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Transmission measurements, infrare

In conclusion, IR analysis of polymer/additive extracts before chromatographic separation takes advantage mainly of straightforward transmission measurements. Without separation it is often possible to make class assignments (e.g. in the reported examples on plasticisers and carbodiimide hydrolysis stabilisers) it may eventually be necessary to use multivariate techniques. Infrared detection of chromatographic effluents is dealt with in Chapter 7. [Pg.318]

Fig. 14. Infrared absorption spectrum of anode films prepared at Ts = 25°C with boron fractions xg = 0 (top), 0.25, 0.5 0.75, and 1 (bottom), respectively, in the gas. The film thickness and the transmission measured at v = 4000 cm-1 are given for each curve. From C.C. Tsai (1979). Fig. 14. Infrared absorption spectrum of anode films prepared at Ts = 25°C with boron fractions xg = 0 (top), 0.25, 0.5 0.75, and 1 (bottom), respectively, in the gas. The film thickness and the transmission measured at v = 4000 cm-1 are given for each curve. From C.C. Tsai (1979).
In the normal-incident transmission measurements of LB films deposited on transparent substrates, the electric vector of the infrared beam is parallel to the film surface (Figure 5A). Therefore, only absorption bands which have the transition moments parallel to the film surface can be detected by this method. On the other hand, in the above-mentioned RA measurements, in which the p-polarized infrared beam is incident upon the LB film prepared on Ag-evaporated substrates at a large angle of incidence, we have a strong electric field perpendicular to the film surface as shown in Figure 5B. Therefore, in this case, only absorption bands which have the transition moments perpendicular to the film surface can be detected with a large intensity enhancement. Thus, if the molecules are highly oriented in the LB films, the peak intensities of particular bands should be different between the transmission and RA spectra. [Pg.160]

Using internal reflection, also known as attenuated total reflection (ATR), an official ATR-FTIR method (AOCS, 1999a AOAC International, 2000) was recently developed (Mossoba et al., 1996, 2001b Adam et al., 2000) to rapidly (5 min) measure the 966 cm-1 trans band as a symmetric feature on a horizontal baseline (Fig. Dl.7.1 A). The experimental aspects of this ATR infrared official method are far less complex than those involving the conventional transmission measurements. This approach entails (1) ratioing the trans test sam-... [Pg.507]

Fourier transform infrared microscopes are equipped with a reflection capability that can be used under these circumstances. External reflection spectroscopy (ERS) requires a flat, reflective surface, and the results are sensitive to the polarization of the incident beam as well as the angle of incidence. Additionally, the orientations of the electric dipoles in the films are important to the selection rules and the intensities of the reflected beam. In reflectance measurements, the spectra are a function of the dispersion in the refractive index and the spectra obtained are completely different from that obtained through a transmission measurement that is strongly influenced by the absorption index, k. However, a complex refractive index, n + ik can be determined through a well-known mathematical route, namely, the Kramers-Kronig analysis. [Pg.118]

On the other hand, far infrared transmission measurements [14] have found doublet splitting of the Flw(l) and Flu(2) modes and activation of silent odd modes already at room temperature. Because of the rapid timescale of the IR measurements, this suggests that there is a dynamic JTD at room temperature which becomes static below 140 K. Interestingly, a detailed x-ray diffraction study of this material [15] has evidenced an orientational transition at about the... [Pg.174]

W. Maddams, The background to sample preparation for infrared transmission measurements on solids, Internet J. Vib. Sped., 1, 6-11 (1997). http //www.ijvs.com/volumel/editionl/sectionl. html page6. [Pg.382]

An infrared spectrum can be analysed quantitatively by studying the variations in absorption wave-numbers, which reflect a change in environment, or the variations in the line intensities. To measure the latter it is necessary to use, depending on the transparency of the sample to the radiation, respectively, the Beer-Lambert law for transmission measurements and the Kubelka-Munk law for measurements using diffuse reflectance. [Pg.219]

For qualitative and quantitative mid-infrared studies, a dilution of a sample by a scattering, but transparent matrix is highly recommended. The diffuse reflection technique can be used for low concentrations because of enhancement effects for weak absorptions, which do not exist for transmission measurements. On the other hand, the dilution by KBr powder can... [Pg.3381]

Infrared spectroscopy (IR) is a fairly simple in situ method. Since the absorption coefficients of molecular vibrations are rather low, it is impossible to detect the IR absorption of a molecule adsorbed or bonded to the semiconductor surface, merely by an ordinary vertical transmission measurement. This problem was solved by using attenuated total reflection (ATR) spectroscopy, as introduced by Harrick [17], and first applied to semiconductor-liquid junctions by Beckmann [18,19]. In this technique, the incident IR light beam is introduced via a prism into a semiconductor, at such an angle that total internal reflection occurs at the semiconductor-liquid interface, as illustrated... [Pg.76]

One example of a reflectivity measurement is shown in Fig. 26. The sample is CdCraSe4 and the reflection spectra exhibit the typical reststrahlen bands caused by the lattice vibrations. Another example (Fig. 27) is a transmission measurement of an absorption line due to antiferromagnetic resonance. This also shows how, with spectroscopy in the extreme far-infrared, the signal-to-noise ratio is rather... [Pg.121]

In the case of reflection measurements, the sample replaces one of the mirrors in the Michelson interferometer (see Fig. 32). The reference mirror is assumed to be 100% reflecting in the far-infrared, and in the sample interferogram the power reflectance R of the sample and the phase shift y> at the reflection (usually n for nonabsorbing media with w > 1) take over the role of T and q> in transmission measurements. The interferogram obtained in this case is also somewhat shifted and as3nmnetiic (see Fig. 33, KBr sample). By means of the cosine and sine Fourier transforms, R and y>, and finally n and x, are evaluated from the experimental data. [Pg.130]

Assignment of the observed hydroxide bands is trivial, as far as only one type of OH ion is present in the structure, but it is highly complicated in the case of three or more crystallographically different ions. There are several convenient procedures (see below). Assignment to the various unit-cell group modes is usually established by Raman and infrared single-crystal experiments. However, such investigations are experimentally difficult and, hence, they are rarely carried out. Respective Raman studies are, for example, reported in Refs. [54,60,65-69], IR reflection and transmission measurements in Refs. [54,55,68,70]. [Pg.91]

The FTIR spectrum of the PTFE film deposited by laser ablation was identical to that of the target [54], but that of the film produced by SR etching showed some visible differences (see Fig. 29). Obviously, the C-F2 deformation bands at 640 and 513 cm-1 appear much smaller in the bottom trace. To understand why these 640 and 513 cm-1 bands were so small in the SR case, we measured both normal and oblique transmission of FTIR with an incident angle of 0 and 80° [58]. Two FTIR spectrometers (PERKIN-ELMER and JASCO) were used to measure spectra in the range 400-3000 cm-1. For a cross-check, the film was also deposited on a metallic surface and infrared reflection absorption spectroscopy [62] was carried out to confirm our oblique transmission measurements. Typical changes in the FTIR transmission... [Pg.316]

Fig. 8. (a) Schematic representation of a typical matrix-isolation assembly, (b) Schematic plan of a matrix-isolation assembly suitable for infrared (transmission) measurements and for photolysis experiments [reproduced with permission from Almond, M. J. Downs, A. J. Adv. Spectrosc. 1989, 17, 3[. [Pg.125]


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