Tunnel microscopy

The ability to control the position of a fine tip in order to scan surfaces with subatomic resolution has brought scanning probe microscopies to the forefront in surface imaging techniques. We discuss the two primary techniques, scanning tunneling microscopy (STM) and atomic force microscopy (AFM) the interested reader is referred to comprehensive reviews [9, 17, 18]. [Pg.294]

Since scanning tunneling microscopy requires flat conducting surfaces, it is not surprising that most of its early application was to study inorganic materials [17, 19, 20, 29-34]. These studies include investigations of catalytic metal surfaces [24, 35-37], silicon and other oxides [21], superconductors [38], gold... [Pg.294]

Fig. VIII-2. Scanning tunneling microscopy images illustrating the capabilities of the technique (a) a 10-nm-square scan of a silicon(lll) crystal showing defects and terraces from Ref. 21 (b) the surface of an Ag-Au alloy electrode being electrochemically roughened at 0.2 V and 2 and 42 min after reaching 0.70 V (from Ref. 22) (c) an island of CO molecules on a platinum surface formed by sliding the molecules along the surface with the STM tip (from Ref. 41).

PTM Photon tunneling microscopy [12] An interface is probed with an evanescent wave produced by internal reflection of the illuminating light Surface structure... [Pg.313]

STM Scanning tunneling microscopy [9, 19, 31] Tunneling current from probe scans a conducting surface Surface structure... [Pg.313]

We have considered briefly the important macroscopic description of a solid adsorbent, namely, its speciflc surface area, its possible fractal nature, and if porous, its pore size distribution. In addition, it is important to know as much as possible about the microscopic structure of the surface, and contemporary surface spectroscopic and diffraction techniques, discussed in Chapter VIII, provide a good deal of such information (see also Refs. 55 and 56 for short general reviews, and the monograph by Somoijai [57]). Scanning tunneling microscopy (STM) and atomic force microscopy (AFT) are now widely used to obtain the structure of surfaces and of adsorbed layers on a molecular scale (see Chapter VIII, Section XVIII-2B, and Ref. 58). On a less informative and more statistical basis are site energy distributions (Section XVII-14) there is also the somewhat laige-scale type of structure due to surface imperfections and dislocations (Section VII-4D and Fig. XVIII-14). [Pg.581]

We confine ourselves here to scanning probe microscopies (see Section VIII-2B) scanning tunneling microscopy (STM) and atomic force microscopy (AFM), in which successive profiles of a surface (see Fig. VIII-1) are combined to provide a contour map of a surface. It is conventional to display a map in terms of dark to light areas, in order of increasing height above the surface ordinary contour maps would be confusing to the eye. [Pg.688]

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