Mass spectrometry materials

Maximum residue limit Mass spectrometry Tandem mass spectrometry Material safety data sheet North American Free Trade Act N-Hydroxysuccinimide Nitrogen-phosphorus detection Neomycin phosphotransferase II Optical density Office of Plant Protection and Quarantine... 

Chu, E, Odom, R., Reich, D. (1996) Analysis of surface particles by time-of-flight secondary ion mass spectrometry. Materials Chemistry and Physics, 43, 87-94. 

Ions are also used to initiate secondary ion mass spectrometry (SIMS) [ ], as described in section BI.25.3. In SIMS, the ions sputtered from the surface are measured with a mass spectrometer. SIMS provides an accurate measure of the surface composition with extremely good sensitivity. SIMS can be collected in the static mode in which the surface is only minimally disrupted, or in the dynamic mode in which material is removed so that the composition can be detemiined as a fiinction of depth below the surface. SIMS has also been used along with a shadow and blocking cone analysis as a probe of surface structure [70]. 

Secondary ion mass spectrometry (SIMS) is by far the most sensitive surface teclmique, but also the most difficult one to quantify. SIMS is very popular in materials research for making concentration depth profiles and chemical maps of the surface. For a more extensive treatment of SIMS the reader is referred to [3] and [14. 15 and 16]. The principle of SIMS is conceptually simple When a surface is exposed to a beam of ions... 

Particularly in mass spectrometry, where discharges are used to enhance or produce ions from sample materials, mostly coronas, plasmas, and arcs are used. The gas pressure is normally atmospheric, and the electrodes are arranged to give nonuniform electric fields. Usually, coronas and plasmas are struck between electrodes that are not of similar shapes, complicating any description of the discharge because the resulting electric-field gradients are not uniform between the electrodes. 

This example can be used in reverse to show the usefulness of looking for such isotopes. Suppose there were an unknown sample that had two molecular ion peaks in the ratio of 3 1 that were two mass units apart then it could reasonably be deduced that it was highly likely the unknown contained chlorine. In this case, the isotope ratio has been used to identify a chlorine-containing compound. This use of mass spectrometry is widespread in general analysis of materials, and it... 

The deterrnination of hydrogen content of an organic compound consists of complete combustion of a known quantity of the material to produce water and carbon dioxide, and deterrnination of the amount of water. The amount of hydrogen present in the initial material is calculated from the amount of water produced. This technique can be performed on macro (0.1—0.2 g), micro (2—10 mg), or submicro (0.02—0.2 mg) scale. Micro deterrninations are the most common. There are many variations of the method of combustion and deterrnination of water (221,222). The oldest and probably most reUable technique for water deterrnination is a gravimetric one where the water is absorbed onto a desiccant, such as magnesium perchlorate. In the macro technique, which is the most accurate, hydrogen content of a compound can be routinely deterrnined to within 0.02%. Instmmental methods, such as gas chromatography (qv) (223) and mass spectrometry (qv) (224), can also be used to determine water of combustion. 

The main advantages of the ms/ms systems are related to the sensitivity and selectivity they provide. Two mass analyzers in tandem significantly enhance selectivity. Thus samples in very complex matrices can be characterized quickly with Htde or no sample clean-up. Direct introduction of samples such as coca leaves or urine into an ms or even a gc/lc/ms system requires a clean-up step that is not needed in tandem mass spectrometry (28,29). Adding the sensitivity of the electron multiplier to this type of selectivity makes ms/ms a powerhil analytical tool, indeed. It should be noted that introduction of very complex materials increases the frequency of ion source cleaning compared to single-stage instmments where sample clean-up is done first. 

The appHcation of modem methods of analyses such as gc, low ionization voltage mass spectrometry, high pressure Hquid chromatography (hplc), and nmr has greatly increased knowledge of coal-tar composition without materially altering the quaHtative picture. 

Laser based mass spectrometric methods, such as laser ionization (LIMS) and laser ablation in combination with inductively coupled plasma mass spectrometry (LA-ICP-MS) are powerful analytical techniques for survey analysis of solid substances. To realize the analytical performances methods for the direct trace analysis of synthetic and natural crystals modification of a traditional analytical technique was necessary and suitable standard reference materials (SRM) were required. Recent developments allowed extending the range of analytical applications of LIMS and LA-ICP-MS will be presented and discussed. For example ... 

In Laser Ionization Mass Spectrometry (LIMS, also LAMMA, LAMMS, and LIMA), a vacuum-compatible solid sample is irradiated with short pulses ("10 ns) of ultraviolet laser light. The laser pulse vaporizes a microvolume of material, and a fraction of the vaporized species are ionized and accelerated into a time-of-flight mass spectrometer which measures the signal intensity of the mass-separated ions. The instrument acquires a complete mass spectrum, typically covering the range 0— 250 atomic mass units (amu), with each laser pulse. A survey analysis of the material is performed in this way. The relative intensities of the signals can be converted to concentrations with the use of appropriate standards, and quantitative or semi-quantitative analyses are possible with the use of such standards. 

Spark Source Mass Spectrometry (SSMS) is a method of trace level analysis—less than 1 part per million atomic (ppma)—in which a solid material, in the form of two conducting electrodes, is vaporized and ionized by a high-voltage radio frequency spark in vacuum. The ions produced from the sample electrodes are accelerated into a mass spectrometer, separated according to their mass-to-charge ratio, and collected for qualitative identification and quantitative analysis. 

The analytical techniques covered in this chapter are typically used to measure trace-level elemental or molecular contaminants or dopants on surfaces, in thin films or bulk materials, or at interfaces. Several are also capable of providing quantitative measurements of major and minor components, though other analytical techniques, such as XRF, RBS, and EPMA, are more commonly used because of their better accuracy and reproducibility. Eight of the analytical techniques covered in this chapter use mass spectrometry to detect the trace-level components, while the ninth uses optical emission. All the techniques are destructive, involving the removal of some material from the sample, but many different methods are employed to remove material and introduce it into the analyzer. 

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