Image projection systems, electron

Figure 44. Schematic of electron beam image projection systems (a) image formed by electrons emitted from a photocathode, and (b) image formed by an absorbing mask pattern on an electron transparent substrate.

Microelectromechanical systems (MEMS) combine the electronics of microchips with micromechanical features and microfluidics to create unique devices. The multitude of MEMS applications continues to grow including many types of accelerometers, radio frequency (RF) devices, variable capacitors, strain and pressure sensors, deformable micromirrors for image projection systems, vibrating micro-membranes for acoustic devices, ultrasound probes, micro-optical electromechanical systems (MOEMS) and MEMS gyroscopes, to name a few. 

I. Mori, K. Sugihara, C. Itoh, M. Tabata, and T. Schinozaki, An electron beam image projection system with automatic wafer handling, Microelectron. Eng. 3, 69 (1985) T.W. O Keefe, J. Vine, and R.M. Handy, An electron imaging system for the fabrication of integrated circuits, Solid... 

Electronic acetates, computerized image files for a majority of the text illustrations, will also be available free to adopters upon request. The electronic acetates will be available in a Mac/Windows (ISBN 26204). These electronic acetates can be clearly projected on large lecture hall screens using a LCD projection system. 

GORE. The CORE Electronic Chemistry Library is a joint project of Cornell University, OCLC (On-line Computer Library Center), Bell Communications Research (Bellcore), and the American Chemical Society. The CORE database will contain the full text of American Chemical Society Journals from 1980, associated information from Chemical Abstracts Service, and selected reference texts. It will provide machine-readable text that can be searched and displayed, graphical representations of equations and figures, and full-page document images. The project will examine the performance obtained by the use of a traditional printed index as compared with a hypertext system (SUPERBOOK) and a document retrieval system (Pixlook) (6,116). 

This is possible because the projection lens system, which for clarity was not shown in Figure 4.7, is normally included behind the objective lens and below the source image plane. This lens system allows the projection of both the diffraction pattern and the specimen image on the observation screen. In Figure 4.8, [50] the electron diffraction pattern of a Fe thin film is shown. In Figure 4.9, the transmission electron micrograph of the mordenite included in the sample CMT-C (see Table 4.1), where fiber-like crystals of mordenite are seen, is shown [51],... 

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