Transmission electron microscopy observations

The X-ray diffraction pattern of the solid phase obtained by complete neutralization of an acidic solution of SnCl4-5H20 is presented in Fig. 13.18. Cassiterite Sn02 (rutile-type structure) was identified and Laue-Scherrer s law gives an average particle size of 2 0.2 nm in good agreement with transmission electron microscopy observations. 

Saka, H. (1998), Transmission electron microscopy observation of thin foil specimens prepared by means of a focused ion beam , Journal of Vacuum Science and Technology B, 16, 2522-2527. 

Takahashi, N. and Kashiwaya, S., High Resolution Transmission Electron Microscopy Observation of the M0S2 - Au Interface Formed Due to Stick-Slip of M0S2 Sliding on Au in Relation to the Friction Trace, Wear, 206, 8, (1997). 

We have seen that the method of preparation and the information provided by transmission electron microscopy may vary considerably depending on the type of study undertaken. At the same time, a considerable range of qualitative and quantitative observations is potentially available. It is thus essential to clearly define in advance the goal of the transmission electron microscopy observation (particle size, variations in local composition, etc.). 

Specimen preparation for transmission electron microscopy Observation Direction... 

Agrawal A, Cizeron J and Colvin V L 1998 In situ high-temperature transmission electron microscopy observations of the formation of nanocrystalline TIC from nanocrystalline anatase (Ti02) Microsc. Microanal. 4 269... 

Obviously, aggregate size distribution characterization in the mix is very delicate. Some transmission electron microscopy observations have been conducted on microtome thin cuts, but such characterizations are restricted to a small number of aggregates and can only lead to qualitative conclusions [23]. Direct characterization of object distribution in tie mix has also been conducted using x-ray [105] or neutron diffraction, but such approaches are strongly limited by the high concentration of filler objects and their refraction index, which is relatively close to that of rubber. One other way to characterize object size distribution is to extract the filler from the mix by thermal or catalyzed polymer decomposition these procedures probably greatly affect object size, because of possible reagglomerations. 

X). Lourie, O. Wagner, H. D. Transmission electron microscopy observations of fracture of single-wall carbon nanotubes under axial tension. Appl. Phys. Lett. 73, 3527-3529 (1998). 

Liu, Z.Y., Zhang, J.L, Yu, P.T., Zhang, J.X., Makharia, R., More, K.L., and Stach, E.A. (2010) Transmission electron microscopy observation of corrosion behaviors of platinized carbon blacks under thermal and electrochemical conditions. J. Electrochem. Soc., 157, B906-B913. 

At 1130°C and 1205 C, the surface of the a-alumina samples was converted to P/p" aluminas at both sodium concentrations. Comparing these four samples, the relative intensity of the p/p" patterns was the weakest for the sample with the most severe exposure (IIC ppm Na at 1205°C). This apparent contradiction was supported by transmission electron microscopy observations, where P- and p"-alumina were not seen on ion-thinned transverse sections of this sample, compared to the distinct p/p"-alutnina layers that were observed for both of the samples that were exposed to 30 ppm Na, and for the sample exposed to 110 ppm Na at 1130°C. The likely explanation for this behavior is that a thicker p/P -alumina layer formed on the sample at 1205°C with 110 ppm Na, and that this layer spalled off of the sample because of the difference in thermal expansion coefficients or because of the volume expansion associated with the reaction. 

The bulk of the results obtained in this study were obtained by analytical transmission electron microscopy. Observations were made on both grades of material in the as-received, untested condition and after tensile testing at 1250°C. Test samples selected for examination covered the range of observed creep behavior, and included samples that failed after times ranging from -10 to -200 hours depending on applied stress and also samples from interrupted tests that survived for up to 2000 hours under lower applied stresses. In addition, a comparison was made of non-reinforced samples tested with and without a 500 hour pre-anneal at the test temperature. In all cases, the gauge sections of crept samples were cut parallel to the stress axis to obtain both near-surface and raid-plane sections. Prior to final TEM specimen preparation, these sections were examined optically for evidence of distributed creep cavitation or crack damage. 

C. Gauthier, G. ThoUet, G. Vigier, E. Bourgeat-Lami, A. Guyot, Transmission electron microscopy observations of nucleated functionalized silica particles, Polym. Adv. Technol. 1995, 66, 345-348. 

Fig. A.3-2A Schematic illustration of the formation of the nanocrystalline structure in Fe—Cu—Nb—Si—B alloys, based on atom probe analysis results and transmission electron microscopy observations by Mono et al. [3.23,...

Cryogenic transmission electron microscopy Observe morphology of each phase The samples in each phase were frozen to form a thin ice film, which was observed by electron microscopy... 

Liu Y et al (2011) In situ transmission electron microscopy observation of pulverization of aluminum nanowircs and evolution of the thin surface AI2O3 layers during lithiation-delithiation cycles. Nano Lett 11 4188-4194... 

TRANSMISSION ELECTRON MICROSCOPY OBSERVATION Ordering Processes in Ni-Mo... 

Transmission electron microscopy observations (TEM-JEM200CX), of Ni catalysts were performed on samples prepared by two different ways the first as just described, the second from bulk alloys. For the first samples, a suspension of Ni catalyst in alcohol was deposited on a copper microgrid and dried in the specimen introduction chamber to avoid any contact with air. Samples prepared from bulk samples were first electrolytically thinned with an acid solution at room temperature then observed directly after Al-leaching. Al-leaching was sufficient to obtain thin observable regions. Quantitative microanalyses were obtained on a STEM-VG.HB5 which allows a high resolution in EDX and EELS microanalyses (lateral resolution of 1.5 nm at the sample level). 

Takeguchi, M., Tanaka, M., Yasuda, H., Furuya, K. (2001). Real-time high-resolution transmission electron microscopy observation of the growth process of (001) surfaces on a nanometer-sized Si multiply twinned particle. Surface Science, 493, 414-419. doi 10.1016/S0039-6028(01)01247-X. 

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