Scanning electron microscope with

Penetration—Indentation. Penetration and indentation tests have long been used to characterize viscoelastic materials such as asphalt, mbber, plastics, and coatings. The basic test consists of pressing an indentor of prescribed geometry against the test surface. Most instmments have an indenting tip, eg, cone, needle, or hemisphere, attached to a short rod that is held vertically. The load is controlled at some constant value, and the time of indentation is specified the size or depth of the indentation is measured. Instmments have been built which allow loads as low as 10 N with penetration depths less than mm. The entire experiment is carried out in the vacuum chamber of a scanning electron microscope with which the penetration is monitored (248). 

The development and the recent increase in availability of the scanning electron microscope with its considerable depth of field and reduced beam intensity has widened the range of samples which can be examined... 

EPMA consists of a combination of a scanning electron microscope with several dispersive X-ray spectrometers. This technique is essentially an analysis of X-rays emitted from the sample which is being probed with an electron beam. The method is particularly useful for measuring the surface composition and the depth profile of alloy thin layers. However, it is also relatively poor in detecting light elements. 

X-ray powder diffraction patterns were obtained on oriented film specimens [7] (2 to 45° 2 , Philips PW 1120, monochromatized CuKa radiation, continuous peak registration). BET surface area and the pore volume distribution were determined from Nj adsorption-desorption isotherms at 77 K (degassing at 393 K, lO" mbar, 5h Sorptomatic 1900, Carlo Erba Instruments). The IR-spectra were recorded on KBr wafers [4] with a Specord 80M spectrometer. The XPS (X-ray photoelectron spectroscopy) spectra were obtained with VG ESCALAB 200 MKII spectrometer equipped with a twin anode AIKa source (1486 eV). The thermogravimetric (TGA) analyses were carried out with a Setaram TG 85 thermobalance at a heating rate of 6 K min in a helium flow of 30 ml min . The chromium content of the samples was determined by EPMA (JEOL 840 scanning electron microscope) with energy dispersive spectrometer (EDS, Tracer Northern) and by AAS (atomic absorption spectroscopy, Perkin Elmer 3030) analyses. 

The distribution of TPA molecules over the radius of the beads of PVA-PEG was measured using a Philips Model 505 scanning electron microscope with energy dispersive X-ray analysis (EDAX) system. The secondary electron micrographs of selected solid samples were obtained. 

The composition of the deposited solder was measured by energy dispersive x-ray measurements using standards in a scanning electron microscope. For each deposit, four square regions measuring 1.5 mm per side were sampled. A scanning electron microscope with a field emission source was employed for the micrographs of the samples. X-ray diffraction measurements were also made on selected samples, in order to determine the structure and orientation of the deposits. 

Adamaik B and Mathieu C 2000 The reduction of the beam gas interactions in the variable pressure scanning electron microscope with the use of helium gas Scanning 21 178... 

A modern scanning electron microscope, with vernier, is also an excellent instrument to measure dry state (approximately 0% RH) diameter of human hair fibers. 

The chemical composition of most specimens has been checked where possible, using an analytical scanning electron microscope with energy-dispersive x-ray spectrometry facility. Elements with atomic number below that of fluorine are not detectable by this technique, e.g. boron, carbon and oxygen. Fluorine is only detectable when present in major amounts. Ratios quoted are semi-quantitative atomic ratios. Other elements are also listed where present at detectable levels. 

In certain cases arterial prostheses of poly(ether-urethanes) have been halogenated by allowing the hypohalite solution to flow through them for a short time (e.g. 2 minutes). The depth of penetration of halogenation was assessed by use of a scanning electron microscope with a EDAX attachment. 

Addi.ional studies using a scanning electron microscope with X-ray function (SEM/X-ray) and electron spectroscopy chemical analysis (ESCA) on the powders will be carried out. An open literature report is being prepared to summarize the results. 

Fig. 1.35. Grape surface under scanning electron microscope, with detail of yeast peristomatic zones. Department of Electronic Microscopy, University of Bordeaux I...

R.M. Jarvis, A. Brooker, R. Goodacre, Surface-enhanced Raman spectroscopy for bacterial discrimination utilizing a scanning electron microscope with a Raman spectroscopy interface. Anal. Chem. 76, 5198 (2004)... 

The Pt Sn atomic ratios were obtained by EDX analysis nsing a Philips XL30 scanning electron microscope with a 20 keV electron beam and provided with ED AX DX-4 microanahser. 

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