Focused-beam techniques

Elemental mass distribution - The aerosol sampled by the LPI for elemental analysis was impacted on coated mylar films affixed to 25 mm glass discs. The mylar had been coated with Apiezon L vacuum grease to prevent particle bound. The LPI samples were sent to Crocker Nuclear Laboratory for elemental analysis by PIXE using a focused alpha particle beam of 3 to 4 mm diameter. Nanogram sensitivities for most elements were achieved with the focused beam. A detailed description of the PIXE focused beam technique applied to LPI samples can be found in Ouimette (13). Based upon repeated measurements of field samples, the estimated measurement error was about 15-20% or twice the minimum detection limit, whichever was larger. 

The line-focus-beam technique with its associated analysis has been more extensively used than any other method for quantitative acoustic microscopy. 

Anisotropic materials have been extensively measured using the line-focus-beam technique. These will be discussed further in Chapter 11, but some results are summarized in Fig. 8.8 to illustrate the range of materials over... 

Electron Microprobe A.na.Iysis, Electron microprobe analysis (ema) is a technique based on x-ray fluorescence from atoms in the near-surface region of a material stimulated by a focused beam of high energy electrons (7—9,30). Essentially, this method is based on electron-induced x-ray emission as opposed to x-ray-induced x-ray emission, which forms the basis of conventional x-ray fluorescence (xrf) spectroscopy (31). The microprobe form of this x-ray fluorescence spectroscopy was first developed by Castaing in 1951 (32), and today is a mature technique. Primary beam electrons with energies of 10—30 keV are used and sample the material to a depth on the order of 1 pm. X-rays from all elements with the exception of H, He, and Li can be detected. 

Electron Probe X-Ray Microanalysis (EPMA) is a spatially resolved, quantitative elemental analysis technique based on the generation of characteristic X rays by a focused beam of energetic electrons. EPMA is used to measure the concentrations of elements (beryllium to the actinides) at levels as low as 100 parts per million (ppm) and to determine lateral distributions by mapping. The modern EPMA instrument consists of several key components ... 

As a consequence one might expect that the future needs to rely on hybrid elements which arise from advanced UV-and electron-beam lithography, from imprint techniques or automated and parallelized nanomanipulation techniques, like dip-pen lithography or focused ion-beam techniques in combination with supramolecular approaches for the assembly of molecular inorganic/organic hybrid system. Nevertheless, it is evident for any kind of chemical approach that falling back onto the present-day... 

PIXE has been compared to other focusing X-ray beam techniques [292]. Although the measurement part of PIXE and EDXRF is exactly the same, the spectra... 

Usually we talk about reactions in solution, but recently techniques have been developed to follow reactions that occur in a vacuum when a stream of reactant A and a stream of reactant B cross each other in a defined direction, as with molecular beams. From the direction in which the products are ejected and their energies, much fundamental information can be deduced about the details of the molecular processes. Lasers, which emit light-energy in a highly focused beam, are sometimes used to put energy into one of the reactants in a defined way. Such a technique reveals less about the nature of the transition state than about what is called the dynamics of the process—how molecules collide so as to react, and how the products carry away the energy of the overall reaction. The development and application of such techniques were recognized by a Nobel Prize in 1986 to Dudley Herschbach, Yuan Lee, and John Polanyi. 

Synthesis of nano-structured alloys by the inert gas evaporation technique A precursor material, either a single metal or a compound, is evaporated at low temperature, producing atom clusters through homogeneous condensation via collisions with gas atoms in the proximity of a cold collection surface. To avoid cluster coalescence, the clusters are removed from the deposition region by natural gas convection or forced gas flow. A similar technique is sputtering (ejection of atoms or clusters by an accelerated focused beam of an inert gas, see 6.9.3). 

Convergent (or focused) beam electron diffraction (CBED) is particularly attractive for determining local crystal structures and space groups in three dimensions (Steeds et al 1979, Tanaka et al 1985). In a modern TEM, CBED is now routinely available. In this technique, two principles of TEM electron diffraction are employed departure from Friedel s law and the formation of extinction bands within refiections that are forbiddden by space groups. 

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