Depth profiling intensity measurement

The reason for these results is that the intensity of the leakage field and the RMS error used depend strongly on the parameter c and the crack width, and to a lesser extent on the depth profile of the crack. Also, the distribution of the density of the leakage field is measured over the centre of the crack and correspondingly changes more by varying of dj and dj rather than of d, dj, dj and d . 

Interdiffusion of bilayered thin films also can be measured with XRD. The diffraction pattern initially consists of two peaks from the pure layers and after annealing, the diffracted intensity between these peaks grows because of interdiffusion of the layers. An analysis of this intensity yields the concentration profile, which enables a calculation of diffusion coefficients, and diffusion coefficients cm /s are readily measured. With the use of multilayered specimens, extremely small diffusion coefficients (-10 cm /s) can be measured with XRD. Alternative methods of measuring concentration profiles and diffusion coefficients include depth profiling (which suffers from artifacts), RBS (which can not resolve adjacent elements in the periodic table), and radiotracer methods (which are difficult). For XRD (except for multilayered specimens), there must be a unique relationship between composition and the d-spacings in the initial films and any solid solutions or compounds that form this permits calculation of the compo-... 

Eor analysis of emitted particles, solid state surface barrier detectors (SBD) are used inside the scattering chamber to measure the number and energy of the reaction products. Stopper foils are used to prevent scattered projectiles from reaching the detector. Depth profiles can be obtained from the energy spectra, because reaction products emitted in deeper layers have less energy than reaction products emitted from the surface. The concentration in the corresponding layer can be determined from the intensity of reaction products with a certain energy. 

In principle GD-MS is very well suited for analysis of layers, also, and all concepts developed for SNMS (Sect. 3.3) can be used to calculate the concentration-depth profile from the measured intensity-time profile by use of relative or absolute sensitivity factors [3.199]. So far, however, acceptance of this technique is hesitant compared with GD-OES. The main factors limiting wider acceptance are the greater cost of the instrument and the fact that no commercial ion source has yet been optimized for this purpose. The literature therefore contains only preliminary results from analysis of layers obtained with either modified sources of the commercial instrument [3.200, 3.201] or with homebuilt sources coupled to quadrupole [3.199], sector field [3.202], or time-of-flight instruments [3.203]. To summarize, the future success of GD-MS in this field of application strongly depends on the availability of commercial sources with adequate depth resolution comparable with that of GD-OES. 

Because of the complex nature of the discharge conditions, GD-OES is a comparative analytical method and standard reference materials must be used to establish a unique relationship between the measured line intensities and the elemental concentration. In quantitative bulk analysis, which has been developed to very high standards, calibration is performed with a set of calibration samples of composition similar to the unknown samples. Normally, a major element is used as reference and the internal standard method is applied. This approach is not generally applicable in depth-profile analysis, because the different layers encountered in a depth profile of ten comprise widely different types of material which means that a common reference element is not available. 

The potential of LA-based techniques for depth profiling of coated and multilayer samples have been exemplified in recent publications. The depth profiling of the zinc-coated steels by LIBS has been demonstrated [4.242]. An XeCl excimer laser with 28 ns pulse duration and variable pulse energy was used for ablation. The emission of the laser plume was monitored by use of a Czerny-Turner grating spectrometer with a CCD two-dimensional detector. The dependence of the intensities of the Zn and Fe lines on the number of laser shots applied to the same spot was measured and the depth profile of Zn coating was constructed by using the estimated ablation rate per laser shot. To obtain the true Zn-Fe profile the measured intensities of both analytes were normalized to the sum of the line intensities. The LIBS profile thus obtained correlated very well with the GD-OES profile of the same sample. Both profiles are shown in Fig. 4.40. The ablation rate of approximately 8 nm shot ... 

Figure 9.21 Depth profiling of phosphorus and sulfur in protein spots of a 2D gel measured by LA-ICP-MS. Transient signals show decreasing ion intensity with increasing replication number (proportional to measurement time).

The continuous sputtering of the surface during analysis allows for the measurement of depth profiles. Therefore, the secondary ion intensity of the element of interest is recorded versus... 

Fig. 3.29 Auger sputter depth profile of a layered Zr02/SiC>2/Si model catalyst. While the sample is continuously bombarded with argon ions which remove the outer layers of the sample, the Auger signals of Zr, O, Si and C are measured as a function of time. The depth profile is a plot of Auger peak intensities against sputter time. The profile indicates that the outer layer of the model...

Fig. 7.29. Top Reflectivity at normal incidence of two PLD grown Bragg mirrors with 5.5 and 10.5 YSZ-MgO layer pairs obtained from the ellipsometry model analysis. By doubling the layer number, the reflectivity was increased from 90 to 99%. The UV-vis ellipsometry data were fitted best with layer thicknesses of 38-46 nm YSZ/48-54nm MgO for the 5.5 layer pair Bragg, and 46.4 0.7 nm YSZ and 51.9 0.5 nm MgO for the 10.5 pair Bragg. Measured and calculated by R. Schmidt-Grand. Bottom SNMS isotope intensity depth profile of this 5.5 x YSZ/MgO Bragg structure...

The fast complexation rate of Zn(II) ion with 8-quinolinol (Hqn) or 5-octyloxymethyl-8-quinolinol (Hoeqn) at the 1-butanol/water interface was measured by the micro-two-phase sheath flow method [17], The formation of a fluorescence complex at the interface was measured within a period of less than 2 milliseconds after the contact of the two phases. The depth profile of the fluorescence intensity observed across the inner organic phase flow proved that the fluorescence complex was formed only at the interface and it increased in proportion to the contact time. The diflusion length of Hoeqn in the 1-butanol phase for 2 milliseconds was calculated as 0.8 pm, which is smaller than the experimental resolution depth of 2 pm in the microscopy used. Therefore, the observed rate constant was analysed by taking diffusion and reaction rates into account between Zn(II) and Hoeqn at the interfacial region by a digital simulation method. The digital simulation has been used in the analysis of electrode reactions,... 

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