Polymer surfaces photoelectron spectroscopy

Finally, similar effects can be seen in miscible polymer blends where the surface tension correlates with the enrichment of the lower-energy component at the surface as monitored by x-ray photoelectron spectroscopy [104],... 

Surface analysis has made enormous contributions to the field of adhesion science. It enabled investigators to probe fundamental aspects of adhesion such as the composition of anodic oxides on metals, the surface composition of polymers that have been pretreated by etching, the nature of reactions occurring at the interface between a primer and a substrate or between a primer and an adhesive, and the orientation of molecules adsorbed onto substrates. Surface analysis has also enabled adhesion scientists to determine the mechanisms responsible for failure of adhesive bonds, especially after exposure to aggressive environments. The objective of this chapter is to review the principals of surface analysis techniques including attenuated total reflection (ATR) and reflection-absorption (RAIR) infrared spectroscopy. X-ray photoelectron spectroscopy (XPS), Auger electron spectroscopy (AES), and secondary ion mass spectrometry (SIMS) and to present examples of the application of each technique to important problems in adhesion science. 

In the many reports on photoelectron spectroscopy, studies on the interface formation between PPVs and metals, focus mainly on the two most commonly used top electrode metals in polymer light emitting device structures, namely aluminum [55-62] and calcium [62-67]. Other metals studied include chromium [55, 68], gold [69], nickel [69], sodium [70, 71], and rubidium [72], For the cases of nickel, gold, and chromium deposited on top of the polymer surfaces, interactions with the polymers are reported [55, 68]. In the case of the interface between PPV on top of metallic chromium, however, no interaction with the polymer was detected [55]. The results concerning the interaction between chromium and PPV indicates two different effects, namely the polymer-on-metal versus the metal-on-polymer interface formation. Next, the PPV interface formation with aluminum and calcium will be discussed in more detail. 

Other techniques utilize various types of radiation for the investigation of polymer surfaces (Fig. 2). X-ray photoelectron spectroscopy (XPS) has been known in surface analysis for approximately 23 years and is widely applied for the analysis of the chemical composition of polymer surfaces. It is more commonly referred to as electron spectroscopy for chemical analysis (ESCA) [22]. It is a very widespread technique for surface analysis since a wide range of information can be obtained. The surface is exposed to monochromatic X-rays from e.g. a rotating anode generator or a synchrotron source and the energy spectrum of electrons emitted... 

A variety of other techniques have been used to investigate ion transport in conducting polymers. The concentrations of ions in the polymer or the solution phase have been monitored by a variety of in situ and ex situ techniques,8 such as radiotracer studies,188 X-ray photoelectron spectroscopy (XPS),189 potentiometry,154 and Rutherford backscatter-ing.190 The probe-beam deflection method, in which changes in the density of the solution close to the polymer surface are monitored, provides valuable data on transient ion transport.191 Rotating-disk voltammetry, using an electroactive probe ion, provides very direct and reliable data, but its utility is very limited.156,19 193 Scanning electrochemical microscopy has also been used.194... 

Surface composition and morphology of copolymeric systems and blends are usually studied by contact angle (wettability) and surface tension measurements and more recently by x-ray photoelectron spectroscopy (XPS or ESCA). Other techniques that are also used include surface sensitive FT-IR (e.g., Attenuated Total Reflectance, ATR, and Diffuse Reflectance, DR) and EDAX. Due to the nature of each of these techniques, they provide information on varying surface thicknesses, ranging from 5 to 50 A (contact angle and ESCA) to 20,000-30,000 A (ATR-IR and EDAX). Therefore, they can be used together to complement each other in studying the depth profiles of polymer surfaces. 

X-ray photoelectron spectroscopy is frequently applied in the fields of catalysis and polymer technology. It has poor spatial resolution, and is generally limited to homogenous samples. Radiation sensitive materials are more appropriate for XPS analysis, as the X-ray beam is less damaging to the specimen surface than the electron beam used in AES, partly due to the lower flux densities that are used. 

XPS or ESCA (electron spectroscopy for chemical analysis) is a surface sensitive technique that only probes the outer atomic layers of a sample. It is very useful tool to study polymer surfaces [91]. An XPS spectrum is created by focusing a monochromatic beam of soft (low-energy) X-rays onto a surface. The X-rays cause electrons (photoelectrons) with characteristic energies to be ejected from an electronic core level. XPS, which may have a lateral resolution of ca. 1-10 pm, probes about the top 50 A of a surface. 

T. Kugler, M. Logdlun, and W.R. Saneck, Photoelectron spectroscopy and quantum chemical modeling applied to polymer surfaces and interfaces in light-emitting devices, Acc. Chem. Res., 32 225-234, 1999. 

This paper contributes to the literature by quantifying anionic polymer adsorption onto the clay minerals kaolinite, feldspar, mica and quartz by X-ray photoelectron spectroscopy (XPS). XPS measures the sorbed amount directly rather than by a subtraction technique. This enables an insight into how effective selective flocculation is for obtaining kaolinite from a mineral mixture. Atomic force microscopy (AFM) is also used to image polymer adsorption onto mineral surfaces and the effectiveness of this technique applied to mineral surfaces is discussed here. 

Bond failure may occur at any of the locations indicated in Fig. 1. Visual determination of the locus of failure is possible only if failure has occurred in the relatively thick polymer layer, leaving continuous layers of material on both sides of the fracture. The appearance of a metallic-appearing fracture surface is not definite proof of interfacial failure since the coupling agent, polymer films, or oxide layers may be so thin that they are not detectable visually. Surface-sensitive techniques such as X-ray photoelectron spectroscopy (XPS) and contact angle measurements are appropriate to determine the nature of the failure surfaces scanning electron microscopy (SEM) may also be helpful if the failed surface can be identified. 

X-ray photoelectron spectroscopy (XPS) was used for elemental analysis of plasma-deposited polymer films. The photoelectron spectrometer (Physical Electronics, Model 548) was used with an X-ray source of Mg Ka (1253.6 eV). Fourier transform infrared (FTIR) spectra of plasma polymers deposited on the steel substrate were recorded on a Perkin-Elmer Model 1750 spectrophotometer using the attenuated total reflection (ATR) technique. The silane plasma-deposited steel sample was cut to match precisely the surface of the reflection element, which was a high refractive index KRS-5 crystal. 

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