Instrumentation, scanning electron

Auger specimens 10 x 2 x 1 mm were heat-treated and then notched to control the location of fracture. Two of these notched samples at a time were loaded into specimen grips such that they could be broken independently under UHV and then examined by a SAM instrument. Scanning electron micrographs allowed different grain boundaries and transgranular cleavage areas to be selected for analysis. 

Nitrogen sorption measurements were performed on a Quantachrome Autosorb 6B (Quantachrome Corporation, Boynton Beach, FL, USA). All samples were degassed at 423 K before measurement for at least 12 hours at 1 O 5 Pa. Mercury-porosimetrie has been measured on a Porosimeter 2000 (Carlo Erba Instruments) Scanning electron micrographs were recorded using a Zeiss DSM 962 (Zeiss, Oberkochen, Germany). The samples were deposited on a sample holder with an adhesive carbon foil and sputtered with gold. 

Armstrong, J.T., Methods of quantitative analysis of individual microparticles with electron beam instruments, Scanning Electron Microscopy/1978, 1, 455, 1978. 

Instrumentation Scanning electron microscopy. X-ray diffraction, Raman spectroscopy... 

For the purpose of a detailed materials characterization, the optical microscope has been supplanted by two more potent instruments the Transmission Electron Microscope (TEM) and the Scanning Electron Microscope (SEM). Because of its reasonable cost and the wide range of information that it provides in a timely manner, the SEM often replaces the optical microscope as the preferred starting tool for materials studies. 

In electron-optical instruments, e.g. the scanning electron microscope (SEM), the electron-probe microanalyzer (EPMA), and the transmission electron microscope there is always a wealth of signals, caused by the interaction between the primary electrons and the target, which can be used for materials characterization via imaging, diffraction, and chemical analysis. The different interaction processes for an electron-transparent crystalline specimen inside a TEM are sketched in Eig. 2.31. 

Run-of-the-mill instruments can achieve a resolution of 5-10 nm, while the best reach 1 nm. The remarkable depth of focus derives from the fact that a very small numerical aperture is used, and yet this feature does not spoil the resolution, which is not limited by dilfraction as it is in an optical microscope but rather by various forms of aberration. Scanning electron microscopes can undertake compositional analysis (but with much less accuracy than the instruments treated in the next section) and there is also a way of arranging image formation that allows atomic-number contrast, so that elements of different atomic number show up in various degrees of brightness on the image of a polished surface. 

Replication avoids the problem of sample deterioration in the instrument, but it is destructive in that reaction of the material cannot be continued after the replica has been prepared. Transitory features cannot be detected unless a series of preparations are examined corresponding to increasing progress of the reaction considered. The textures of replicas have been shown [220] to be in satisfactory agreement with those of the original surface as viewed in the scanning electron microscope. The uses and interpretations of observations made through sample replication procedures are illustrated in the studies of decomposition of metal carboxyl-ates by Brown and co-workers [97,221—223]. 

Scanning Electron Microscopy images of powders used in this paper were taken using JEOL s JSM-6320F instrument at the Illinois Institute of Technology and at Drexel University, Philadelphia, PA, USA. 

Instrumentation, image formation, accessories, and applications of conventional scanning electron microscopy will be discussed. Information about the ESEM will also be presented. 

Typical examples of Rutherford-scattered imaging of nanoparticles of a commercially important Pd/C catalyst recorded with (a) a BSE detector in a field emission scanning electron microscope as well as (b) a STEM HAADF image of the same 5% Pd/C sample, recorded in the same instrument, are shown... 

LITs capable of scanning, axial or radial excitation of ions, and precursor ion selection for MS/MS experiments [118,134-136] have lately been incorporated in commercial mass spectrometers (Fig. 4.39). The replacement of Q3 in a QqQ instrument with a scanning LIT, for example, enhances its sensitivity and offers new modes of operation (Applied Biosystems Q-Trap). Introduction of a scanning LIT [118,135] as MSI in front of an FT-ICR instrument (Thermo Electron LTQ-FT) shields the ultrahigh vacuum of the FT-ICR from collision gas and decomposition products in order to operate under optimum conditions. In addition, the LIT accumulates and eventually mass-selects ions for the next cycle while the ICR cell is still busy with the previous ion package. 

Immunolabel samples either before or after fixation. Any size gold can be used for scanning electron microscopy. The size of the gold particles is limited by the resolution of the instrument. 

The scanning electron microscopy micrographs shown in the body of this manuscript were taken by AMR-1000 and Jeol C-35 instruments. All specimens were gold-palladium coated. To obtain the cross-section morphologies, the membranes were fragmented in liquid nitrogen. 

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