Reflection-absorption infrared spectrometry RAIRS

The term 1 or h indicates low or high coverage of adsorbed ethene, as inferred from ethene exposures.h TPD, temperature-programmed desorption LITD, laser-induced thermal desorption 1 FT-MS, Fourier-transform mass spectrometry SIMS, secondary-ion mass spectrometry MS, mass spectrometry T-NEXAFS, transient near-edge X-ray absorption fine structure spectroscopy RAIRS, reflection-absorption infrared spectroscopy. d Data for perdeut-erio species.1 Estimated value. 

Surface analysis has made enormous contributions to the field of adhesion science. It enabled investigators to probe fundamental aspects of adhesion such as the composition of anodic oxides on metals, the surface composition of polymers that have been pretreated by etching, the nature of reactions occurring at the interface between a primer and a substrate or between a primer and an adhesive, and the orientation of molecules adsorbed onto substrates. Surface analysis has also enabled adhesion scientists to determine the mechanisms responsible for failure of adhesive bonds, especially after exposure to aggressive environments. The objective of this chapter is to review the principals of surface analysis techniques including attenuated total reflection (ATR) and reflection-absorption (RAIR) infrared spectroscopy. X-ray photoelectron spectroscopy (XPS), Auger electron spectroscopy (AES), and secondary ion mass spectrometry (SIMS) and to present examples of the application of each technique to important problems in adhesion science. 

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