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Wet benches

Wafer eleaning- wafers are cleaned in automated wet benches using the RCA wet elean method (which uses a combination of dilute acids, peroxide and bcises in a particular order). Environmental concerns has prompted the search for a new method of cleaning. [Pg.328]

A hydrophobic Si surface condition is also observed after alkaline treatments, like CMP at a pH of about 11 or after etching in alkaline solutions, as shown in Fig. 2.1b. Hydrophobic Si surfaces are very susceptible to hydrocarbon contamination, for example from the ambient atmosphere or from hydrocarbon films floating on a liquid. To avoid the latter case, water rinses and HF dips are often performed in an overflow wet bench. [Pg.25]

The electronic circuit of the safety sensor consists of a p-type silicon electrode, an LED, a resistor, two 3 V lithium batteries, and a platinum wire as a counter electrode, connected in series, as shown in the right part of Fig. 10.7. These components are assembled in a pen-like housing, optimized to measure even thin layers of liquid on a flat surface, as shown in the left part of Fig. 10.7. This configuration is advantageous if a puddle, observed for example under a wet bench or other equipment, is to be analyzed. [Pg.219]

In conventional wet benches or spray tools, the wafers are processed in batches of 25 or more, which leads to lower COO. This is the main advantage of wet cleanings. As demonstrated earlier [18], the slurries from the market unfortunately contain foreign particles as well. Therefore wet processes must be able to remove both positive and negative particle types to reach a low final level. [Pg.204]

The simple scrubber process is very efficient to eliminate slurries but does not remove the metallic contamination or the damaged layer. The simplest additional process is to use an HF-based step which removes both of them. The use of an HF-compatible scrubber saves an additional wet bench with a dryer and a wafer transfer. The chemistries used must avoid loading effects. [Pg.210]

Scrubber and wet benches are sometimes used one after the other in the same post-CMP cleaning, but this probably does not represent the most suitable solution. In the near future, the more rational way will be to integrate a scrubber or megasonic bath in the CMP tool to avoid handling wet wafers. [Pg.211]

On a wet bench, a conventional SCI with megasonics to remove the particles followed by an HF dip to remove both the damaged layer and metallic contamination gives satisfactory results. [Pg.212]

Speed and throughput of virtual testing can be much better than what is possible by means of wet-bench experimental systems. [Pg.347]

PMS CLS-900 Corrosive liquid sampler is a compression sampler designed for integration into wet benches and process tools. The compressive sampler eliminates bubbles from process chemicals... [Pg.485]

A PC-based controller was developed to operate the valves for fuel flow modulation in the various zones. The valve hardware and controller were bench tested in a jet-fuel wet-bench test facility to verify valve performance and controller effectiveness. Valve flow tests indicate stable and repeatable valve operation over the range of flow conditions tested. The valve flow curves demonstrated acceptable proportionality at lower mass flows, but became slightly nonlinear at higher mass flow conditions as illustrated by Fig. 17.6. [Pg.185]

Molecular acids Fluorides, chlorides, bromides, sulfates, phosphates, nitrogen/oxygen compounds Etch chambers, diffusion furnaces, CVD processes, buffered oxide etch, wet benches using HCl, HF Forms haze crystals on reticles, wafers, and exposure tool optical elements, causes corrosion of A1 and Cu metal lines... [Pg.631]

Pasternak s books of the late 1910s and early 1920s can be seen as emblematic of the end of the epoch. The keen interest in the nature of the relationship between the world and the subjective self, between poetry and life , clearly continued the fundamental metaphysical concerns of the Silver Age. Yet this relationship itself appears to have been reversed. Coming on the heels of so many victories of the subject over the world around him -from Symbolist visionary conquests of the world to the Futurist victory over the sun - Pasternak s poetry showed a submission of the self to the tremendous dynamic force of the world, obediently taking from it clues to all metaphysical problems. The fate of the world would no longer be shaped by a larger-than-life creative self rather, it is in the hands of a local railroad s timetable, or a wet bench in a park, or a grove in suburban woods. [Pg.18]

Etch baths are kept in three-sided exhausted enclosures—wet benches. Typical exposures to airborne etchants at the wet benches is far below allowable limits for the respective chemicals. If a release into the fab area does occur, the odor and irritative effects of the chemicals quickly warn of the incident. [Pg.228]

Fixed extinguishing systems are seeing increased service. Halon systems previously used for protection of wet benches are no longer available. These systems could protect either the face or the sump of the wet bench. Another common use of Halon was below the raised floor in older fabs. The Halon systems are replaced with FM-200 watermist and CO2... [Pg.426]

ECTFE and PVDF are includedl l in the list of currently proposed material for wet-bench construction. Wet benches, the facilities in semiconductor plants where wet processing is carried out, typically use fluoropolymers for all surfaces that can affect fluid purity. Storage containers and sinks, along with all other plumbing, are constructed from fluoropolymers. Fabs are expensive to build and may easily cost over 2 billion to construct. Obtaining insurance for a fab... [Pg.515]

SEMI has recently released provisional specifica-tions ] for particulate, anionic, and metallic contamination in parts. Specifications for particle release are not included in this document and are yet to be determined. Metallic extractables are based on leaching in ultra-pure water. Section 3.7 of this specification states that " The relative leach-out performance of polymer components in actual use with other chemicals (e.g., acids and bases) cannot be directly derived by using the UPW data. It is incumbent upon the user to determine if a component is suitablefor use based on these requirements. " For all practical purposes, the utility of the new SEMI specification is limited to ultrapure water. Table 15.6 shows a comparison of extraction/ leaching results (ICP-MS) for wet-bench plastics in different acids and ultra-pure water. The amounts of metals leached out of plastics by different fluids vary significantly hydrofluoric acid extracts 10-500 times more metal than nitric acid. [Pg.522]

The need for the determination of metallic constituents or impurities in pharmaceutical products has, historically, been addressed by ion chromatographic methods or various wet-bench methods (e.g. the USP heavy metals test). As the popularity of atomic spectroscopy has increased, and the equipment has become more affordable, spectroscopy-based techniques have been routinely employed to solve analytical problems in the pharmaceutical industry. Table 1 provides examples of metal determinations in pharmaceutical matrices, using spectroscopic techniques, and the reasons why these analyses are important. Flame atomic absorption spectrometry (FAAS), graphite furnace atomic absorption spectrometry... [Pg.629]


See other pages where Wet benches is mentioned: [Pg.376]    [Pg.265]    [Pg.303]    [Pg.305]    [Pg.142]    [Pg.923]    [Pg.2780]    [Pg.284]    [Pg.17]    [Pg.192]    [Pg.394]    [Pg.295]    [Pg.518]    [Pg.629]    [Pg.384]    [Pg.384]   
See also in sourсe #XX -- [ Pg.228 ]




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Benches

Benching

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