Transmission measurements infrared microscopy

Fibrous materials may be analyzed by a number of different methods, including the standard method for sample preparation—compressed halide pellets. In this latter case, normally the fiber structure is destroyed during sample preparation. Alternatively, one can consider using diffuse reflectance, photoacoustic, or infrared microscopy. With due consideration to the preparation procedures, the fibers may be retained in their original form with these methods. In some cases, such as with IR microscopy, it is possible to study the orientation characterisitics of the fiber material and to correlate this information to certain mechanical properties of the fiber. The use of IR polarizers is imphed with this type of measurement. Diamond compression cells work well for single-filament fibers by both transmission (diamond anvil cell) and ATR. 

The interface properties can usually be independently measured by a number of spectroscopic and surface analysis techniques such as secondary ion mass spectroscopy (SIMS), X-ray photoelectron spectroscopy (XPS), specular neutron reflection (SNR), forward recoil spectroscopy (FRES), scanning electron microscopy (SEM) and transmission electron microscopy (TEM), infrared (IR) and several other methods. Theoretical and computer simulation methods can also be used to evaluate H t). Thus, we assume for each interface that we have the ability to measure H t) at different times and that the function is well defined in terms of microscopic properties. 

The apparatus used for IR microscopy is a Fourier-transform infrared (FTIR) spectrometer coupled on-line with an optical microscope. The microscope serves to observe the sample in white light at significant magnification for the purpose of determining its morphology, as well as to select the area for analysis. The spectrometer, on the other hand, enables study of the sample by transmission or reflection measurement for the purpose of determining the chemical composition. It also provides information about the microstructure and optical properties (orientation) of the sample. It is possible to apply polarised light both in the observation of the sample and in spectrometric measurements. 

Altered surfaces have been inferred from solution chemistry measurements (e.g., Chou and Wollast, 1984, 1985) and from spectroscopic measurements of altered surfaces, using such techniques as secondary ion mass spectrometry (for altered layers that are several tens of nm thick (e.g., Schweda et al, 1997), Auger electron spectroscopy (layers <10 nm thick (e.g., Hochella, 1988), XPS (layers <10 nm thick (e.g., Hochella, 1988 Muir et al, 1990), transmission electron microscopy (TEM, e.g., Casey et al, 1989b), Raman spectroscopy (e.g.. Gout et al, 1997), Fourier transform infrared spectroscopy (e.g., Hamilton et al, 2001), in situ high-resolution X-ray reflectivity (Farquhar et al, 1999b Fenter et al, 2003), nuclear magnetic resonance (Tsomaia et al, 2003), and other spectroscopies (e.g., Hellmann et al, 1997). 

The dispersion structure of the blends both in the melt and in the solid state was imaged partly by light microscopy (LM), and partly by scanning (SEM) and transmission electron microscopy (TEM). Wide-angle X-ray scattering (WAXS), Infrared (IR) measurements, and torsional pendulum analysis at IHz were performed too. 

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