Stylus instruments

ISO 3274 1996 Geometrical Product Specifications (GPS) — Surface texture Profile method — Nominal characteristics of contact stylus instruments. 

ISO 5436 1985 Calibration specimens — Stylus instruments — Types, calibration and use of specimens. 

DIN EN ISO 3274 1998-04 (1998) Geometrical product specification (GPS). Surface texture Profile method Nominal characteristics of contact (stylus) instruments. 

DIN EN ISO 4288-04 (1998) Determination of values of surface roughness parameters Ra, Rz, Rmax using electrical contact (stylus) instruments concepts and measuring conditions. 2014 Beuth Verlag GmbH, Berlin, Germany... 

In stylus instruments, a diamond needle of very small dimensions (e.g. 13 pm in tip radius) is used as the arm of an electromechanical pick-up. The position of the... 

For the measurement of machined surfaces, mostly two-dimensionally working tactile stylus instruments are applied. At this a stylus tip (as a rule made of diamond) is moved along the surface, and its displacement against a reference plane is measured. The obtained profile finally is treated mathematically. On mild surfaces, the stylus tip may leave marks, which is a disadvantage of tactile measuring methods. 

ISO 25178- 601 2010 Geometrical product specifications (GPS) -Surface texture Areal - Part 601 Nominal characteristics of contact (stylus) instruments ISO/DIS 25178- 604 Geometrical product specifications (GPS) - Surface texture Areal - Part 604 Nominal characteristics of non-contact (coherence scanning interferometry) instruments... 

There are many techniques available to aid in the quantification of surface roughness. The method chosen for use here was that of a tracing stylus instrument for which the operation is straightforward. Attendant disadvantages are related to the possibility of leaving a permanent impression on the sample and the lack of resolution associated with the stylus size. 

DIN 4777, Metrology of Surfaces Profile Filters for Electrical Contact Stylus Instruments Phase-Corrected Filters, Beuth Verlag, Berlin, 1990. 

Standard DIN 4777 - Phase correct filters for use in electrical stylus instruments. 

The surface roughness of the ring and liner samples was measiued before and after the test series by using a Taylor-Hobson Form Talysurf PC diamond stylus instrument, see selected parameters in Table 1. 

Transmission electron microscope Scanning electron microscope Optical interference Stylus instrument Topografiner... 

In past years, a contacting-stylus instrument similar to a phonograph needle has been the standard method for surface-profile measurements. A fine diamond stylus coupled to a transducer scans the surface, providing closely spaced profiles that can be displayed on an x-y recorder. The elevation sensitivity is excellent but unfortunately the stylus sometimes obliterates the original surface features. The diameter of the stylus point determines the width and depth of the crevices it will measure. Table 2 compares the vertical and horizontal resolving powers of several microtopography techniques. The other electron techniques mentioned in Table 2 will be discussed in later sections. 

The three-dimensional, digital nature of SFM and STM data makes the instruments excellent high-resolution profilometers. Like traditional stylus or optical profilometers, scanning probe microscopes provide reliable height information. However, traditional profilometers scan in one dimension only and cannot match SPM s height and lateral resolution. 

The significance of instrument band width and modulation transfer function was discussed in connection with Equation (3) to characterize the roughness of nominally smooth surfaces. The mechanical (stylus) profilometer has a nonlinear response, and, strictly speaking, has no modulation transfer function because of this. The smallest spatial wavelength which the instrument can resolve, 4nin> given in terms of the stylus radius rand the amplitude aoi the structure as... 

Surface roughness was measured according to ANSI standard 1346.1-(1978) using a Tencor Instruments Alpha-Step 200 stylus profilometer located at the National Nanofabrication Facility of Cornell. Five surface roughness measurements were made for each sample and their average values recorded. Details of the experimental apparatus set-up and its operation are given elsewhere (Dems, B. C. et. al. Inti. Polvm. Proc.. in press.). 

Surface Roughness measured with Tencor Instruments Alpha-Step 200 stylus profilometer per ANSI Standard 1346.1-(1978)... 

In a short but remarkable discourse on Hebrew mining, Job states that Iron is taken out of the earth (Job 28, 2). This passage describes the deep shaft, the dark galleries and tunnels through the rock, the underground streams, the beautiful, precious minerals, and the rugged, hazardous life of the miners. The iron stylus mentioned in Job 19, 24 was one of the most ancient of writing instruments. Iron fishhooks and spears must also have been in use when this book was written Canst thou draw out leviathan with an hook . . . Canst thou fill his skin with barbed irons or his head with fish spears (Job 41,1, 7). 

Surface Analysis. The resist etching process was studied by measuring changes in the resist thickness versus etching time using a mechanical stylus surface profiler (Alpha-Step 200, Tencor Instruments, Inc.). 

Another type of scratch hardness which is a logical development of the Mohs scale consists of drawing a diamond stylus, under a definite load, across the surface to be examined. The hardness is determined by the width or depth of the resulting scratch the harder the material the smaller the scratch. This method has some value as a means of measuring the variation in hardness across a grain boundary. In general, however, the scratch sclerometer is a difficult instrument to operate. 

STM) based on the quantum mechanical effect of tunneling. The instrument scans an electrical probe, a sharp stylus, over a surface and detects a weak electric current flowing between the tip and the surface. The stylus is so sharp that its tip consists of only one atom ... 

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