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Mass spectrometry ion sources

Advances in TIMS-techniques and the introduction of multiple collector-ICP-MS (MC-ICP-MS) techniques have enabled the research on natural variations of a wide range of transition and heavy metal systems for the first time, which so far could not have been measured with the necessary precision. The advent of MC-ICP-MS has improved the precision on isotope measurements to about 40 ppm on elements such as Zn, Cu, Fe, Cr, Mo, and Tl. The technique combines the strength of the ICP technique (high ionization efficiency for nearly all elements) with the high precision of thermal ion source mass spectrometry equipped with an array of Faraday collectors. The uptake of elements from solution and ionization in a plasma allows correction for instrument-dependent mass fractionations by addition of external spikes or the comparison of standards with samples under identical operating conditions. All MC-ICP-MS instruments need Ar as the plasma support gas, in a similar manner to that commonly used in conventional ICP-MS. Mass interferences are thus an inherent feature of this technique, which may be circumvented by using desolvating nebulisers. [Pg.33]

Keywords Aerodynamic effects Charged droplets Cone jet Droplet evaporation Droplet deformation Electrohydrodynamic spray Electrospray Ion source Mass spectrometry Mass spectroscopy Rayleigh charge limit Spray modes Taylor cone... [Pg.727]

Spark Source Mass Spectrometry (SSMS) is a method of trace level analysis—less than 1 part per million atomic (ppma)—in which a solid material, in the form of two conducting electrodes, is vaporized and ionized by a high-voltage radio frequency spark in vacuum. The ions produced from the sample electrodes are accelerated into a mass spectrometer, separated according to their mass-to-charge ratio, and collected for qualitative identification and quantitative analysis. [Pg.45]

Reactions of Thermal Energy Ions by Pulsed Source Mass Spectrometry... [Pg.156]

Neutron Activation Analysis X-Ray Fluorescence Particle-Induced X-Ray Emission Particle-Induced Nuclear Reaction Analysis Rutherford Backscattering Spectrometry Spark Source Mass Spectrometry Glow Discharge Mass Spectrometry Electron Microprobe Analysis Laser Microprobe Analysis Secondary Ion Mass Analysis Micro-PIXE... [Pg.128]

HPLC (in both NP and RP modes) is quite suitable for speciation by coupling to FAAS, ETAAS, ICP-MS and MIP-MS [571,572]. Coupling of plasma source mass spectrometry with chromatographic techniques offers selective detection with excellent sensitivity. For HPLC-ICP-MS detection limits are in the sub-ng to pg range [36]. Metal ion determination and speciation by LC have been reviewed [573,574] with particular regard to ion chromatography [575]. [Pg.243]

Applications Real applications of spark-source MS started on an empirical basis before fundamental insights were available. SSMS is now considered obsolete in many areas, but various unique applications for a variety of biological substances and metals are reported. Usually, each application requires specific sample preparation, sparking procedure and ion detection. SSMS is now used only in a few laboratories worldwide. Spark-source mass spectrometry is still attractive for certain applications (e.g. in the microelectronics industry). This is especially so when a multi-element survey analysis is required, for which the accuracy of the technique is sufficient (generally 15-30% with calibration or within an order of magnitude without). SSMS is considered to be a... [Pg.651]

Table 8.60 shows the main features of GD-MS. Whereas d.c.-GD-MS is commercial, r.f.-GD-MS lacks commercial instruments, which limits spreading. Glow discharge is much more reliable than spark-source mass spectrometry. GD-MS is particularly valuable for studies of alloys and semiconductors [371], Detection limits at the ppb level have been reported for GD-MS [372], as compared to typical values of 10 ppm for GD-AES. The quantitative performance of GD-MS is uncertain. It appears that 5 % quantitative results are possible, assuming suitable standards are available for direct comparison of ion currents [373], Sources of error that may contribute to quantitative uncertainty include sample inhomogeneity, spectral interferences, matrix differences and changes in discharge conditions. [Pg.651]

Table 5.6 compares the ICP-AES results with data generated for the same sample by two other independent methods - isotope dilution spark source mass spectrometry (IDSSMS), and graphite furnace atomic absorption spectrometry (GFAAS). The IDSSMS method also uses 25-fold preconcentration of the metals and matrix separation using the ion exchange procedure, following isotope... [Pg.258]

