Scanning Kelvin probe microscopy SKPM

A further spatially resolved method, also based on work function contrast, is scanning Kelvin probe microscopy (SKPM). As an extended version of atomic force microscopy (AFM), additional information on the local surface potential is revealed by a second feedback circuit. The method delivers information depending on the value (p (p(x) + A x). Here, A(zS(x) is the difference in work function between the sample and the AFM tip and cp(x) is the local electric potential [12]. (p x) itself gives information on additional surface charges due to... 

FIGURE 2.3.12 (a) Schematic diagram of experimental setup for scanning Kelvin probe microscopy (SKPM). (b) Profiles of an L = 5.5 J,m P3HT transistor with Cr electrodes taken at three different temperatures V = 0 V, = -8 V). The inset shows a profile obtained after switching the source and drain contacts on the same TFT with both Cr and Cr-Au contacts Vg = 0 V, = -8 V). (From Burgi, L. et ah, J. Appl. Phys., 94, 6129-6137, 2003. Reprinted with permission. Copyright 2003, American Institute of Physics.)... 

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