Big Chemical Encyclopedia

Chemical substances, components, reactions, process design ...

Articles Figures Tables About

Transmission electron microscopy X-ray diffraction

Because Raman spectmm stems from the bonds vibrations, it provides an intrinsic nano-probing and offers a bottom-up approach of nanostmctured materials that comes as a good complement to other techniques such as transmission electron microscopy. X-ray diffraction, and infrared, and Mossbauer spectroscopy. Since almost no sample preparation is needed, Raman technique [12, 13] is commonly used to investigate nanomaterials. This could provide the phase identification and, possibly, size estimation [14]. [Pg.381]

Alel] Mossbauer spectroscopy, transmission electron microscopy. X-ray diffraction 25-35 mass% Co, 1.5-2 mass% Cr, Fe = bal. 300-525°C spinodal decomposition of bcc phase... [Pg.570]

Keywords Metal nanoparticles Kaolinite Adsorption Transmission electron microscopy X-ray diffraction Small-angle X-ray scattering... [Pg.88]

Mol] High-resolution transmission electron microscopy. X-ray diffraction Crio.7iFeg.6gAlgo.6i... [Pg.65]

X-ray diffraction analysis Scanning electron microscopy Transmission electron microscopy X-ray photoelectron spectroscopy Auger electron spectroscopy... [Pg.171]

Transmission and field emission scanning electron microscopy X-ray diffraction... [Pg.44]

Temperature programmed desorption Transmission electron microscopy X-ray absorption fine structure X-ray diffraction (wide-angle X-ray diffraction)... [Pg.55]

The research of the structure of the radiation surface, of the etched metallographic section (direct and seating metallographic section) of the modified samples were carried out by the methods of electron scanning and transmission electron microscopy. X-ray structure analysis. The change mechanical properties of a material were characterized by microhardness. The accuracy of the measurement is amounted to 7%. For phase identification diffraction analysis with the use of darkfield method and subsequent indicating of microelectronograms was is used. [Pg.149]

The properties of developed electrospun nanofibers are key issues for then-applications in industry. Here, the structure and morphology of the nanofibers were characterized by field emission scanning electron microscopy, transmission electron microscopy. X-ray powder diffraction, and their electromagnetic interference shielding effectiveness and magnetic property were also evaluated for electromagnetic shielding applications. [Pg.134]

Alternatives to XRD include transmission electron microscopy (TEM) and diffraction, Low-Energy and Reflection High-Energy Electron Diffraction (LEED and RHEED), extended X-ray Absorption Fine Structure (EXAFS), and neutron diffraction. LEED and RHEED are limited to surfaces and do not probe the bulk of thin films. The elemental sensitivity in neutron diffraction is quite different from XRD, but neutron sources are much weaker than X-ray sources. Neutrons are, however, sensitive to magnetic moments. If adequately large specimens are available, neutron diffraction is a good alternative for low-Z materials and for materials where the magnetic structure is of interest. [Pg.199]

In this chapter we investigate the morphology of a series of polyurethanes based on polycaprolactone polyol (PCP), diphenylmethane diisocyanate (MDI), and butanediol (BDO). Samples of as-batch-reacted and solution-cast polymers were examined by optical microscopy, transmission electron microscopy, electron and x-ray diffraction, and differential scanning calorimetry. Our interest is to provide a mapping of the size and shape of the domains (and any superstructure such as spherulites) and the degree of order as a function of the fraction of each phase present. [Pg.38]

Nylon-6. Nylon-6—clay nanometer composites using montmorillonite clay intercalated with 12-aminolauric acid have been produced (37,38). When mixed with S-caprolactam and polymerized at 100°C for 30 min, a nylon clay—hybrid (NCH) was produced. Transmission electron microscopy (tern) and x-ray diffraction of the NCH confirm both the intercalation and molecular level of mixing between the two phases. The benefits of such materials over ordinary nylon-6 or nonmolecularly mixed, clay-reinforced nylon-6 include increased heat distortion temperature, elastic modulus, tensile strength, and dynamic elastic modulus throughout the —150 to 250°C temperature range. [Pg.329]

