalline barium compounds can be analy2ed by x-ray diffraction. 

Bromo-2-pyridyla2o)-5-diethylamiQophenol (5-Br-PADAP) is a very sensitive reagent for certain metals and methods for cobalt have been developed (23). Nitroso-naphthol is an effective precipitant for cobalt(III) and is used in its gravimetric determination (24,25). Atomic absorption spectroscopy (26,27), x-ray fluorescence, polarography, and atomic emission spectroscopy are specific and sensitive methods for trace level cobalt analysis (see... 

Colorimetric procedures are often used to determine copper in trace amounts. Extraction of copper using diethyldithiocarbamate can be quite selective (60,62), but the method using dithhone is preferred because of its greater sensitivity and selectivity (50—52). Atomic absorption spectroscopy, atomic emission spectroscopy, x-ray fluorescence, and polargraphy are specific and sensitive methods for the deterrnination of trace level copper. 

A schematic diagram showing the disposition of these essential components for the different techniques is given in Fig. 21.3. The components included within the frame drawn in broken lines represent the apparatus required for flame emission spectroscopy. For atomic absorption spectroscopy and for atomic fluorescence spectroscopy there is the additional requirement of a resonance line source, In atomic absorption spectroscopy this source is placed in line with the detector, but in atomic fluorescence spectroscopy it is placed in a position at right angles to the detector as shown in the diagram. The essential components of the apparatus required for flame spectrophotometric techniques will be considered in detail in the following sections. 

As indicated in Fig. 21.3, for both atomic absorption spectroscopy and atomic fluorescence spectroscopy a resonance line source is required, and the most important of these is the hollow cathode lamp which is shown diagrammatically in Fig. 21.8. For any given determination the hollow cathode lamp used has an emitting cathode of the same element as that being studied in the flame. The cathode is in the form of a cylinder, and the electrodes are enclosed in a borosilicate or quartz envelope which contains an inert gas (neon or argon) at a pressure of approximately 5 torr. The application of a high potential across the electrodes causes a discharge which creates ions of the noble gas. These ions are accelerated to the cathode and, on collision, excite the cathode element to emission. Multi-element lamps are available in which the cathodes are made from alloys, but in these lamps the resonance line intensities of individual elements are somewhat reduced. 

Atomic Absorption and Fluorescence Spectroscopy Diffuse Reflectance Spectroscopy Vol. 5 Emission Spectroscopy... 

Element Atomic emission spectroscopy Atomic absorption spectroscopy Atomic fluorescence spectroscopy... 

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