Scanning ion microscope

Double deflection dual octupole assembly 1 Einzel V j lens 

ISI sector electrostatic energy spectrometer Einzel cylindrical lens Quadrupole 

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Computers will be integrated more and more into commercial SEMs and there is an enormous potential for the growth of computer supported applications. At the same time, related instruments will be developed and extended, such as the scanning ion microscope, which uses liquid-metal ion sources to produce finely focused ion beams that can produce SEs and secondary ions for image generation. The contrast mechanisms that are exhibited in these instruments can provide new insights into materials analysis. 

Fig. 5. 23 Schematic of a scanning ion microscope codeveloped by the University of Chicago Ion Microscopy Group and GMHE/Hughes Research Laboratories, and also the secondary ion and electron extracting part qf the instrument. (Courtesy of R. Levi-Setti.)...

The development of scanning probe microscopies and x-ray reflectivity (see Chapter VIII) has allowed molecular-level characterization of the structure of the electrode surface after electrochemical reactions [145]. In particular, the important role of adsorbates in determining the state of an electrode surface is illustrated by scanning tunneling microscopic (STM) images of gold (III) surfaces in the presence and absence of chloride ions [153]. Electrodeposition of one metal on another can also be measured via x-ray diffraction [154]. 

Figure Bl.19.40. The scanning ion-conductance microscope (SICM) scans a micropipette over the contours of a surface, keepmg the electrical conductance tlirough the tip of the micropipette constant by adjusting the vertical height of the probe. (Taken from [211], figure 1.)...

Flansma P K, Drake B, Marti O, Gould SAC and Prater C B 1989 The scanning ion-conductance microscope Science 243 641... 

Newer techniques that are responding to the need for atomic level imaging and chemical analysis include scanning tunneling microscopes (STMs), atomic force microscopes (AFMs) (52), and focused ion beams (FIBs). These are expected to quickly pass from laboratory-scale use to in-line monitoring apphcations for 200-mm wafers (32). 

Figure 6.6. The surface of a liii crystal following bombardment with 5 kcV argon ions, imaged in a. scanning electron microscope (Stewart and Thompson 1969).

Fig. 5 Scanning electron microscope images for LDHs synthesized by the urea method with a aging times 6, 30, 45, and 69 h, and b the concentration of metal ions, 0.87, 0.65, 0.44, and 0.06 M (scale bar = 2.5 jjim). Reprinted with permission from [76], Copyright...

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