A progressive etching technique (39,40), combined with x-ray diffraction analysis, revealed the presence of a number of a polytypes within a single crystal of sihcon carbide. Work using lattice imaging techniques via transmission electron microscopy has shown that a-siUcon carbide formed by transformation from the P-phase (cubic) can consist of a number of the a polytypes in a syntactic array (41). [Pg.464]

Four different material probes were used to characterize the shock-treated and shock-synthesized products. Of these, magnetization provided the most sensitive measure of yield, while x-ray diffraction provided the most explicit structural data. Mossbauer spectroscopy provided direct critical atomic level data, whereas transmission electron microscopy provided key information on shock-modified, but unreacted reactant mixtures. The results of determinations of product yield and identification of product are summarized in Fig. 8.2. What is shown in the figure is the location of pressure, mean-bulk temperature locations at which synthesis experiments were carried out. Beside each point are the measures of product yield as determined from the three probes. The yields vary from 1% to 75 % depending on the shock conditions. From a structural point of view a surprising result is that the product composition is apparently not changed with various shock conditions. The same product is apparently obtained under all conditions only the yield is changed. [Pg.182]

The hydrogen treatment procedures, tensile, compression and torsion tests at fixed temperatures, transmission electron or optical microscopy at room temperature as well as X-ray diffraction measurements were detailed elsewhere All experiments were performed so as to compare properties of the same alloy, but modified using different treatment procedures. [Pg.427]

The nano-scale structures in polymer layered-silicate nano-composites can be thoroughly characterized by X-ray diffraction (XRD) and transmission electron microscopy (TEM). XRD is used to identify intercalated structures. XRD allows quantification of changes in layer spacing and the most commonly used to probe the nano-composite structure and... [Pg.32]

In the matrix of PLA/ polycaprilactone (PCL)/OMMT nano-composites, the silicate layers of the organoclay were intercalated and randomly distributed (Zhenyang et at, 2007). The PLA/PCL blend significantly improved the tensile and other mechanical properties by addition of OMMT. Thermal stability of PLA/PCL blends was also explicitly improved when the OMMT content is less than 5%wt. Preparation of PLA/thermoplastic starch/MMT nano-composites have been investigated and the products have been characterized using X-Ray diffraction, transmission electron microscopy and tensile measurements. The results show improvement in the tensile and modulus, and reduction in fracture toughness (Arroyo et ah, 2010). [Pg.36]


See other pages where Transmission electron microscopy X-ray diffraction is mentioned: [Pg.194]    [Pg.159]    [Pg.473]    [Pg.453]    [Pg.570]    [Pg.1555]    [Pg.194]    [Pg.159]    [Pg.473]    [Pg.453]    [Pg.570]    [Pg.1555]    [Pg.267]    [Pg.213]    [Pg.149]    [Pg.350]    [Pg.537]    [Pg.49]    [Pg.235]    [Pg.223]    [Pg.195]    [Pg.395]    [Pg.299]    [Pg.120]    [Pg.14]    [Pg.65]    [Pg.129]    [Pg.168]    [Pg.156]    [Pg.314]    [Pg.314]    [Pg.282]    [Pg.85]    [Pg.172]    [Pg.280]    [Pg.364]    [Pg.365]    [Pg.45]    [Pg.258]   
See also in sourсe #XX -- [ Pg.36 , Pg.40 ]




SEARCH



Diffraction electron microscopy

Electron diffraction

Electronic diffraction

Electrons diffracted

Ray Transmission

Transmission electron diffraction

Transmission electron microscopy

Transmission electron microscopy diffraction

Transmission electronic microscopy

Transmission microscopy

X electron

X-ray diffraction electron microscopy

X-ray electron

© 2024 chempedia.info