Nail test

See Vol 1 under Esop s Test, p XI Grotta s Test, p XV and Nail Test, p XIX. Some tests are described in this Volume under DETONATORS, etc... 

Determination of Heat Liberated on Explosion with Calorimeter (99-104) Lead Block Expansion Test (Trauzl Test) (104-06) Compression Tests with Small Lead Blocks (106-08) Testing of Detonators, which include Sand Test and Nail Test (108-14) Water Resistance of Electric Detonators (114-15) Testing Burning (Safety) Fuse (115-18) Testing Detonating Fuse (118-19)... 

Sand Test (Essai au sable) (69) Nail Test (Essai au clou) (69) Tests for Electric Detonators (69-70) Tests for Fuses (Essais des meches) (70) Tests for Detonating Cords (Essais des cordeaux detonants)... 

Davis, Vol 2 (1943) Sensitivity of NG (p 209) Stability Tests for NC, which include Kl-Starch Test at 65.5°, Methyl Violet Test at 134.5°C, Bergmann-Junk and Vacuum Tests (267-69) Testing of Detonators by Nail Test and by US Bureau of Mines Sand Test (421-24)... 

H. Kast (104-07) Determination of Sensitivity to Friction (Medicion de la sensibili-dad al rozamiento) (107) Determination of Sensitivity to Initiation by Detonation (110-12) Determination of Sensitivity to Initiation by Influence (112-13) Determination of Power of Explosives using Trauzl Test (113-17), Small Lead Block Test (117), Quinan Apparatus (118), Guttmann Apparatus (118-19), Ballistic Pendulum (119-20), Mortar (Mortero probeta) (120-21) Determination of Efficiency of Initiating Devices by Lead Plate Test (121-23), Nail Test (123), Sand Test (124) and Acoustic Tests (124) Determination of Characteristics of Flames Produced on Explosion (125-29)... 

Bruceton, Pa , USBurMines, Bulletin 346, GovtPtgOff, Washington, DC(1931), pp 108-15 (Testing Detonators and Electric Detonators by Sand Test and Nail Test) ... 

Fordham (1966), pp 113-14 (Description of Esop s, lead plate and nail tests used for plain detonators. The first two tests measure only the end blow of detonators, while the 3rd test can give a rough indication of its side blow. These tests are more fully described in Vol 1 of Encycl, listed here as Ref 30)... 

Nail Test(Essai au clou, in Fr) (Nadel Probe, in Ger) (Ptueba de la puntilla, in Span). A simple, cheap, and accurate test to determine the relative efficiency of detonators and one suitable for use in the field is called the noil test. In this test a wire nail is fastened to the side of s detonator suspended horizontally in the air and the detonator is fired. The angle to which the nail is bent in mensured to the nearest 0.2 ° nnd the nve age of five tests is the computed result. Fou inch wire finishing nails of approximately the same length, gage and weight are used in the test. Refs 1)US BurMinesBnll 59, (I913),2S 2)US BurMinesBull 346,... 

FIGURE 18.7 Typical nail penetration behavior of a Li-ion cell with shutdown separator, (a) Schematic of a typical nai I test (b) voltage and temperature responses of a cell passing the nail test (c) voltage and temperature responses of a cell that failed the nail test. (For color version of this figure, the reader is referred to the online version of this book.)... 

The initial temperature rise was lower for the nail test (137.5 °C) compared to the controlled anode-alnmimim short test (251.4 °C) for the same SOC condition. This is due to multiple-layer short and multiple kinds of short (including the anode-aluminum) that would have occurred during nail penetration. Based on infrared scanning for the entire cell [22], it was estimated that about 45% of the cell area showed 80 °C or above within 2 s of controlled anode-aluminum internal short while for the nail penetration test, it was only 15%. Chances of thermal runaway are more for a single-layer anode-aluminmn internal short than compared to a multilayer short incurred due to nail penetration. Anode-cathode short was foimd out to be much safer compared to anode-aluminum short as the cell showed a maximum temperature of 71 °C even after 30 s of continuous hard shorting. 

Lower cost manufacturing can be achieved with low residue fluxes if the cleaning step can be eliminated. This assumes that the incoming components and boards are clean, and that operators handling the boards are careful not to introduce contamination. This requires a flux with noncorrosive residues that will not impede or contaminate the electrical bed-of-nails test probes. 

FIGURE 46.5 ICT probe noncontact (a) If there is flux on a test pad, it will harden after soldering and may prevent the test probe from making electrical contact to the test pad. The test result may be interpreted as an open circuit, (b) As the board is fluxed in preparation for the wave solder process, the liquid flux may be drawn by capillary action between the wave solder pallet and the PWB. When this occurs, the in-circuit test pad (the target for bed-of-nails testing) may become fouled with solder flux. The flux residue inhibits probe contact. 

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