Synchrotron light source

National Synchrotron Light Source User s Manual Guide to the VUVandX-Ray Beam Lines. (N. F. Gmur ed.) BNL informal report no. 45764, 1991. 

Cool, T.A. et al., Photoionization mass spectrometer for studies of flame chemistry with a synchrotron light source. Rev. Sci. lustrum., 76,094102,2005. 

In recent years, high-resolution x-ray diffraction has become a powerful method for studying layered strnctnres, films, interfaces, and surfaces. X-ray reflectivity involves the measurement of the angnlar dependence of the intensity of the x-ray beam reflected by planar interfaces. If there are multiple interfaces, interference between the reflected x-rays at the interfaces prodnces a series of minima and maxima, which allow determination of the thickness of the film. More detailed information about the film can be obtained by fitting the reflectivity curve to a model of the electron density profile. Usually, x-ray reflectivity scans are performed with a synchrotron light source. As with ellipsometry, x-ray reflectivity provides good vertical resolution [14,20] but poor lateral resolution, which is limited by the size of the probing beam, usually several tens of micrometers. 

National Synchrotron Light Source (NSLS) at Brookhaven National Laboratory (BNL). 

S. M. Gruner and D. H. Bilderback, Energy recovery linacs as synchrotron light sources. Nucl. Instrum. Methods Phys. Res. Sect A 500(1-3), 25-32 (2003). 

This research has been funded by the Donors of the Petroleum Research Fund (ACS, grant 28336-G5) and by the National Science Foundation (CTS-940618). Support from the Layman Fund and the Research Council at the University of Nebraska is so acknowledged. We thank the National Synchrotron Light Source and the Stanford Synchrotron Radiation Laboratory for X-ray beamtime. 

In situ XRD spectra were collected on beam line X18A at the National Synchrotron Light Source (NSLS) located at Brookhaven National Laboratory (BNL). The X-ray wavelength (X) was 1.195 A. The step size of the 29 scan was 0.02° in the regions with Bragg reflections and 0.05° in the regions without reflections. The XRD spectra were collected in the transmission mode (Liu et al., 2004). 

Spectroscopic evaluation of the catalysts. The UV-Vis spectra of the Jacobsen Co-salen catalysts were collected in the transmission mode on a CARY-3E UV-Vis spectrophotometer by dissolving the catalysts in epichlorohydria The Co K-edge (7709 eV) X-ray absorption near edge stracture, XANES, of Jacobsen s Co-salen catalyst was collected during the HKR reaction at beamline XIO-C at National Synchrotron Light Source (NSLS), Brookhaven National Lab, Upton, NY. 

The usability of the various available machines, in particular in regard to time-resolved measurements, is proportional to the flux that they are able to shine on the sample. Table 4.1 shows typical data. Modern laboratory instrumentation (rotating anode) is approaching the performance of older synchrotron light sources. 

Overview. Electrons orbiting in a magnetic field lose energy continually in the form of electromagnetic radiation (photons) emitted tangentially from the orbit. This light is called synchrotron radiation. The first dedicated synchrotron light source was the Stanford Synchrotron Radiation Laboratory (SSRL) (1977). Nowadays, many... 

The traditional operation mode of synchrotron light sources is a discontinuous one particles are injected in the storage ring, the beam current is decaying exponentially, and after several hours the synchrotron radiation run is stopped for a new injection. 

This effort was funded by the National Aeronautics and Space Administration (NASA) Grant NNX07AB93A under a project entitled Basic Studies for the Production and Upgrading of Fischer-Tropsch Synthesis Products to Fuels and the Commonwealth of Kentucky. This research was carried out, in part, at the National Synchrotron Light Source, Brookhaven National Laboratory, which is supported by the U.S. DOE, Divisions of Materials Science and Chemical Sciences. Special thanks to Dr. Nebojsa Marinkovic (Beamline X18b, NSLS, Brookhaven) for help with X AFS studies and Joel Young (University of Oklahoma, Department of Physics) for XAFS cell construction. 

National Synchrotron Light Source Brookhaven National Laboratory Upton, New York... 

A number of synchrotrons (including the National Synchrotron Light Source, New York, the Advanced Light Source, Berkley, and soon the Canadian Light Source, Saskatoon) operate mail-in crystallography services where a scientist can mail in crystals (prefrozen and mounted on loops) and data will be collected, processed (sometimes), and returned. This is becoming a method of choice, as it eliminates the need to travel to a synchrotron and speeds up the data collection procedure at the synchrotron also. 

The NEXAFS experiments were carried out on the U7A NIST/Dow Materials Soft X-ray Materials Characterization Facility at the National Synchrotron Light Source at Brookhaven National Laboratory (NSLS BNL)... 

The NEXAFS experiments reported here were carried out at the U1 Beamline of the National Synchrotron Light Source, Brookhaven National Laboratory. Details concerning the optics of the beamline, as well as the UHV chamber with facilities for high pressure reactions, have been described previously.7,8 In our experimental set-up, NEXAFS spectra can be recorded by measuring either the electron yield or fluorescence yield. While the electron yield method is sensitive only to the top few atomic... 

Figure 17.4. Schematic of a scanning transmission X-ray microscope. This setup uses soft X rays (250-800 eV) from an undulator on beamline XIA of the National Synchrotron Light Source in Brookhaven National Laboratory, Upton, NY.

Figure 1.8 Example of the spectral flux Ny of the undulator/wiggler radiation measured at the X-Al beam line at NSLS (National Synchrotron Light Source, Brookhaven National Laboratory, LISA) with the undulator parameters K = 1.50, X = 8 cm, N = 35, for a 500 mA beam current, with a 0.1% bandpass and a solid angle of 1 mrad2. The values are corrected for the beamline/monochromator efficiency and the photodiode detector response the dip at 4.4 nm is an artifact due to carbon contamination of the optical elements. From [BRA89], (Reproduced with permission from Review of Scientific Instruments.)...

Multichannel detection with a synchrotron light source design and potential... 

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