SEARCH Articles Figures Tables Adsorption measurement reflection spectrometry Analysis by total-reflection X-ray fluorescence spectrometry (TXRF) Applications of Near-Infrared Diffuse Reflection Spectrometry Attenuated Total Reflection Infrared Spectrometry (ATR) Attenuated total reflectance fourier transform infrared spectrometry Attenuated total reflectance infrared spectrometry Attenuated total reflection spectrometry Diffuse reflectance Fourier transform DRIFT) infrared spectrometry Diffuse reflectance Fourier-transform infrared spectrometry External reflection spectrometry Grazing incidence reflection spectrometry Infrared radiation reflection spectrometry Infrared reflection-absorption spectrometry Interfacial reflection spectrometry Internal reflection spectrometry Mid-IR Reflection Spectrometry Polarization-Modulation Spectrometry and its Application to Reflection-Absorption Measurements Reference Materials for Diffuse Reflection Spectrometry Reflection mass spectrometry Reflection spectrometry Reflection-Absorption Spectrometry with Metal Substrates Reflection-absorption infrared spectrometry RAIRS) Reflection-absorption spectra, measured spectrometry Surface enhanced infrared reflection spectrometry