Secondary electron micrograph

Figure 7. Secondary electron micrograph and carbon (KLL) map of untreated catalyst A. photomicrograph obtained at 8kV, O.lnA primary beam B. corresponding carbon (KLL) Auger map obtained in (peak-background)/ background mode, at 8kv, lOnA primary beam.

Fig. 3.6 Secondary electron micrographs showing morphology of (a) as-received NaAlH and (b) after milling for 5 h in the magneto mill Uni-BaU-MiU 5 under HES57 mode in argon (two magnets at 5 and 7 o clock positions ball to powder weight ratio 50 1)...

Fig. 3.18 Secondary electron micrographs showing the morphology of Mg-2B powders reac-tively mechanically alloyed, (a) Made with oxidized amorphous boron after 200 h, (b) made with oxide-free boron after 50 h and (c) made with oxide-free boron after 200 h of milling...

Fig. 1. Secondary electron micrograph of Na-borosilicate glass loaded with 30 wt% waste oxides and containing 0.9 wt% S03 (etching with 0.1 M HC1). Droplets with chemical durability lower than matrix are a sulphate-enriched phase (Stefanovsky 1989).

Figure 10.5. Secondary electron micrographs at two magnifications (note the 10-pm bars) of a 43 wt % polystyrene/HDPE specimen etched in potassium permanganate/ acid solution. The raised domains are polystyrene-rich.

SEM (secondary electrons) micrograph of a fracture surface from a Cu-Al203 nanocomposite. The Cu particles occupy intergranular positions and the fracture observed is mostly intergranular. 

In 1965 Long published a proposed ion microprobe analyzer [27]. Long s student, Drummond, began construction and in 1967 published secondary electron micrographs showing 0.5-pm resolution [28] using a primary beam column. This became the basis for the Associated Electrical Industries (AEI) Ltd. SIMS instrument [29]. This instrument utilized AEI s MS702R spark source mass spectrometer for secondary ion analysis and had a mass resolution of -5000. 

Figure 2 Secondary electron micrographs of (a) presolar Sic, (b) presolar graphite (cauliflower type), and (c) presolar graphite (onion type). Photographs courtesy of Sachiko Amari and Scott Messenger.

The distribution of TPA molecules over the radius of the beads of PVA-PEG was measured using a Philips Model 505 scanning electron microscope with energy dispersive X-ray analysis (EDAX) system. The secondary electron micrographs of selected solid samples were obtained. 

On the other hand, according to the results obtained by energy dispersive X-ray analysis (EDAX), a uniform distribution of TPA along bead radius was obtained. The secondary electron micrographs of the bead inner shows an sponge-like gel structure. 

Figure 5. Secondary electron micrograph of the exposed Interior of self-bound CaLSX.

Fig. 13 Secondary electron micrographs of PVME hydrogel in different states at different magnifications. (a, b) Gel at high degree of swelling (25°C, temperature below volume phase transition temperature) (c, d) Gel at small degree of swelling (40°C, temperature above the volume phase transition). Reprinted from Arndt et al. (2001b), p. 321. Copyright Wiley-VCH Co. KGaA. Reproduced with permission...

A secondary electron micrograph of the complete MEA is shown in Fig. 5. At the bottom and top sides of the micrograph, diffusion layers including carbon cloth fibers are easily recognized. 

Figure 4, Secondary electron micrograph of semicoke from Pittsburgh No, 8 coal...

Figure 6.12. Field emission secondary electron micrograph of a 10 pm diameter carboxyl-terminated SAM on a gold-coated substrate...

Figure 45. (a) Secondary electron micrograph of Pl3Sn alloy surface after... 

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