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Crossing negative

FIGURE 4.2 Representation of the 23 parameters on the hemisphere. Squares represent positive vector directions, crosses negative, that is, antipodes. The Cartesian axes corresponding to the three principal components are labeled N(North pole), G (Greenwich meridian on the Equator), and E (90°E on the Equator). [Pg.96]

While Eq. III-18 has been verified for small droplets, attempts to do so for liquids in capillaries (where Rm is negative and there should be a pressure reduction) have led to startling discrepancies. Potential problems include the presence of impurities leached from the capillary walls and allowance for the film of adsorbed vapor that should be present (see Chapter X). There is room for another real effect arising from structural peiturbations in the liquid induced by the vicinity of the solid capillary wall (see Chapter VI). Fisher and Israelachvili [19] review much of the literature on the verification of the Kelvin equation and report confirmatory measurements for liquid bridges between crossed mica cylinders. The situation is similar to that of the meniscus in a capillary since Rm is negative some of their results are shown in Fig. III-3. Studies in capillaries have been reviewed by Melrose [20] who concludes that the Kelvin equation is obeyed for radii at least down to 1 fim. [Pg.54]

Since Ag is positive and is negative, Q is larger for the p state than for the a state. Radical pairs in the p nuclear spin state will experience a faster intersystem crossing rate than those in the a state with the result that more RPs in the p nuclear spin state will become triplets. The end result is that the scavenging product, which is fonned primarily from triplet RPs, will have an excess of spins in the p state while the recombination product, which is fonned from singlet RPs, will have an excess of a nuclear spin states. [Pg.1598]

Alternatively the ion exchanger may be a synthetic polymer, for example a sulphonated polystyrene, where the negative charges are carried on the —SO3 ends, and the interlocking structure is built up by cross-linking between the carbon atoms of the chain. The important property of any such solid is that the negative charge is static—a part of the solid—whilst the positive ions can move from their positions. Suppose, for example, that the positive ions are... [Pg.274]

End views of the quadrupole assembly (a) showing the theoretically desired cross-section and (b) illustrating the practical system. In (b), a positive potential, +(U + Vcoscot), is applied to two opposed rods (A) and a negative potential, -(U + Vcoscot), to the other two (B). The dotted lines indicate planes of zero electric field. The dimension (r) is typically about 5 mm with rod diameters of 12 mm. The x- and y-axes are indicated, with the z-axis being perpendicular to the plane of the paper. [Pg.184]

Both solvent-iaduced swelling and oxygen inhibition ate characteristic of all cross-linking negative resists based on free-radical chemistry. [Pg.117]

Acid-C t lyzed Chemistry. Acid-catalyzed reactions form the basis for essentially all chemically amplified resist systems for microlithography appHcations (61). These reactions can be generally classified as either cross-linking (photopolymerization) or deprotection reactions. The latter are used to unmask acidic functionality such as phenohc or pendent carboxyhc acid groups, and thus lend themselves to positive tone resist apphcations. Acid-catalyzed polymer cross-linking and photopolymerization reactions, on the other hand, find appHcation in negative tone resist systems. Representative examples of each type of chemistry are Hsted below. [Pg.125]

Fig. 24. Representative cross-linking systems employed in negative tone CA resists, (a) Epoxy polymers requiring organic solvent development, (b) PHOST-based cross-linking systems requiring aqueous development, (c) Monomeric cross-linking agents used in PHOST matrix polymers. Fig. 24. Representative cross-linking systems employed in negative tone CA resists, (a) Epoxy polymers requiring organic solvent development, (b) PHOST-based cross-linking systems requiring aqueous development, (c) Monomeric cross-linking agents used in PHOST matrix polymers.
The impact on negative-CA resists of airborne base contamination differs qualitatively from their positive tone counterparts. Suppression of acid-catalyzed chemistry at the surface of a negative resist results in some film erosion at the top of the exposed fields and in some cases an apparent loss of photosensitivity, but in general the reUef images formed exhibit the expected cross-sectional profile. This is in sharp contrast with the typical behavior seen with positive-tone CA resists, where suppression of acid-catalyzed chemistry at the surface causes an insoluble surface skin. [Pg.128]

Fig. 36. Representative bilayer resist systems. Both CA and non-CA approaches are illustrated (116—119). (a) Cross-linking E-beam resist, 193-nm thin-film imaging resist (b) acid-cataly2ed negative-tone cross-linking system (c) positive-tone CA resist designed for 193-nm appHcations and (d) positive-tone... Fig. 36. Representative bilayer resist systems. Both CA and non-CA approaches are illustrated (116—119). (a) Cross-linking E-beam resist, 193-nm thin-film imaging resist (b) acid-cataly2ed negative-tone cross-linking system (c) positive-tone CA resist designed for 193-nm appHcations and (d) positive-tone...
AlliedSignal Cell. A cross section of AUiedSignal s cell is shown in Eigure 3. The cell body is a rectangular steel box on wheels with an outside water-cooling jacket. A central partition divides the box lengthwise. The negative side of the d-c bus is connected directly to the cell container. The interior of the box and the central partition act as the cathodic area of the cell. [Pg.126]

Fig. 3. Cross-section photomicrograph of a color-negative product showing the film base, the emulsion layer (the black specks are microcrystalline silver hahde grains), and a protective overcoat. The emulsion layer and overcoat are - 3.5 x 10 m thick. Fig. 3. Cross-section photomicrograph of a color-negative product showing the film base, the emulsion layer (the black specks are microcrystalline silver hahde grains), and a protective overcoat. The emulsion layer and overcoat are - 3.5 x 10 m thick.
Fig. 9. Schematic of a two-dimensional cross section of an AgBr emulsion grain showing the surface and formation of various point defects A, processes forming negative kink sites and interstitial silver ions B, positive kink site and C, process forming a silver ion vacancy at a lattice position and positive kink... Fig. 9. Schematic of a two-dimensional cross section of an AgBr emulsion grain showing the surface and formation of various point defects A, processes forming negative kink sites and interstitial silver ions B, positive kink site and C, process forming a silver ion vacancy at a lattice position and positive kink...

See other pages where Crossing negative is mentioned: [Pg.543]    [Pg.338]    [Pg.234]    [Pg.543]    [Pg.338]    [Pg.234]    [Pg.166]    [Pg.412]    [Pg.998]    [Pg.1325]    [Pg.1460]    [Pg.1597]    [Pg.1600]    [Pg.2108]    [Pg.2108]    [Pg.2892]    [Pg.393]    [Pg.1272]    [Pg.1109]    [Pg.527]    [Pg.114]    [Pg.118]    [Pg.125]    [Pg.126]    [Pg.127]    [Pg.127]    [Pg.402]    [Pg.238]    [Pg.511]    [Pg.350]    [Pg.352]    [Pg.408]    [Pg.219]    [Pg.388]    [Pg.511]    [Pg.44]    [Pg.45]    [Pg.49]    [Pg.373]    [Pg.235]    [Pg.519]   
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