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X-ray photoeiectron spectroscopy

Wagner C D, Riggs W M, Davis L E, Moulder J F and Muilenberg G E (eds) 1979 Handbook of X-ray Photoeiectron Spectroscopy Eden Prairie, MN Perkin-Elmer Corporation)... [Pg.318]

Poiarization-Modulation IR Reflection Absorption Spectroscopy (PM-IRAS) High-pressure X-ray Photoeiectron Spectroscopy (HP-XPS)... [Pg.138]

See also Microscopy Techniques Atomic Force and Scanning Tunneiing Microscopy. Surface Ana-iysis X-Ray Photoeiectron Spectroscopy Auger Eiec-tron Spectroscopy ion Scattering. X-Ray Absorption and Diffraction X-Ray Absorption. X-Ray Fiuorescence and Emission X-Ray Diffraction - Singie Crystai. [Pg.4701]

However, small shifts in the energy of the core eiectrons due to bonding can be measured by x-ray photoeiectron spectroscopy (page 305). [Pg.403]

RBS, Rutherford backscattering spectroscopy XPS, X-ray photoeiectron spectroscopy TOF-SIMS, time of fiight secondary ion mass spectrometry Vibrationai spectroscopies include Infrared techniques such as FTIR and Raman spectroscopy SEM/EDS, scanning electron microscopy with energy dispersive X-ray emission spectroscopy PIXE, particle-induced X-ray emission spectroscopy. [Pg.174]

Spectroscopic Databases and Standardization for Auger-Electron Spectroscopy and X-Ray Photoeiectron Spectroscopy... [Pg.215]

Surface and interface science are critical in efforts to understand fundamental behavior and to develop new materials, processes, and products for many advanced technologies. Surface and interface properties such as reactivity (or stabihty) and catalysis in different environments, thin-fUm growth (and stability), mechanical properties, electrical properties, magnetic properties, and optical properties often need to be measured as a function of one or more processing variables. In almost aU cases, it is also necessary to determine concurrently the chemical composition of the surface or interface of interest As indicated later in this section, the two most commonly used techniques for this purpose are Auger-electron spectroscopy (AES) and X-ray photoeiectron spectroscopy (XPS). This statement is also supported by the number of publications in which these techniques were utihzed [1]. [Pg.215]

Surface/interface chemistry X-ray photoeiectron spectres copy (XPS, ESCA) Auger eiectron spectroscopy (AES) Secondary ion mass spectros copy (SiMS) Rutherford backscattering spectrometry (RBS) Uitravioiet photoeiectron spectroscopy (UPS) infrared (iR) spectroscopy Raman spectroscopy... [Pg.155]

D. Briggs, editor. Handbook of X-ray and Ultraviolet Photoeiectron Spectroscopy (H den, London, 1977). [Pg.94]


See other pages where X-ray photoeiectron spectroscopy is mentioned: [Pg.173]    [Pg.451]    [Pg.177]    [Pg.716]    [Pg.82]    [Pg.173]    [Pg.451]    [Pg.177]    [Pg.716]    [Pg.82]    [Pg.141]   
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See also in sourсe #XX -- [ Pg.11 , Pg.384 ]

See also in sourсe #XX -- [ Pg.30 , Pg.34 , Pg.110 , Pg.111 , Pg.112 , Pg.188 , Pg.228 ]

See also in sourсe #XX -- [ Pg.384 , Pg.406 ]

See also in sourсe #XX -- [ Pg.226 ]




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