Pixel maps

From pixel maps obtained by the scanning proton probe, cross-section profiles of elemental distributions can be extracted (Figure 5.6). For elements present in trace amounts, long acquisition times are needed as mentioned. A corresponding map obtained with the EMP would require at least a five times longer acquisition time, which is the reason why elemental mapping for elements present in low concentrations has not been favored in XRMA. 

Pixel Maps Provide Information on the Dynamics of Tissue Activity... 

Cross sections of the 2-layer and 4-layer devices are shown in Fig. 16.9 (a) and (b), respectively. Our samples were prepared by an Electron Beam Lithography system. The exposure was carried out for 2 psec by a pixel map of 60000x60000 dots to give a total exposure area of 1.2x 1.2 mm. Next, SO nm of organic Alq3 and subsequent 20 nm of gold were deposited on the grating by a thermal evaporator with vacuum level and evaporation rate of approximately 2 10" Torr and 0.2 A/s, respectively. 

Figure 8. Predicted and observed color gradients for some field elliptical galaxies. From Menan-teau et al. (2001).Figure shows from left to right /si4-band surface brightness map, V606- 8i4 color pixel map and V606--l8i4(r) color gradient. Open circles represent observed gradients while solid lines are the model predictions obtained by means of the Martinelli et al. (1998) model.

Figure 4.1 Scheme of the technical principle of a selected mass signal (a molecular of MALDl imaging. A pulsed laser scans the species or biomarker ) is transformed into surface (e.g., a biological sample), producing a grayscale value and drawn to the according a mass spectrum for each spot. The intensity pixel map. 

Note that it is necessary to select the optimal bistability parameters of a and we consider the output SNR as a function of noise intensity given in eq. (5) such that the pixel maps (Qo,(To) and have the relationship (Ye et al., 2003) ... 

The Auger mapping was performed on a VG ESCALAB 200 using an electron gun, which allows 2000 A lateral resolution. The electron beam, of energy of lOkeV (inducing a specimen current of 20 nA), was rastered to produce 128 x 128 pixel maps, which were recorded on an IBM 486 computer. 

An experimental system was built in C. NET, and deployed on a Windows Tablet PC with 1024x768 screen resolution. The system presented a simulated map-browsing application with a visual workspace that was larger than the viewport. The workspace contained a 2600x2400-pixel map and the viewport was 800x600 pixels therefore, the map extended 900 pixels past the viewport in all directions. 

In that notation, every pixel will fall into one of fom groups AB, AB, AB, AB. We can tabulate the number of pixels in each group, and indicate on a pixel map the nature of the defect. Table 10.4 is an example of a tabulation of pixels failing and passing the QE and noise defect criteria, but of course additional columns could report other defect types and the cumulative number of defects (due to all causes). For simplicity, we assumed an array with only 200 pixels. We provide some totals to audit the software and make sure we understand the method. If we determine A, A, B, B, AB, AB, AB, and AB by direct counting, we can (and should) audit our software by checking to see that the following relationships are true ... 

After detector-fanout testing has identified detector wafers that exhibit high performance, the detectors from these qualified wafers are hybridized to readouts using HTC s indium bump bonding technology. These hybrids are then thorou y characterized in HTC s sophisticated hybrid test lab. Noise level and uniformity, response level and uniformity, and number of degraded pixels are measured. Fully automated test stations perform all measurements and an dysis and report the data in numerical, histogram, and pixel map displays. 

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