Analysis by total-reflection X-ray fluorescence spectrometry TXRF

4 Analysis by total-reflection X-ray fluorescence spectrometry (TXRF) 

This section presents a brief overview of the fundamentals of TXRF and the requirements for sample preparation of marine sample materials to be analysed by TXRF, followed by an extensive description of e qierimental work. Furthermore, we direct attention to the analytical capabilities and limitations of the technique. 

TXRF is a descendant of conventional energy-dispersive XRF, however, with detection limits improved by 4-5 orders of magnitude, to date below KT g. It is important to point out that the TXRF technique differs fundamentally frcnn classical X-ray fluorescence (EDXRF), in sample preparation, calibration, data analysis and detection performance, as well as in the objects under investigation. 

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Detection limits are presented for 61 elements by ten analytical determinative methods FAAS flame atomic absorption spectrometry ETAAS electrothermal atomization atomic absorption spectrometry HGAAS hydride generation atomic absorption spectrometry including CVAAS cold vapor atomic absorption spectrometry for Hg ICPAES(PN) inductively coupled plasma atomic emission spectrometry utilizing a pneumatic nebulizer ICPAES(USN) inductively coupled plasma atomic emission spectrometry utilizing an ultrasonic nebulizer ICPMS inductively coupled plasma mass spectrometry Voltammetry TXRF total reflection X-ray fluorescence spectrometry INAA instrumental activation neutron analysis RNAA radiochemical separation neutron activation analysis also defined in list of acronyms. 

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