Parallel scan

A device providing both serial and parallel scan coverage of a scene is disclosed in GB-A-2207801. 

A device employing a parallel scan mode is also disclosed. An n-type semiconductor body 33 of Hgo.79Cdo.21Te is provided with biasing electrodes 35 and 36. Read-out electrodes 38 connect to p-type regions and form a series of read-out electrodes arranged in two parallel rows. 

Spectrex PC 50 Partascope vicw ei consists of a small, battery-operated "Black Box" which internally generates two parallel, scanning laser beams. Samples of water, oil or other liquid are introduced by beaker or bottle. Through Fraunhofer diffraction, particles in suspension, as small as 1 pm diameter, are made visible directly to the human eye. The two laser beams permit comparison of a sample with standards, or of pre- and post-filter samples. 

Fig. 15.3. Medium current beamline showing an electric scanner and electrostatic parallelizing lens. The ion source, analyzer magnet, and resolving aperture serve to inject the unscanned beam from the left. The parallel scanned beam on the right is passed through a postacceleration column and an electrostatic deflector before reaching the wafer...

Tsukakoshi, O., Niikura, K., Nishihashi, T., Mihara, Y., Sakurada, Y. Ion Optics of Parallel Scan Implanter Using Two Octupole Deflectors, Proceedings of the 11th International Conference on Ion Implantation Technology, 342 (1996)... 

In [8], a cost-effective testing methodology, referred to as parallel scan-like test, has been proposed for fault detection of catastrophic faults for droplet-based microfluidic devices. The... 

To solve the above problem, a microfluidic compactor is proposed to compress multiple test-outcome droplets into one test-outcome droplet, which can be easily read and detected by a simple detector composed of a photodiode and LED [10]. The microfluidic compactor consists of a tree of microfluidic 2-input AND gates. The input ports of the AND gates in the first layer are connected one by one to the pseudo-sinks of the parallel scan-like row/column test, while the output ports of these AND gates are coimected one by one to the input ports of AND gates in the... 

Figure 15 illustrates the schematic of the microfluidic compactor for parallel scan-like test of odd rows/columns in a 16 x 16 microfluidic array. The electrodes represent the last row/column where the pseudo-sinks are located. The compactor consists of three layers of microfluidic 2-input AND gates. The output of the AND gate in the third layer is connected to the photodiode detector located in the sink reservoir of the microfluidic array. 

In Fig. 15a, after the parallel scan-like test for odd rows/columns, each of the odd pseudo-sinks has one lx droplet on it, indicating that there is no defect in any odd rows/columns. The arrows show the direction of droplet routing through the AND gates. The number at each arrow... 

Mkrofluidk Logic Gates, Fig. 17 Parallel scan-like test procedure with reconfiguration of microlluidic compactor... 

Stq> 3. Row Tesk Repeat parallel scan-like test for bmh the odd and even rows to detect defects. The microfluidic compactor is reconfigured with one row shift during the two iterations. 

For the parallel scan-like test for even rows/ columns of 16 X 16 microfluidic array, the microfluidic compactor is simply reconfigured by shifting it one column. The complete parallel scan-like test procedure with microfluidic compactor reconfiguration is shown in Fig. 17. 

For parallel scan-like test without a compactor, an N x N microfluidic array needs N clock cycles to route all test-outcome droplets consecutively to the sink node connected with the... 

For parallel scan-like test with a compactor, 3 X (log2N - 1) clock cycles are needed to compress the test-outcome droplets to one droplet. The detection of the droplet at the compactor output takes 30 s using the photodiode detector [10]. This duration is comparable to the compaction time therefore it must be taken into account when calculating the total time-cost for result evaluation. The comparison of the result-evaluation time for the two methods, assuming a typical clock frequency of 1 Hz, is shown in Fig. 18. 

Microfluidic Logic Gates, Fig. 19 Area overhead of microfluidic compactor for parallel scan-like test... 

Xu T, Chakrabarty K (2007) Parallel scan-like test and multiple-defect diagnosis for digital microfiuidic biochips. IEEE Trans Biomed Cite Syst 1 148-158... 

Fig. 6.1a c. Different approaches to image scanning with an array of detectors, (a) Parallel scan with a linear array, (b) Serial scan with a linear array using time delay and integration (TDl). (c) Se-ries/parallel scan with a two-dimensional array using TDl... 

There exists a wide variety of approaches to the use of charge transfer devices in infrared focal planes. We shall discuss five high packing density, high quantum efficiency, approaches appropriate for series-parallel scan 1) IR sensitive CCD, 2) ctirect injection hybrid, 3) direct injection extrinsic silicon, 4) accumulation mode extrinsic silicon, and 5) infrared sensitive CID with silicon CCD signal processing. The reader is referred to a review article by Steckl et al. for a comprehensive discussion of a number of other approaches not discussed here which include indirect injection pyroelectric detectors and Schottky barrier photoemissive injection [6.1]. Three approaches in our list of five do not require... 

Fig. 6.5. Modulation transfer function (MTF) as a function of Ne where N is the total number of elementary transfers and E is the transfer inefficiency per elementary transfer. The curves are drawn for different spatial frequencies [/ is the Nyquist frequency (JJ2) ] and different array con-iigurations. The solid curves are for a staring array and the dashed curves for an array which uses series-parallel scan with TDl...

With mechanical scanning of the image across the focal plane, the detectors will experience a time varying signal due to structure in the image. The maximum signal frequency of interest for a TDI series-parallel scan system will be the same as for a parallel scan focal plane if both use the same number of interlace steps and do not segment the focal plane. For l/30s frame times and TV compatible... 

SERIES PARALLEL SCAN InSb CID FOCAL PLANE ARRAY... 

Fig. 6.14. Series-parallel scan IR CID. Infrared sensitive IR CID modules are completely read out more than once a dwell time through a preamplifier into a silicon CCD signal processor. In the signal processor TDI is performed and then th% individual lines of imagery are ac coupled and multiplexed. Only the CID module itself is fabricated from IR sensitive material...

One implementation of the series-parallel scanned CID is shown in Fig. 6.14. In this case one preamplifier is used per CID chip. The CID xy readout is used in... 

Fig. 6.17. Series-parallel scan IR CID with one preamplifier per column. All the columns are read out simultaneously. This lowers the readout speed and avoids the column select switches shown in Fig. 6.13...

If correlated double sampling is not used, besides background noise the most important source of noise for the series-parallel scan CID is likely to be kTC noise. If this is the case then the maximum signal frequency for which we can design the device to obtain BLIP operation will be... 

Series/Parallel Scan with time delay and integration remains the principal approach to advanced thermal imaging systems. However, for applications where only a small number of resolution elements are needed, two-dimensional staring detector arrays with CCD or CID readout are being considered [8.106]. This does away with the scanner and a focal optics used with conventional systems. However, to compensate for nonuniformities, both dc offset and gain correction must be made on a pixel by pixel basis. Detector responsivity and readout nonlinearities will increase the number of computations needed for sufficient correction and only experience with the stability of different types of arrays will determine how often the correction algorithms must be calibrated [8.107,108]. 

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