Variable pressure scanning electron microscope

Adamaik B and Mathieu C 2000 The reduction of the beam gas interactions in the variable pressure scanning electron microscope with the use of helium gas Scanning 21 178... 

The samples were examined by variable pressure scanning electron microscopy (SEM) with a LEO 1450 VP microscope (Zeiss, Oberkochen, Germany). 

Another method is automated serial sectioning of specimens with an ultramicrotome integrated into an environmental scanning electron microscope (ESEM). This method involves imaging the surface of the specimen after removal of each slice. The reason for the choice of an ESEM (or a variable-pressure SEM) is to avoid specimen charging. The experimental setup of such an ultramicrotome operating in situ within an ESEM is described in [16]. 

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