Transmission electron microscopy diffraction

High-resolution Transmission Electron Microscopy Diffracted intensity in a powder pattern (in 26 or in reciprocal space unit)... 

Transmission electron microscopy (TEM) can resolve features down to about 1 nm and allows the use of electron diffraction to characterize the structure. Since electrons must pass through the sample however, the technique is limited to thin films. One cryoelectron microscopic study of fatty-acid Langmuir films on vitrified water [13] showed faceted crystals. The application of TEM to Langmuir-Blodgett films is discussed in Chapter XV. 

Nylon-6. Nylon-6—clay nanometer composites using montmorillonite clay intercalated with 12-aminolauric acid have been produced (37,38). When mixed with S-caprolactam and polymerized at 100°C for 30 min, a nylon clay—hybrid (NCH) was produced. Transmission electron microscopy (tern) and x-ray diffraction of the NCH confirm both the intercalation and molecular level of mixing between the two phases. The benefits of such materials over ordinary nylon-6 or nonmolecularly mixed, clay-reinforced nylon-6 include increased heat distortion temperature, elastic modulus, tensile strength, and dynamic elastic modulus throughout the —150 to 250°C temperature range. 

Transmission electron microscopy (tern) is used to analyze the stmcture of crystals, such as distinguishing between amorphous siUcon dioxide and crystalline quartz. The technique is based on the phenomenon that crystalline materials are ordered arrays that scatter waves coherently. A crystalline material diffracts a beam in such a way that discrete spots can be detected on a photographic plate, whereas an amorphous substrate produces diffuse rings. Tern is also used in an imaging mode to produce images of substrate grain stmctures. Tern requires samples that are very thin (10—50 nm) sections, and is a destmctive as well as time-consuming method of analysis. 

A progressive etching technique (39,40), combined with x-ray diffraction analysis, revealed the presence of a number of a polytypes within a single crystal of sihcon carbide. Work using lattice imaging techniques via transmission electron microscopy has shown that a-siUcon carbide formed by transformation from the P-phase (cubic) can consist of a number of the a polytypes in a syntactic array (41). 

Alternatives to XRD include transmission electron microscopy (TEM) and diffraction, Low-Energy and Reflection High-Energy Electron Diffraction (LEED and RHEED), extended X-ray Absorption Fine Structure (EXAFS), and neutron diffraction. LEED and RHEED are limited to surfaces and do not probe the bulk of thin films. The elemental sensitivity in neutron diffraction is quite different from XRD, but neutron sources are much weaker than X-ray sources. Neutrons are, however, sensitive to magnetic moments. If adequately large specimens are available, neutron diffraction is a good alternative for low-Z materials and for materials where the magnetic structure is of interest. 

Transmission Electron Microscopy Transmission Electron Microscope Conventional Transmission Electron Microscopy Scannir Transmission Electron Microscopy High Resolution Transmission Electron Microscopy Selected Area Diffraction Analytical Elearon Microscopy Convergent Beam Elearon DifFraaion Lorentz Transmission Electron Microscopy... 

Four different material probes were used to characterize the shock-treated and shock-synthesized products. Of these, magnetization provided the most sensitive measure of yield, while x-ray diffraction provided the most explicit structural data. Mossbauer spectroscopy provided direct critical atomic level data, whereas transmission electron microscopy provided key information on shock-modified, but unreacted reactant mixtures. The results of determinations of product yield and identification of product are summarized in Fig. 8.2. What is shown in the figure is the location of pressure, mean-bulk temperature locations at which synthesis experiments were carried out. Beside each point are the measures of product yield as determined from the three probes. The yields vary from 1% to 75 % depending on the shock conditions. From a structural point of view a surprising result is that the product composition is apparently not changed with various shock conditions. The same product is apparently obtained under all conditions only the yield is changed. 

Small needle-shaped single crystals were examined by transmission electron microscopy (TEM) and electron diffraction (ED) (see Fig. 16-17). The results show that the crystals are elongated along the b-axis, which is the direction of weak intermolecular n-n interactions, and have a well-developed (ab) top surface. It corresponds to the surface of aliphatic tails (direction of weak intermolecular interactions). There are indications of displacement of successive ( / )-laycrs along the fl-axis, in line with the other signs of disorder in the aliphatic layer. 

The nano-scale structures in polymer layered-silicate nano-composites can be thoroughly characterized by X-ray diffraction (XRD) and transmission electron microscopy (TEM). XRD is used to identify intercalated structures. XRD allows quantification of changes in layer spacing and the most commonly used to probe the nano-composite structure and... 

In the matrix of PLA/ polycaprilactone (PCL)/OMMT nano-composites, the silicate layers of the organoclay were intercalated and randomly distributed (Zhenyang et at, 2007). The PLA/PCL blend significantly improved the tensile and other mechanical properties by addition of OMMT. Thermal stability of PLA/PCL blends was also explicitly improved when the OMMT content is less than 5%wt. Preparation of PLA/thermoplastic starch/MMT nano-composites have been investigated and the products have been characterized using X-Ray diffraction, transmission electron microscopy and tensile measurements. The results show improvement in the tensile and modulus, and reduction in fracture toughness (Arroyo et ah, 2010). 

Determined by inductively coupled plasma-mass spectrometry of acid digested catalyst samples Calculated from X-ray diffraction peak broadening at (101) foranatase and (110) formtile TiOa Mean particle diameter measured from transmission electron microscopy pictures of gold catalysts... 

The properties of titania particles were investigated using X-ray diffraction (XRD, Model D/MAX-RB, Rigaku Ltd.), scanning electron microscopy (SEM, Model 535M, Philips Ltd.), transmission electron microscopy (TEM, Model 2000EX, JEOL Ltd.). The crystallite sizes were estimated by Scherrer s equation and the composition of rutile phase in titania were estimated from the respective integrated XRD peak intensities. 

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