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Leitz microscope

In the more modern fluorescence microscopes the primary filter has been replaced by a system of mirrors (the Ploem illuminator in the Leitz microscope) which serves a similar function. [Pg.148]

UV microscopes are supplied mainly by two optical companies, Zeiss and Leitz, in the Federal Republic of Germany. The major difference between the Zeiss and the Leitz instruments lies in their optical systems. The Leitz microscope uses quartz refleeting objectives, while Zeiss uses quartz refractive objectives. Both objectives are achromatic for a wide portion of the UV and visible light range, with no shift in focus accompanying the change of wave-... [Pg.111]

Silny (1987) has carried out very detailed contact angle measurements of cryolite melts on graphite and the measurement of surface tension using the sessile drop method. He used the Leitz microscope for photographing the sessile drop and used a sophisticated computerized approach to calculate the contact angle and the surface tension from the shape of the drop. However, the results showed a dispersion of approximately 20%. [Pg.306]

Fluorescence microscope observations of RBC suspensions were performed using an epifluorescence Ortholux II Leitz microscope (x 1250 magnification) equipped with an excitation filter (340-380nm), a dichromatic mirror Leitz RKP400, an emission filter Leitz LP430 and an Orthomat Leitz camera. [Pg.163]

Microscopic examinations of the various samples were performed on a Leitz reflected light microscope. The samples were embedded in Lucite plastic and polished according to ASTM specifications. Micrographs were taken at a magnification of 600 using partial crossed nicols. [Pg.97]

The observations are performed with a Leitz Ortholux polarizing microscope equipped with the ftOpak illuminator, lamps for reflected and transmitted light, immersion objectives, and verniers. Characteristics of the polished thin sections and of the nuclear emulsion plates are observed in transmitted light with the same immersion optics after removing the Berek prism. [Pg.124]

Maceral analyses—i.e., coal constituent analyses—were made on polished pellets of the coal samples from 9, 7, and 6 feet from the sill contact. A Leitz Ortholux microscope at approximately 750X magnification was used. At a distance of less than 6 feet from the sill contact it was impossible to distinguish any specific macerals in the coal samples. At 6 feet it was possible to distinguish the macerals, and a ratio of reactives to inerts of 20 80% was found. At 9 feet there was an approximate ratio of 70 30% of reactives to inerts. The bulk of the increase is caused by carbonization of other macerals. [Pg.704]

Reflectance readings of the polished pellets were made on all fractions across the xenolith, utilizing a Leitz Ortholux microscope and a Photovolt photometer. Figure 12 shows the mean reflectance values of each fraction plotted vs. the distance across the xenolith. These values generally decrease toward the center of the xenolith as the distance from the sill increases. The mean reflectance values range from 5.7 to 8.1%. [Pg.715]

A. Szymariski (1972) tested the hardness of porcelain bodies sintered at various temperatures, in the 1475-1713 K range, and demonstrated the existence of a correlation between the mean Mackensen-Mohs hardness and the degree of porosity of a body, determined on polished sections with an Opton analysing microscope, and also the sintering contraction due to sintering determined using the Leitz-Wetzlar heating-microscope (Fig. 8.3). The above tests were carried out on porcelain body samples collected... [Pg.296]

A Leitz Ortholux microscope was used to determine the maceral content of Rasa coal. The microscope was fitted with an oil- immersion 60X fluoride objective and 10X high eyepoint oculars to give an effective magnification of 720 diameters. A point count system of analysis was used for the maceral determination. [Pg.267]

The mean maximum reflectance of vitrinite was determined in oil (ca. 1.517 index of refraction) and in 546-nm wavelength green light. A photomultiplier photometer was used to measure vitrinite reflectance. Two glass standards were used to calibrate the equipment. A Leitz MPV2 microscope photometer was used. The reflectance values were determined as designated in ASTM D2798-85 (2 5). Twenty-five vitrinite reflectance values were determined for the Rasa coal. [Pg.268]

D. Microscopic optical arrangement centered around the Leitz-Diavert inverted microscope... [Pg.270]

Zeiss and many other phase contrast microscopes produce the equivalent of a central stop dispersion stain by using a phase 2 16X phase contrast objective with the phase 3 condenser ring in place. Leitz manufactures a phase contrast microscope which produces central stop dispersion colors at 400X by using the number 5 condenser ring position. If the microscopes in use at other labs do not produce a central stop dispersion stain in this way, a "dispersion stainer" is available (36). The color resolution (not the particle resolution) of a McCrone dispersion stainer is a little better than that obtained from mismatching phase rings. [Pg.26]

Fig. 4.2.S. A Leitz UV microscope used by the Goring and associates (PAPRICAN)... Fig. 4.2.S. A Leitz UV microscope used by the Goring and associates (PAPRICAN)...
The Leitz UVM microscope photometer system comes also with the PLUG computer program for single value measurements, and the SPECTRA program for spectral measurements. However, the latest Leitz MPV 3 system is not designed for UV light and its use as a UV microscope photometer requires special accessories. [Pg.119]

A Leitz Ortholux microscope was used for the optical micrographs. Electron micrographs were obtained by conventional techniques using an International Scientific Instrument Co. minielectron microscope. Crystallinities were determined calorimetrically from the ratio of the heats of fusion of the semicrystalline samples measured (17) experimentally on a Perkin Elmer DSC-1B to the heat of fusion for 100% crystalline HMS of 32 cal/g reported by O Malley (9, 16). Wide and small angle x-ray diffraction were obtained using a G.E. XRD-5 x-ray diffractometer. [Pg.118]

Polarized light microscopy studies were done on a Leitz Ortholux metallographic microscope. All observations were by transmitted 3200°K unfiltered light. Scanning electron microscopy studies were done on a Cambridge Stereoscan microscope. [Pg.297]


See other pages where Leitz microscope is mentioned: [Pg.56]    [Pg.242]    [Pg.56]    [Pg.242]    [Pg.395]    [Pg.286]    [Pg.286]    [Pg.327]    [Pg.157]    [Pg.294]    [Pg.299]    [Pg.543]    [Pg.704]    [Pg.44]    [Pg.502]    [Pg.527]    [Pg.224]    [Pg.240]    [Pg.7]    [Pg.42]    [Pg.264]    [Pg.265]    [Pg.266]    [Pg.245]    [Pg.578]    [Pg.291]    [Pg.110]    [Pg.116]    [Pg.252]    [Pg.70]    [Pg.73]   
See also in sourсe #XX -- [ Pg.111 , Pg.117 ]

See also in sourсe #XX -- [ Pg.111 , Pg.117 ]




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