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Surface structure probes

A number of methods that provide information about the structure of a solid surface, its composition, and the oxidation states present have come into use. The recent explosion of activity in scanning probe microscopy has resulted in investigation of a wide variety of surface structures under a range of conditions. In addition, spectroscopic interrogation of the solid-high-vacuum interface elucidates structure and other atomic processes. [Pg.293]

AFM Atomic force microscopy [9, 47, 99] Force measured by cantilever deflection as probe scans the surface Surface structure... [Pg.313]

PTM Photon tunneling microscopy [12] An interface is probed with an evanescent wave produced by internal reflection of the illuminating light Surface structure... [Pg.313]

STM Scanning tunneling microscopy [9, 19, 31] Tunneling current from probe scans a conducting surface Surface structure... [Pg.313]

Ions are also used to initiate secondary ion mass spectrometry (SIMS) [ ], as described in section BI.25.3. In SIMS, the ions sputtered from the surface are measured with a mass spectrometer. SIMS provides an accurate measure of the surface composition with extremely good sensitivity. SIMS can be collected in the static mode in which the surface is only minimally disrupted, or in the dynamic mode in which material is removed so that the composition can be detemiined as a fiinction of depth below the surface. SIMS has also been used along with a shadow and blocking cone analysis as a probe of surface structure [70]. [Pg.310]

The major role of TOF-SARS and SARIS is as surface structure analysis teclmiques which are capable of probing the positions of all elements with an accuracy of <0.1 A. They are sensitive to short-range order, i.e. individual interatomic spacings that are <10 A. They provide a direct measure of the interatomic distances in the first and subsurface layers and a measure of surface periodicity in real space. One of its most important applications is the direct determination of hydrogen adsorption sites by recoiling spectrometry [12, 4T ]. Most other surface structure teclmiques do not detect hydrogen, with the possible exception of He atom scattering and vibrational spectroscopy. [Pg.1823]

The STM uses this eflFect to obtain a measurement of the surface by raster scanning over the sample in a manner similar to AFM while measuring the tunneling current. The probe tip is typically a few tenths of a nanometer from the sample. Individual atoms and atomic-scale surface structure can be measured in a field size that is usually less than 1 pm x 1 pm, but field sizes of 10 pm x 10 pm can also be imaged. STM can provide better resolution than AFM. Conductive samples are required, but insulators can be analyzed if coated with a conductive layer. No other sample preparation is required. [Pg.704]

Surface SHG [4.307] produces frequency-doubled radiation from a single pulsed laser beam. Intensity, polarization dependence, and rotational anisotropy of the SHG provide information about the surface concentration and orientation of adsorbed molecules and on the symmetry of surface structures. SHG has been successfully used for analysis of adsorption kinetics and ordering effects at surfaces and interfaces, reconstruction of solid surfaces and other surface phase transitions, and potential-induced phenomena at electrode surfaces. For example, orientation measurements were used to probe the intermolecular structure at air-methanol, air-water, and alkane-water interfaces and within mono- and multilayer molecular films. Time-resolved investigations have revealed the orientational dynamics at liquid-liquid, liquid-solid, liquid-air, and air-solid interfaces [4.307]. [Pg.264]

Two working modes are used for the STM first, the constant height-mode, in which the recorded signal is the tunneling current versus the position of the tip over the sample, and the initial height of the STM tip with respect to the sample surface is kept constant (Fig. 22(a)). In the constant currentmode, a controller keeps the measured tunneling current constant. In order to do that, the distance between tip and sample must be adjusted to the surface structure and to the local electron density of the probed sample via a feedback loop (Fig. 22(b)). [Pg.19]

Chirality at surfaces can be manifested in a number of forms including the intrinsic chirality of the surface structure and even the induction of chirality via the adsorption of achiral molecules onto achiral surfaces. The ability of STM to probe surfaces on a local scale with atomic/molecular resolution has revolutionized the understanding of these phenomena. Surfaces that are globally chiral either due to their intrinsic structure or due to the adsorption of chiral molecules have been shown by STM to establish control over the adsorption behavior of prochiral species. This could have profound consequences for the understanding of the origin of homochirality in life on Earth and in the development of new generations of heterogeneous chiral catalysts that may, finally, make a substantial impact on the pharmaceutical industry. [Pg.25]

Alumina is known to have more ionic character and its surface has a more complex structure than that of silica. Reaction of Bu3SnH with the surface of partially dehydroxylated aluminas was followed and it was found that the extreme sensitivity of tin chemical shifts to the molecular environment constitutes a method whereby surface organometallic complexes of tin can be used as molecular probes for determining surface structures of oxides.248... [Pg.270]

A.D. Stefanis and A.A.G. Tomlinson, Scanning Probe Microscopies From Surface Structure to Nano-Scale Engineering, Trans Tech Publications Ltd., Uetikon-Zurich, 2001. [Pg.383]

XPS has typically been regarded primarily as a surface characterization technique. Indeed, angle-resolved XPS studies can be very informative in revealing the surface structure of solids, as demonstrated for the oxidation of Hf(Sio.sAso.5)As. However, with proper sample preparation, the electronic structure of the bulk solid can be obtained. A useful adjunct to XPS is X-ray absorption spectroscopy, which probes the bulk of the solid. If trends in the XPS BEs parallel those in absorption energies, then we can be reasonably confident that they represent the intrinsic properties of the solid. Features in XANES spectra such as pre-edge and absorption edge intensities can also provide qualitative information about the occupation of electronic states. [Pg.139]

In non-electrochemical heterogeneous catalysis, the interface between the catalyst and the gas phase can often be characterized using a wide variety of spectroscopic probes. Differences between reaction conditions and the UHV conditions used in many studies have been probed extensively 8 as have differences between polycrystalline and single-crystalline materials. Nevertheless, the adsorbate-substrate interactions can often be characterized in the absence of pressure effects. Therefore, UHY based surface science techniques are able to elucidate the surface structures and energetics of the heterogeneous catalysis of gas phase molecules. [Pg.308]

CO is often used as a probe molecule to aid in the determination of surface structures. Why would the CO stretching frequency change depending on where it was bound on the surface ... [Pg.372]


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