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Implant Tools

Stylet wires (Fig. 4.2) are used to stiffen leads for removal. Moreover, stylet wires can be used to debride foreign matter inside the lead body, confirm patency, and measure lead length. Stylet wires improve the effectiveness of lead removal when using either direct traction or mechanical sheaths. [Pg.59]

In fact, by stiffening the lead, stylet wires minimize the chance of lead breakage during traction and assist sheath advancement, which results in the extraction of a greater amount of intact lead. In other words, stylet wires, as do locking stylets, improve tensile strength of the leads and thus minimize the chance of lead breakage however, they do not eliminate the other complications associated with traction. [Pg.59]


The gap between laboratory wear testing and industrial appHcation trials is extremely difficult to bridge, since there is often Httie or no control over testing in the industrial environment. Despite these limitations, several examples of industrial successes involving ion implanted tools have been reported and blind tests of nitrogen-implanted machine tools have been performed, including tool taps, dies, punches, and TiN coated WC cutting inserts (106). [Pg.398]

The implanted tools showed lifetime improvements ranging from 1.5x to 4x and no unimplanted tool demonstrated better performance than an implanted tool. Improvements were also observed for implanted tool dies and punches. [Pg.398]

FIGURE 34.10 (See color insert following page 32-14.) BPB implantation tools. [Pg.550]

Implant tools typically supplied for lead implant, allowing manipulation of the lead so that the lead exits the vasculature via the implant vein. These tools include such items as standard stylets (nonlocking) and fixation-screw retraction clips. [Pg.58]

Chaimelling phenomena were studied before Rutherford backscattering was developed as a routine analytical tool. Chaimelling phenomena are also important in ion implantation, where the incident ions can be steered along the lattice planes and rows. Channelling leads to a deep penetration of the incident ions to deptlis below that found in the nonnal, near Gaussian, depth distributions characterized by non-chaimelled energetic ions. Even today, implanted chaimelled... [Pg.1838]

Although a great number of compound semiconductor devices make use of epitaxy to form the cote vertical stmcture of the device, ion implantation (qv) is a powerful tool in creating both horizontal and vertical modifications to a device. Ion implantation can be used to dope a semiconductor either fi- or / -type by using appropriate species. Implantation can also be used to render a region semi-insulating or to initiate multilayer intermixing. [Pg.381]

Another basic approach of CL analysis methods is that of the CL spectroscopy system (having no electron-beam scanning capability), which essentially consists of a high-vacuum chamber with optical ports and a port for an electron gun. Such a system is a relatively simple but powerful tool for the analysis of ion implantation-induced damage, depth distribution of defects, and interfaces in semiconductors. ... [Pg.154]

Applications Ion implantation is widely employed to improve the life of tools. Thus press tools, dies and gear cutters can be treated to increase their durability by three times or more. Nitrogen-implanted tungsten carbide drawing dies for copper and iron wire can be improved up to fivefold. By implanting chromium, aluminium or silicon a considerable increase in the corrosion resistance of steel can be obtained. Implantation of chromium into aircraft bearing alloys has improved their durability in marine environments . [Pg.444]

An important recent trend is the tendency for the two processes, CVD andPVD, to merge. For instance, CVD now makes extensive use of plasma (a physical phenomenon) and reactive PVD (evaporation or sputtering) occurs in a chemical environment. Much ofthenew equipment reflects this process integration in the concept of cluster tools which may incorporate CVD, etching, sputtering, and ion implantation in one piece of equipment. [Pg.32]

Molecular dynamics simulation (MDS) is a powerful tool for the processing mechanism study of silicon surface fabrication. When a particle impacts with a solid surface, what will happen Depending on the interaction between cluster and surface, behaviors of the cluster fall into several categories including implantation [20,21], deposition [22,23], repulsion [24], and emission [25]. Owing to limitations of computer time, the cluster that can be simulated has a diameter of only a few nanometres with a small cohesive energy, which induces the cluster to fragment after collision. [Pg.239]

In contrast to other analytical methods, ion-selective electrodes respond to an ion activity, not concentration, which makes them especially attractive for clinical applications as health disorders are usually correlated to ion activity. While most ISEs are used in vitro, the possibility to perform measurements in vivo and continuously with implanted sensors could arm a physician with a valuable diagnostic tool. In-vivo detection is still a challenge, as sensors must meet two strict requirements first, minimally perturb the in-vivo environment, which could be problematic due to injuries and inflammation often created by an implanted sensor and also due to leaching of sensing materials second, the sensor must not be susceptible to this environment, and effects of protein adsorption, cell adhesion, and extraction of lipophilic species on a sensor response must be diminished [13], Nevertheless, direct electrolyte measurements in situ in rabbit muscles and in a porcine beating heart were successfully performed with microfabricated sensor arrays [18],... [Pg.96]

Christensen, M., Calligaro, T., Consigny, S., et al. (1998). Insight into the usewear mechanism of archaeological flints by implantation of a marker ion and PIXE analysis of experimental tools. Nuclear Instruments and Methods in Physics Research B 136 869-874. [Pg.357]


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