Precision expressed as standard deviation Pre-concentrated 100-fold by Chelex 100 ion exchange Spark source mass spectrometry, internal standard method From [736]... [Pg.260]

A logical approach which serves to minimise such uncertainties is the use of a number of distinctly different analytical methods for the determination of each analyte wherein none of the methods would be expected to suffer identical interferences. In this manner, any correspondence observed between the results of different methods implies that a reliable estimate of the true value for the analyte concentration in the sample has been obtained. To this end Sturgeon et al. [21] carried out the analysis of coastal seawater for the above elements using isotope dilution spark source mass spectrometry. GFA-AS, and ICP-ES following trace metal separation-preconcentration (using ion exchange and chelation-solvent extraction), and direct analysis by GFA-AS. These workers discuss analytical advantages inherent in such an approach. [Pg.335]

More importantly, however, the ICP source has been applied to provide a source of ions for mass spectrometry ( vide infra). [Pg.302]

The first part of this book is dedicated to a discussion of mass spectrometry (MS) instrumentation. We start with a list of basic definitions and explanations (Chapter 1). Chapter 2 is devoted to the mass spectrometer and its building blocks. In this chapter we describe in relative detail the most common ion sources, mass analyzers, and detectors. Some of the techniques are not extensively used today, but they are often cited in the MS literature, and are important contributions to the history of MS instrumentation. In Chapter 3 we describe both different fragmentation methods and several typical tandem MS analyzer configurations. Chapter 4 is somewhat of an outsider. Separation methods is certainly too vast a topic to do full justice in less than twenty pages. However, some separation methods are used in such close alliance with MS that the two techniques are always referred to as one combined analytical tool, for example, GC-MS and LC-MS. In effect, it is almost impossible to study the MS literature without coming across at least one separation method. Our main goal with Chapter 4 is, therefore, to facilitate an introduction to the MS literature for the reader by providing a short summary of the basic principles of some of the most common separation methods that have been used in conjunction with mass spectrometry. [Pg.3]

Date AR, Ying Y, Stuart ME (1987) The influence of polyatomic ion interferences in analysis by inductively coupled plasma source mass spectrometry (ICP-MS). Spectrochim Acta 42B 3-20... [Pg.147]

In recent years solid source mass-spectrometry has provided an effective means for B-isotope analysis. Two different methods have been developed, which have been summarized by Swihart (1996). The first was a positive thermal ionization technique using NaiBOj ions initially developed by McMullen et al. (1961). Subsequently, Spivack and Edmond (1986) modified this technique by using CS2BO2... [Pg.45]

S. Gas source mass spectrometry (GSMS) with electron impact (El) ion source produces nearly mono-energetic ions (similar to TIMS) and is an excellent tool for the high precision isotope analysis of light elements such as H, C, N and O, but also for S or Si.7,100,101 Precise and accurate measurements of isotope ratios have been carried out by gas source mass spectrometers with multiple ion collectors by a sample/standard comparison and the 8 values of isotope ratios were determined (see Equation 8.4). Electron impact ionization combined with mass spectrometry has been applied for elements which readily form gaseous compounds (e.g., C02 or S02) for the isotope analysis of carbon and sulfur, respectively). [Pg.232]

Carbide cluster ions (MC + - M = matrix element) have been measured by investigating them directly from the solid carbides (B4C,46 SiC) or by analyzing metal oxide/graphite mixtures (for M = rare earth element,3 Si,46 Th or U36). Figure 9.60 shows the distribution of silicon carbide cluster ions (SiC +) in laser ionization mass spectrometry by the direct analysis of compact SiC in comparison to the carbide cluster ion distribution of LaC + and SrC + in spark source mass spectrometry, by investigating a metal oxide/graphite mixture. [Pg.448]

S. D. Tanner, Ion optics for ICP-MS modelling intuition or blind luck, in Plasma Source Mass Spectrometry Development and Applications, ed. G. Holland and S. D. Tanner, Royal Society of Chemistry, Cambridge, 1997, pp. 13. [Pg.48]

Spark Source Mass Spectrometry. Another method for trace analysis probably should be mentioned and that is spark source mass spectrometry. In this technique, the sample in the form of a solid serves as an electrode and vapors, formed by sparking, are atomized and ionized to metal ions which are separated by a mass spectrometer and measured. The equipment is expensive and good results require the attention of a skilled operator. Even under the best conditions order of magnitude agreement of results is about the best that can be achieved. [Pg.377]


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Source spectrometry

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