Thin films, description

Epitaxial crystal growth methods such as molecular beam epitaxy (MBE) and metalorganic chemical vapor deposition (MOCVD) have advanced to the point that active regions of essentially arbitrary thicknesses can be prepared (see Thin films, film deposition techniques). Most semiconductors used for lasers are cubic crystals where the lattice constant, the dimension of the cube, is equal to two atomic plane distances. When the thickness of this layer is reduced to dimensions on the order of 0.01 )J.m, between 20 and 30 atomic plane distances, quantum mechanics is needed for an accurate description of the confined carrier energies (11). Such layers are called quantum wells and the lasers containing such layers in their active regions are known as quantum well lasers (12). 

O. S. Heavens. Optical Properties of Thin Solid Films. Buttcrworths, 1955. Chapter 4 presents a detailed mathematical description of the Fresnel fringing phenomenon for the transmission of light through thin films. 

This volume contains 50 articles describing analytical techniques for the characterization of solid materials, with emphasis on surfaces, interfaces, thin films, and microanalytical approaches. It is part of the Materials Characterization Series, copublished by Butterworth-Heinemann and Manning. This volume can serve as a stand-alone reference as well as a companion to the other volumes in the Series which deal with individual materials classes. Though authored by professional characterization experts the articles are written to be easily accessible to the materials user, the process engineer, the manager, the student—in short to all those who are not (and probably don t intend to be) experts but who need to understand the potential applications of the techniques to materials problems. Too often, technique descriptions are written for the technique specialist. 

Recently an alternative approach for the description of the structure in systems with self-assembling molecules has been proposed in Ref. 68. In this approach no particular assumption about the nature of the internal interfaces or their bicontinuity is necessary. Therefore, within the same formahsm, localized, well-defined thin films and diffuse interfaces can be described both in the ordered phases and in the microemulsion. This method is based on the vector field describing the orientational ordering of surfactant, u, or rather on its curlless part s defined in Eq. (55). 

The mechanical properties of ionomers can be appreciably altered by the manner in which the ionomer is prepared and treated prior to testing. Some of the factors that are influential are the degree of conversion (neutralization) from the acid form to the salt form, the nature of the thermal treatment or aging, the type of counterion that is introduced, the solvent that is used for preparation of thin films, and the presence and nature of any plasticizers or additives that may be present. In the scope of this chapter, it is not possible to provide a complete description of the influence of each of these variables on the wide variety of ionomers that are now commercially available or produced in the laboratory. Instead, one or more examples of the changes in properties that may be induced by each of the processing variables is presented and discussed. 

The macroscopic approach to investigating ECALE, forming thin films, and analyzing them was discussed in the last section. In this section, studies designed to provide an atomic-level description of the growth of atomic layers in an ECALE cycle are described. 

Figure 48. Kenjo s ID macrohomogeneous model for polarization and ohmic losses in a composite electrode, (a) Sketch of the composite microstructure, (b) Description of ionic conduction in the ionic subphase and reaction at the TPB s in terms of interpenetrating thin films following the approach of ref 302. (c) Predicted overpotential profile in the electrode near the electrode/electrolyte interface, (d) Predicted admittance as a function of the electrode thickness as used to fit the data in Figure 47. (Reprinted with permission from refs 300 and 301. Copyright 1991 and 1992 Electrochemical Society, Inc. and Elsevier, reepectively.)...

The structure of the so-called "composite" membranes used in reverse osmosis is also much more complex than the conventional, simplistic description of the ultrathin semipermeable film deposited on and supported by a porous substrate. Most of these membranes which exhibit high flux and separation are composed of an anisotropic, porous substrate topped by an anisotropic, ultrathin permselective dense layer which is either highly crosslinked, or exhibits a progressively decreased hydrophilicity toward the surface. The basic difference between the conventional anisotropic (asymmetric) membrane and the thin film composite is that the latter might be... 

Fig. 7 2D thickness-surface energy gradient library for mapping the effects of these parameters on the self-assembly of PS-b-PMMA block copolymer thin films. See text for a fuU description. Lq is the equilibrium self-assembly period and h is the film thickness. Dashed white lines delineate the neutral surface energy region, which exhibits nanostructures oriented perpendicular to the substrate plane. (Derived from [18] with permission)... 

In supported metallic catalysts, the metals are usually from Groups VIII and VB of the Periodic Table. For highly dispersed metallic catalysts, the support or the carrier is usually a ceramic oxide (silica or alumina) or carbon with a high surface area, as described in chapter 2. Supported metallic catalysts can be prepared in a number of ways as described by Anderson (1975). A description of some of the methods used to prepare representative model (thin film) and practical (technological) powder systems follows. 

Description Thin-film narrow-bore Thick-film narrow-bore Thick-film wide-bore... 

When welding polyethylene and polypropylene, clean, freshly cul surfaces should be prepared, and nitrogen should be used in the torch because a thin film of oxide prevents a satisfactory bond. sNeil Bartlett kindly supplied a description of this technique. 

Figure 7. A photographic sequence showing the drainage behavior of a thin film formed from 2 mM SDS in 2 mM sodium phosphate buffer, pH 7.0 containing 0.1 M NaCl. See text for description.

In this paper, an overview of the origin of second-order nonlinear optical processes in molecular and thin film materials is presented. The tutorial begins with a discussion of the basic physical description of second-order nonlinear optical processes. Simple models are used to describe molecular responses and propagation characteristics of polarization and field components. A brief discussion of quantum mechanical approaches is followed by a discussion of the 2-level model and some structure property relationships are illustrated. The relationships between microscopic and macroscopic nonlinearities in crystals, polymers, and molecular assemblies are discussed. Finally, several of the more common experimental methods for determining nonlinear optical coefficients are reviewed. 

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