Conducting atomic force microscopy

LeathermanG, DurantiniEN, Gust D, Moore TA, Moore AL, Stone S, Zhou Z, Rcz P, Liu YZ, Lindsay SM (1998) Carotene as a molecular wire conducting atomic force microscopy. J Phys Chem B 103(20)4006-4010... 

A rapid survey of some of the more recent publications seems to point to DNA indeed being a very broad-gap semiconductor or insulator for lengths exceeding a few hundred base pairs. This conclusion was reached in references [74] and [75] on the basis of electrostatic imaging, in reference [77] using conducting atomic force microscopy on A-DNA, in [78] using 300-nm DNA strands both of poly(GG) and of A-DNA, and in [52] for A-DNA supported on mica. 

Characterization tools must also be developed if a fundamental understanding of corrosion is to be achieved. For example, observation of a titanium surface with an oxide film at the nanometer scale shows oxide grains on the surface. Conductivity atomic force microscopy measurements can be used to indicate defect-free Ti02 by showing no current flow. This is visually indicated by a dark image. 

Oshea, S.J. et al.. Conducting atomic-force microscopy study of silicon dioxide Breakdown, J. Vac. Sci. Technol., B 13, 1945-1952, 1995. 

Klein, D.L. and McEuen, P.L., Conducting atomic-force microscopy of alkane layers on graphite, Appl. Phys. Lett. 66, 2478-2480, 1995. 

Leatherman, G. et al.. Carotene as a molecular wire Conducting atomic force microscopy, J. Phys. Chem. B. 103, 4006-4010, 1999. 

Maepherson, J.V., de Mussy, J.P.G., and Delplancke, J.L., Conducting-atomic force microscopy investigation of the local electrical characteristics of a Ti/TiOj/Pt anode, Electrochem. Solid St. 4, E33-E36, 2001. 

Rawlett, A.M. et al., Electrical measurements of a dithiolated electronic molecule via conducting atomic force microscopy, Appl. Phys. Lett. 81, 3043-3045, 2002. Yaliraki, S.N. and Ratner, M.A., Molecule-interface coupling effects on electronic transport in molecular wires, J. Chem. Phys. 109, 5036-5043, 1998. 

X.D. Dang, M. Dante, and T.Q. Nguyen, Morphology and conductivity modification of poly(3,4-ethylenedioxythiophene) poly(styrene sulfonate) films induced by conductive atomic force microscopy measurements. AppZ. Phys. Lett., 93, 241911 (2008). 

C. lonescu-Zanetti, A. Mechler, S.A. Carter, and R. Lai, Semiconductive polymer blends Correlating structure with transport properties at the nanoscale. Adv. Mater., 16, 385 (2004). A. Alexeev, J. Loos, and M.M. Koetse, Nanoscale electrical characterization of semiconducting polymer blends by conductive atomic force microscopy. Ultramicroscopy, 106, 191 (2006). 

A. Alexeev and J. Loos, Conductive atomic force microscopy (C-AFM) analysis of photoactive layers in inert atmosphere. Org. Electron., 9, 149 (2008). 

Hou at al. [24] reported the synthesis of poly(methyl methacrylate) (PMMA) nanobrushes on silicon based on localized surface-initiated polymerization. To achieve this, self-assembled monolayers (SAMs) of octadecyltrichlorosi-lane (OTS) were first generated on a silicon surface. Introduction of nanostructures was achieved on these SAM surfaces using a conductive atomic force microscopy (AFM) tip, which led to the oxidation of OTS SAMs. These... 

Conductive Atomic Force Microscopy (CAFM) also known as CSAFM is capable of providing maps of the electrical conductivity (dl/dV) to a spatial resolution of a couple of nanometers. The sample may be a conductor or semiconductor. Information is derived by measuring the current (100 pA-100 pA) passing to/from the atomically sharp tip and the sample surface of interest. Measurement of I versus F or I versus V curves allows for localized data to be extracted. 

Pig. 10.13 Future directions of hot electron studies, including (a) development of hybrid nanoparticle-nanodiode systems, and (b) in situ surface characterization. The cartoon depicts the conductive atomic force microscopy experiments on Au/liOj nanostructures under exothermic catalytic reactions or photon irradiation... 

Moiita, T. and Lindsay, S. M. Determination of single molecule conductances of alkanedithiols by conducting-atomic force microscopy with large gold nanoparticles. J. Am. Chem. Soc. 129, 7262-7263 (2007). 

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